International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 49

Dispositifs piézoélectriques, diélectriques et électrostatiques et matériaux associés pour la détection, le choix et la commande de la fréquence

 
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TC 49 Programme de Travail (13)

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IEC 60122-1 am1 Ed. 3.0  

Quartz crystal units of assessed quality - Part 1: Generic specification
49/1015/CD2011-04A2CD
  • A2CD
  • Approved for 2nd Committee Draft

2013-02

2CD
  • 2CD
  • 2nd Committee Draft

2015-12

WG 1B.Neubig2016-01
IEC 60444-8 Ed. 2.0  

Mesure des paramètres des résonateurs à quartz - Partie 8: Dispositif d'essai pour les résonateurs à quartz montés en surface
49/1126/CDV2013-04CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote

2015-04

ADIS
  • ADIS
  • Approved for FDIS circulation

2015-10

WG 6Y. Watanabe2016-06
IEC 60679-1 Ed. 4.0  

Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1 : Generic specification
49/1128/CD2013-013CD
  • 3CD
  • 3rd Committee Draft

2015-02

A4CD
  • A4CD
  • Approved for 4th Committee Draft

2015-06

WG 7T.Hosoda2016-01
IEC 60679-1 am1 Ed. 3.0  

Quartz crystal controlled oscillators of assessed quality-Part 1: Generic apecification
49/1013/CD2012-10A2CD
  • A2CD
  • Approved for 2nd Committee Draft

2013-02

2CD
  • 2CD
  • 2nd Committee Draft

2015-12

WG 7E.Seydel2016-01
IEC 60758 Ed. 5.0  

Cristal de quartz synthétique - Spécifications et lignes directrices d'utilisation
49/1138/CDV2013-02CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote

2015-05

ADIS
  • ADIS
  • Approved for FDIS circulation

2015-11

WG 5J. Takahashi2016-07
IEC 60862-1 Ed. 3.0  

Filtres à ondes acoustiques de surface (OAS) sous assurance de la qualité - Partie 1: Spécification générique'
49/1151/FDIS2010-10CDIS
  • CDIS
  • Draft circulated as FDIS

2015-05

APUB
  • APUB
  • Draft approved for publication

2015-07

WG 10T.Kawakatsu2015-09
IEC 61240 Ed. 3.0  

Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
49/1141/CD2015-011CD
  • 1CD
  • 1st Committee Draft

2015-03

A2CD
  • A2CD
  • Approved for 2nd Committee Draft

2015-08

WG 9T. Kobayashi2016-10
IEC 62276 Ed. 3.0  

Tranches monocristallines pour applications utilisant des dispositifs à ondes acoustiques de surface (OAS) - Spécifications et méthodes de mesure
49/1144/CDV2014-10CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote

2015-06

ADIS
  • ADIS
  • Approved for FDIS circulation

2015-12

WG 5J. Takahashi2016-08
IEC 62575-1 Ed. 1.0  

Filtres adiofréquences (RF) à ondes acoustiques de volume (OAV) sous assurance de la qualité - Partie 1: Spécification générique
49/1163/FDIS2011-12CDIS
  • CDIS
  • Draft circulated as FDIS

2015-07

APUB
  • APUB
  • Draft approved for publication

2015-09

WG 10, WG 12K. Hashimoto2015-11
IEC 62604-2 Ed. 2.0  

Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers - Part 2 :Guidelines for the use
49/1124/RR2015-01AMW
  • AMW
  • Approved Maintenance Work

2015-01

1CD
  • 1CD
  • 1st Committee Draft

2015-10

WG 10T. Kawakatsu2017-06
IEC 62884-1 Ed. 1.0  

Measurement techniques of piezoelectric, dieletiric and electrostatic oscillators - Part 1: Basic methods for the measurement
49/1150/CD2015-051CD
  • 1CD
  • 1st Committee Draft

2015-05

A2CD
  • A2CD
  • Approved for 2nd Committee Draft

2015-09

WG 7T. Hosoda2017-12
IEC 62884-2 Ed. 1.0  

Measurement technique of piezoelectric, dieletiric and electrostatic oscillators - Part 2: Phase jitter measurement method
49/1149/RR2015-05AMW
  • AMW
  • Approved Maintenance Work

2015-05

1CD
  • 1CD
  • 1st Committee Draft

2015-10

WG 7T. Hosoda2018-07
IEC 62884-4 Ed. 1.0  

Measurement techniques for piezoelectric, dielectric and electrostatic oscillators : Part 4 - Short-term frequency stability.
49/1053/NP2013-08ANW
  • ANW
  • Approved New Work

2013-08

1CD
  • 1CD
  • 1st Committee Draft

2015-12

WG 7B. Neubig2015-12