International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 49 |
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection |
TC 49 Work programme
 Project Reference |  Stage | Document Reference | Init. Date | Current Stage | Next Stage | Mod | Fcst. Publ. Date |
|---|---|---|---|---|---|---|---|
IEC 60122-1 am1 Ed. 3.0 Quartz crystal units of assessed quality - Part 1: Generic specification | 1CD
| 49/1015/CD | 2011-04 | 2012-10 | 2013-03 | no | 2013-04 |
IEC 60444-10 Ed. 1.0 Measurement of quartz crystal units parameters - Part 10: Test fixture for crystal devices in GHz band | ANW
| 49/981/RVN | 2011-08 | 2011-08 | 2011-11 | no | 2013-11 |
IEC 60444-6 Ed. 2.0 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) | CCDV
| 49/1004/CDV | 2008-06 | 2012-07 | 2013-04 | no | 2013-09 |
IEC 60679-1 Ed. 4.0 Piezoelectric and associated material oscillators of assessed quality - Part 1: Generic specifications | AMW
| 49/1034/RR | 2013-01 | 2013-01 | 2013-04 | no | 2015-03 |
IEC 60679-1 am1 Ed. 3.0 Quartz crystal controlled oscillators of assessed quality-Part 1: Generic apecification | 1CD
| 49/1013/CD | 2012-10 | 2012-10 | 2013-02 | no | 2014-03 |
IEC 60758 Ed. 5.0 Synthetic quartz crystal - Specifications and guideline for use | AMW
| 49/1036/RR | 2013-02 | 2013-02 | 2013-03 | no | 2014-12 |
IEC 60862-1 Ed. 3.0 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification | 4CD
| 49/1033/CD | 2010-10 | 2013-01 | 2013-05 | no | 2012-10 |
IEC 61837-2 am1 Ed. 2.0 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures | 1CD
| 49/1028/CD | 2012-07 | 2013-01 | 2013-05 | no | 2014-03 |
IEC 61837-3 Ed. 2.0 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures | 1CD
| 49/1030/CD | 2012-11 | 2013-01 | 2013-05 | no | 2014-05 |
IEC 61837-4 Ed. 2.0 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
| 1CD
| 49/1031/CD | 2012-11 | 2013-01 | 2013-05 | no | 2014-05 |
IEC 62575-1 Ed. 1.0 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1 Generic specification | 2CD
| 49/1025/CD | 2011-12 | 2012-12 | 2013-05 | no | 2014-06 |
IEC 62604-1 Ed. 1.0 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification | 3CD
| 49/1032/CD | 2011-08 | 2013-01 | 2013-05 | no | 2013-11 |
IEC 62761 Ed. 1.0 Guidelines for the measurement method of nonilinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) | CCDV
| 49/1008/CDV | 2011-10 | 2012-11 | 2013-05 | no | 2014-01 |
PNW 49-1022 Ed. 1.0 Future IEC 61338-1-5: Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency | PNW
| 49/1022/NP | 2012-12 | 2013-05 | no |
161 kB