IEC 60122-1 am1 Ed. 3.0  

Quartz crystal units of assessed quality - Part 1: Generic specification

IEC 60444-8 am1 Ed. 1.0  

Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units

IEC 60679-1 Ed. 4.0  

Piezoelectric and associated material oscillators of assessed quality - Part 1: Generic specification

IEC 60679-1 am1 Ed. 3.0  

Quartz crystal controlled oscillators of assessed quality-Part 1: Generic apecification

IEC 60758 Ed. 5.0  

Synthetic quartz crystal - Specifications and guideline for use

IEC 60862-1 Ed. 3.0  

Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification

IEC 61338-1-5 Ed. 1.0  

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

IEC 61837-2 am1 Ed. 2.0  

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

IEC 61837-3 Ed. 2.0  

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures

IEC 61837-4 Ed. 2.0  

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines

IEC 62575-1 Ed. 1.0  

Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1 Generic specification

IEC 62604-1 Ed. 1.0  

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification

IEC 62761 Ed. 1.0  

Guidelines for the measurement method of nonilinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)

PNW 49-1053 Ed. 1.0  

Measurement techniques for piezoelectric and associated material oscillators - Part 4: Short-term frequency stability