International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 49

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection

 
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47F/272/NP

PNW 47F-272: Future IEC 62047-XX Semiconductor devices – Micro-electromechanical devices – Part XX: Environmental and dielectric withstand test methods for MEMS piezoelectric thin films

2016-12-16 2017-03-10 U Voting Result