International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 107

Process management for avionics

 
export to xls file

Other Documents accessible to TC 107 since 2014-09-04

sort upsort down
Reference, Title
Downloads
sort down

Circulation

Date

sort upsort down

Closing

Date

sort upsort down
CENELEC

Voting /

Comment

Comit?s

Authoris?s

47/2226/CDV

IEC 60749-44 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
2015-04-172015-07-17yesVoting Result
TC 104
TC 107