International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 
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TC 47 Work programme

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IEC 60749-28 Ed. 1.0  

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing Direct contact charged device model (DC-CDM)
CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote
47/2155/CDV2011-092013-032013-09no2014-04
IEC 60749-42 Ed. 1.0  

Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature humidity storage
CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote
47/2159/CDV2012-042013-032013-09no2014-04
IEC 60749-43 Ed. 1.0  

Semiconductor devices - mechanical and climatic test methods - Part 43: Guidelines for LSI reliability qualification plans
ANW
  • ANW
  • Approved New Work
47/2139/RVN2012-072012-072013-05no2015-07
IEC 60749-44 Ed. 1.0  

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron irradiated soft error test method for semiconductor devices with memory
ANW
  • ANW
  • Approved New Work
47/2151/RVN2012-102012-102013-08no2015-09
IEC 62435 Ed. 1.0  

Long-term storage of electronic semiconductor devices
ANW
  • ANW
  • Approved New Work
47/2088/RVN2011-032011-032013-06no2014-06
IEC 62483 Ed. 1.0  

Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes
ADIS
  • ADIS
  • Approved for FDIS circulation
47/2156/RVC2012-072012-122013-03no2013-08
IEC 62779-1 Ed. 1.0  

Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
ACDV
  • ACDV
  • Draft approved for Committee Draft with Vote
47/2165/CC2012-012013-022013-08no2014-12
IEC 62779-2 Ed. 1.0  

Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
ACDV
  • ACDV
  • Draft approved for Committee Draft with Vote
47/2166/CC2012-032013-022013-08no2014-12
IEC 62779-3 Ed. 1.0  

Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
ANW
  • ANW
  • Approved New Work
47/2163/RVN2013-012013-012013-12no2015-12
IEC 62830-1 Ed. 1.0  

Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting
ANW
  • ANW
  • Approved New Work
47/2142/RVN2012-082012-082013-08no2015-09
IEC 62830-2 Ed. 1.0  

Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
ANW
  • ANW
  • Approved New Work
47/2143/RVN2012-082012-082013-08no2015-09
PNW 47-2157 Ed. 1.0  

Copper stress migration test method
PNW
  • PNW
  • Proposed New Work
47/2157/NP 2012-122013-05no 
PNW 47-2164 Ed. 1.0  

Semiconductor devices - semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting
PNW
  • PNW
  • Proposed New Work
47/2164/NP 2013-022013-06no