International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 56

Dependability

 
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Other Documents accessible to TC 56 since 2016-01-19

Reference, Title
Downloads

Circulation

Date

Closing

Date

CENELEC

Voting /

Comment

1/2323/RVC

Result of Voting on 1/2284/CDV - IEC 60050-692: International electrotechnical vocabulary - Generation, transmission and distribution of energy - Dependability and quality of service

2016-12-16 N
47/2296/CDV

IEC 62880-1 Ed.1: Semiconductor devices - Stress Migration Test Standard - Part 1 - Copper Stress Migration Test Standard

2016-06-10 2016-09-02 Y Voting Result
47/2324/CD

IEC 62435-4 Ed.1: Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage

2016-09-30 2016-12-23 U Report of Comments
47/2326/FDIS

IEC 62435-1 Ed.1: Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General

2016-11-04 2016-12-16 Y Voting Result
47/2327/FDIS

IEC 62435-2 Ed.1: Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

2016-11-04 2016-12-16 Y Voting Result
47/2328/FDIS

IEC 62435-5 Ed.1: Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices

2016-11-04 2016-12-16 Y Voting Result
62A/1177/NP

PNW 62A-1177: Environmental conscious design of medical electrical equipment – Particular requirements for refurbishment of medical electrical equipment and systems, for re-use of parts, for a management of critical or hazardous substances contained in medical electrical equipment and systems and for a closed loop Business-to-Business take back system

2017-01-13 2017-02-10 U