International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 107

Process management for avionics

 
export to xls file

Other Documents accessible to TC 107 since 2015-06-27

sort upsort down
Reference, Title
Downloads
sort down

Circulation

Date

sort upsort down

Closing

Date

sort upsort down
CENELEC

Voting /

Comment

Authorized

Committees

47/2296/CDV

IEC 62880-1 Ed.1: Semiconductor devices - Stress Migration Test Standard - Part 1 - Copper Stress Migration Test Standard
2016-06-102016-09-02yes
TC 56
TC 91
TC 104
TC 107
47/2303/FDIS

IEC 60749-44 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
2016-05-202016-07-01yes
TC 104
TC 107