International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47E

Dispositifs discrets à semiconducteurs

 
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SC 47E Programme de Travail (13)

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sort upsort down

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sort upsort down

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IEC 60747-14-10 Ed. 1.0  

Future IEC 60747-14-10: Semiconductor devices - Part 14-10: Semiconductor sensors - Performance evaluation methods for wearable glucose sensors
47E/542/NP2016-09ANW
  • ANW
  • Approved New Work

2016-09

1CD
  • 1CD
  • 1st Committee Draft

2017-02

WG 1J. Y. Park2018-12
IEC 60747-14-6 Ed. 1.0  

Semiconductor devices - Part 14-6: Semiconductor sensor - Humidity sensor
47E/489/CD2012-053CD
  • 3CD
  • 3rd Committee Draft

2014-11

A4CD
  • A4CD
  • Approved for 4th Committee Draft

2016-04

WG 1J. C. Lee2017-04
IEC 60747-14-7 Ed. 1.0  

Semiconductor devices - Part 14-7: Semiconductor sensor - Flow meter
47E/491/CD2012-053CD
  • 3CD
  • 3rd Committee Draft

2014-11

A4CD
  • A4CD
  • Approved for 4th Committee Draft

2016-04

WG 1J. C. Lee2017-04
IEC 60747-14-8 Ed. 1.0  

Semiconductor devices - Part 14-8: Semiconductor sensor - Oil quality sensor
47E/493/CD2012-053CD
  • 3CD
  • 3rd Committee Draft

2014-11

A4CD
  • A4CD
  • Approved for 4th Committee Draft

2016-04

WG 1J. C. Lee2017-04
IEC 60747-16-3 am2 Ed. 1.0  

Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
47E/545/CDV2015-08CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote

2016-07

ADIS
  • ADIS
  • Approved for FDIS circulation

2017-01

WG 2K. Oshiba2017-09
IEC 60747-16-4 am2 Ed. 1.0  

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
47E/546/CDV2015-08CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote

2016-07

ADIS
  • ADIS
  • Approved for FDIS circulation

2017-01

WG 2K. Oshiba2017-09
IEC 60747-16-6 Ed. 1.0  

Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
47E/510/NP2016-03ANW
  • ANW
  • Approved New Work

2016-03

1CD
  • 1CD
  • 1st Committee Draft

2016-06

WG 2K. Oshiba2018-06
IEC 60747-17 Ed. 1.0  

Semiconductor devices - Magnetic and capacitive coupler for basic and reinforced isolation
47E/536/CD2015-01CDM
  • CDM
  • Committee Draft to be discussed at Meeting

2016-07

A3CD
  • A3CD
  • Approved for 3rd Committee Draft

2016-11

WG 8A. Jaus2017-06
IEC 60747-18-1 Ed. 1.0  

Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensor
47E/554/CD2016-031CD
  • 1CD
  • 1st Committee Draft

2016-08

A2CD
  • A2CD
  • Approved for 2nd Committee Draft

2016-11

WG 1J. M. Lee, S. G. Lee2018-12
IEC 60747-5-5 Ed. 2.0  

Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
47E/520/RR2015-08AMW
  • AMW
  • Approved Maintenance Work

2015-08

1CD
  • 1CD
  • 1st Committee Draft

2016-06

WG 4P. Sullivan2017-12
IEC 60747-9 Ed. 3.0  

Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)
47E/548/CD2016-051CD
  • 1CD
  • 1st Committee Draft

2016-05

A2CD
  • A2CD
  • Approved for 2nd Committee Draft

2016-09

WG 3S. Miyashita2018-12
PNW 47E-550 Ed. 1.0  

Future IEC 60747-14-11: Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature
47E/550/NP PNW
  • PNW
  • Proposed New Work

2016-07

ANW
  • ANW
  • Approved New Work

2016-12

WG 1K. Y. Kim 
PNW 47E-555 Ed. 1.0  

Future IEC 60747-18-2: Semiconductor devices - Part 18-2: Semiconductor bio sensors - Evaluation process of lens-free CMOS photonic array sensor package module
47E/555/NP PNW
  • PNW
  • Proposed New Work

2016-09

ANW
  • ANW
  • Approved New Work

2017-01

WG 1J. M. Lee and S. G. Lee