International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47E

Discrete semiconductor devices

 
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SC 47E Work programme (16)

Project

Reference

Document

Reference

Init.

Date

Current

Stage

Next

Stage

Working

Group

Project

Leader

Fcst. Publ.

Date

PNW 47E-550 ED1

Future IEC 60747-14-11: Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature

47E/550/NP PRVN
  • PRVN
  • Preparation of RVN

2016-10

2016-11

WG 1 K. Y. Kim
PNW 47E-555 ED1

Future IEC 60747-18-2: Semiconductor devices - Part 18-2: Semiconductor bio sensors - Evaluation process of lens-free CMOS photonic array sensor package module

47E/555/NP PRVN
  • PRVN
  • Preparation of RVN

2016-11

2016-12

WG 1 J. M. Lee and S. G. Lee
PNW 47E-560 ED1

Future IEC 60747-18-3: Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package module with fluidic system

47E/560/NP PNW
  • PNW
  • New Work Item Proposal

2016-10

PRVN
  • PRVN
  • Preparation of RVN document

2017-01

WG 1 J. M. Lee, S. G. Lee
IEC 60747-4:2007/AMD1 ED2

Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors

47E/499/CDV 2014-07 RPUB
  • RPUB
  • Publication received and registered

2016-09

BPUB
  • BPUB
  • Publication being printed

WG 2 K. Oshiba 2016-10
IEC 60747-5-5 ED2

Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers

47E/559/CD 2015-08 CD
  • CD
  • Draft circulated as CD

2016-10

PCC
  • PCC
  • Preparation of CC document

2017-01

WG 4 P. Sullivan 2017-12
IEC 60747-9 ED3

Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)

47E/548/CD 2016-05 ACD
  • ACD
  • Approved for CD

2016-11

2CD
  • 2CD

2017-05

WG 3 S. Miyashita 2018-12
IEC 60747-14-6 ED1

Semiconductor devices - Part 14-6: Semiconductor sensor - Humidity sensor

47E/489/CD 2012-05 PCC
  • PCC
  • Preparation of CC

2015-01

2015-02

WG 1 J. C. Lee 2017-04
IEC 60747-14-7 ED1

Semiconductor devices - Part 14-7: Semiconductor sensor - Flow meter

47E/491/CD 2012-05 PCC
  • PCC
  • Preparation of CC

2015-01

2015-02

WG 1 J. C. Lee 2017-04
IEC 60747-14-8 ED1

Semiconductor devices - Part 14-8: Semiconductor sensor - Oil quality sensor

47E/493/CD 2012-05 PCC
  • PCC
  • Preparation of CC

2015-01

2015-02

WG 1 J. C. Lee 2017-04
IEC 60747-14-10 ED1

Future IEC 60747-14-10: Semiconductor devices - Part 14-10: Semiconductor sensors - Performance evaluation methods for wearable glucose sensors

47E/542/NP 2016-09 ACD
  • ACD
  • Approved for CD

2016-09

CD
  • CD
  • Draft circulated as CD

2017-02

WG 1 J. Y. Park 2018-12
IEC 60747-16-1:2001/AMD2 ED1

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

47E/500/CDV 2014-07 RPUB
  • RPUB
  • Publication received and registered

2016-09

BPUB
  • BPUB
  • Publication being printed

WG 2 K. Oshiba 2016-10
IEC 60747-16-3:2002/AMD2 ED1

Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters

47E/545/CDV 2015-08 APUB
  • APUB
  • Approved for publication

2016-11

TPUB
  • TPUB
  • Translation of publication

2017-05

WG 2 K. Oshiba 2017-10
IEC 60747-16-4:2004/AMD2 ED1

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

47E/546/CDV 2015-08 APUB
  • APUB
  • Approved for publication

2016-11

TPUB
  • TPUB
  • Translation of publication

2017-05

WG 2 K. Oshiba 2017-10
IEC 60747-16-6 ED1

Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers

47E/510/NP 2016-03 ACD
  • ACD
  • Approved for CD

2016-03

CD
  • CD
  • Draft circulated as CD

2016-06

WG 2 K. Oshiba 2018-06
IEC 60747-17 ED1

Semiconductor devices - Magnetic and capacitive coupler for basic and reinforced isolation

47E/536/CD 2015-01 CDM
  • CDM
  • CD to be discussed at meeting

2016-07

2016-11

WG 8 A. Jaus 2017-06
IEC 60747-18-1 ED1

Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensor

47E/554/CD 2016-03 PCC
  • PCC
  • Preparation of CC

2016-10

2016-11

WG 1 J. M. Lee, S. G. Lee 2018-12