International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 107

Process management for avionics

 
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Other Documents accessible to TC 107 since 2015-12-10

Reference, Title
Downloads

Circulation

Date

Closing

Date

CENELEC

Voting /

Comment

47/2296/CDV

IEC 62880-1 Ed.1: Semiconductor devices - Stress Migration Test Standard - Part 1 - Copper Stress Migration Test Standard

2016-06-10 2016-09-02 Y Voting Result
47/2324/CD

IEC 62435-4 Ed.1: Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage

2016-09-30 2016-12-23 U
47/2326/FDIS

IEC 62435-1 Ed.1: Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General

2016-11-04 2016-12-16 Y
47/2327/FDIS

IEC 62435-2 Ed.1: Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

2016-11-04 2016-12-16 Y
56/1715/RR

Review report on IEC 62402/Ed1: Obsolescence management - Application Guide

2016-12-02 Y
56/1716/CD

IEC 62402 ED2: Obsolescence management

2016-12-09 2017-03-03 Y