International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 49

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection

 
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TC 49 Work programme (13)

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IEC 60122-1 am1 Ed. 3.0  

Quartz crystal units of assessed quality - Part 1: Generic specification
49/1015/CD2011-04A2CD
  • A2CD
  • Approved for 2nd Committee Draft

2013-02

2CD
  • 2CD
  • 2nd Committee Draft

2014-06

01Mr Bernd Neubig2013-04
IEC 60444-8 Ed. 2.0  

Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
49/1099/CD2013-04ACDV
  • ACDV
  • Draft approved for Committee Draft with Vote

2014-10

CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote

2015-01

06Y. Watanabe2016-05
IEC 60679-1 Ed. 4.0  

Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1 : Generic specification
49/1101/CD2013-01A3CD
  • A3CD
  • Approved for 3rd Committee Draft

2014-10

3CD
  • 3CD
  • 3rd Committee Draft

2015-04

07T.Hosoda2015-03
IEC 60679-1 am1 Ed. 3.0  

Quartz crystal controlled oscillators of assessed quality-Part 1: Generic apecification
49/1013/CD2012-10A2CD
  • A2CD
  • Approved for 2nd Committee Draft

2013-02

2CD
  • 2CD
  • 2nd Committee Draft

2014-06

07Eberhard Seydel2014-03
IEC 60758 Ed. 5.0  

Synthetic quartz crystal - Specifications and guidelines for use
49/1115/CD2013-024CD
  • 4CD
  • 4th Committee Draft

2014-11

A5CD
  • A5CD
  • Approved for 5th Committee Draft

2015-02

05J. Takahashi2014-12
IEC 60862-1 Ed. 3.0  

Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
49/1092/CDV2010-10ADIS
  • ADIS
  • Approved for FDIS circulation

2014-07

DEC
  • DEC
  • Draft at Editing Check

2014-11

10Takaharu Kawakatsu2015-04
IEC 61338-1-5 Ed. 1.0  

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
49/1089/CDV2013-04APUB
  • APUB
  • Draft approved for publication

2014-06

DEC
  • DEC
  • Draft at Editing Check

2014-10

10T.Ishizaki2015-03
IEC 61837-3 Ed. 2.0  

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosure
49/1080/CDV2012-11RDIS
  • RDIS
  • Text for FDIS received and registered

2014-12

CDIS
  • CDIS
  • Draft circulated as FDIS

2015-02

09R. Gruenwald (Grünwald)2015-06
IEC 61837-4 Ed. 2.0  

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
49/1117/FDIS2012-11CDIS
  • CDIS
  • Draft circulated as FDIS

2014-12

APUB
  • APUB
  • Draft approved for publication

2015-02

09R. Gruenwald (Grünwald)2015-04
IEC 62276 Ed. 3.0  

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
49/1116/CD2014-101CD
  • 1CD
  • 1st Committee Draft

2014-12

A2CD
  • A2CD
  • Approved for 2nd Committee Draft

2015-04

05J. Takahashi2016-12
IEC 62575-1 Ed. 1.0  

Radio frequncy (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Genric specification
49/1097/CDV2011-12ADIS
  • ADIS
  • Approved for FDIS circulation

2014-10

DEC
  • DEC
  • Draft at Editing Check

2015-03

12/10K. Hashimoto2015-08
IEC 62604-1 Ed. 1.0  

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
49/1093/CDV2011-08ADIS
  • ADIS
  • Approved for FDIS circulation

2014-07

DEC
  • DEC
  • Draft at Editing Check

2014-11

10Mr Takaharu Kawakatsu2015-04
IEC 62884-4 Ed. 1.0  

Measurement techniques for piezoelectric, dielectric and electrostatic oscillators : Part 4 - Short-term frequency stability.
49/1053/NP2013-08ANW
  • ANW
  • Approved New Work

2013-08

1CD
  • 1CD
  • 1st Committee Draft

2013-10

07B. Neubig2015-12