International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 56

Dependability

 
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47/2296/CDV

IEC 62880-1 Ed.1: Semiconductor devices - Stress Migration Test Standard - Part 1 - Copper Stress Migration Test Standard

2016-06-10 2016-09-02 yes Voting Result
TC 56
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TC 104
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