International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 49 |
Dispositifs piézoélectriques, diélectriques et électrostatiques et matériaux associés pour la détection, le choix et la commande de la fréquence |
TC 49 Programme de Travail
 Référence Projet |  Stage | Référence Document | Init. Date | Stage Courant | Prochain Stage | Mod | Fcst. Publ. Date |
|---|---|---|---|---|---|---|---|
IEC 60122-1 am1 Ed. 3.0 Quartz crystal units of assessed quality - Part 1: Generic specification | A2CD
| 49/1040/CC | 2011-04 | 2013-02 | 2013-04 | no | 2013-04 |
IEC 60444-10 Ed. 1.0 Measurement of quartz crystal units parameters - Part 10: Test fixture for crystal devices in GHz band | ANW
| 49/981/RVN | 2011-08 | 2011-08 | 2011-11 | no | 2013-11 |
IEC 60444-6 Ed. 2.0 Mesure des paramètres des résonateurs à quartz - Partie 6: Mesure de la dépendance du niveau d'excitation (DNE) | APUB
| 49/1038/RVC | 2008-06 | 2013-02 | 2013-04 | no | 2013-09 |
IEC 60444-8 am1 Ed. 1.0 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
| AMW
| 49/1056/RR | 2013-04 | 2013-04 | 2013-04 | no | 2014-12 |
IEC 60679-1 Ed. 4.0 Piezoelectric and associated material oscillators of assessed quality - Part 1: Generic specification | 1CD
| 49/1051/CD | 2013-01 | 2013-03 | 2013-06 | no | 2015-03 |
IEC 60679-1 am1 Ed. 3.0 Quartz crystal controlled oscillators of assessed quality-Part 1: Generic apecification | A2CD
| 49/1039/CC | 2012-10 | 2013-02 | 2013-04 | no | 2014-03 |
IEC 60758 Ed. 5.0 Synthetic quartz crystal - Specifications and guideline for use | 1CD
| 49/1041/CD | 2013-02 | 2013-02 | 2013-06 | no | 2014-12 |
IEC 60862-1 Ed. 3.0 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification | 4CD
| 49/1033/CD | 2010-10 | 2013-01 | 2013-05 | no | 2012-10 |
IEC 61338-1-5 Ed. 1.0 Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency | 1CD
| 49/1055/CD | 2013-04 | 2013-04 | 2013-08 | no | 2014-07 |
IEC 61837-2 am1 Ed. 2.0 Dispositifs piézoélectriques à montage en surface pour la commande et le choix de la fréquence - Encombrements normalisés et connexions des sorties - Partie 2: Enveloppes en céramique | 1CD
| 49/1028/CD | 2012-07 | 2013-01 | 2013-05 | no | 2014-03 |
IEC 61837-3 Ed. 2.0 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures | 1CD
| 49/1030/CD | 2012-11 | 2013-01 | 2013-05 | no | 2014-05 |
IEC 61837-4 Ed. 2.0 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
| 1CD
| 49/1031/CD | 2012-11 | 2013-01 | 2013-05 | no | 2014-05 |
IEC 62575-1 Ed. 1.0 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1 Generic specification | 2CD
| 49/1025/CD | 2011-12 | 2012-12 | 2013-05 | no | 2014-06 |
IEC 62604-1 Ed. 1.0 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification | 3CD
| 49/1032/CD | 2011-08 | 2013-01 | 2013-05 | no | 2013-11 |
IEC 62761 Ed. 1.0 Lignes directrices pour la methode de mesure des non-linearites pour les dispositifs a ondes acoustiques de surface (OAS) et a ondes acoustiques de volume (OAV) pour frequences radioelectriques (RF) | ADIS
| 49/1050/RVC | 2011-10 | 2013-03 | 2013-06 | no | 2013-11 |
PNW 49-1053 Ed. 1.0 Measurement techniques for piezoelectric and associated material oscillators - Part 4: Short-term frequency stability | PNW
| 49/1053/NP | 2013-03 | 2013-08 | no |
117 kB