International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 107

Process management for avionics

 
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47/2303/FDIS

IEC 60749-44 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
2016-05-202016-07-01yes
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TC 107