International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Dispositifs à semiconducteurs

 
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TC 47 Programme de Travail (26)

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IEC 60749-28 Ed. 1.0  

CEI 60749-28 Ed.1: Dispositifs à semiconducteurs - Méthodes d'essai mécaniques et climatiques - Partie 28: Essai de sensibilité aux décharges électrostatiques (DES) Modèle de dispositif chargé par contact direct (DC-CDM)
47/2155/CDV2011-09NADIS
  • NADIS
  • FDIS not approved

2013-06

CDVM
  • CDVM
  • Committee draft with vote for meeting

2013-10

02J. Lynch2015-09
IEC 60749-43 Ed. 1.0  

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 43: Directives concernant les plans de qualification de la fiabilité des CI
47/2169/CD2012-07ACDV
  • ACDV
  • Draft approved for Committee Draft with Vote

2015-03

CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote

2015-06

02J. Lynch2016-07
IEC 60749-44 Ed. 1.0  

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 44: Méthode d'essai des effets d'un événement isolé (SEE) irradié par un faisceau de neutrons pour des dispositifs à semiconducteurs
47/2226/CDV2012-10CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote

2015-04

ADIS
  • ADIS
  • Approved for FDIS circulation

2015-10

02J. Lynch2016-06
IEC 62435-1 Ed. 1.0  

Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General
47/2172/CD2011-031CD
  • 1CD
  • 1st Committee Draft

2013-06

A2CD
  • A2CD
  • Approved for 2nd Committee Draft

2015-04

03Y. Nagahiro, A. Lucero2015-09
IEC 62435-2 Ed. 1.0  

Electronic components - Long-term storage of electronic semiconductor devices - Part 2 - Deterioration Mechanisms
47/2173/CD2011-031CD
  • 1CD
  • 1st Committee Draft

2013-06

A2CD
  • A2CD
  • Approved for 2nd Committee Draft

2015-04

03Y. Nagahiro, A. Lucero2015-09
IEC 62435-5 Ed. 1.0  

Electronic components - Long-term storage of electronic semiconductor devices - Part 5 - Die & Wafer Devices
47/2174/CD2011-031CD
  • 1CD
  • 1st Committee Draft

2013-06

A2CD
  • A2CD
  • Approved for 2nd Committee Draft

2015-04

03Y. Nagahiro, A. Lucero2015-09
IEC 62779-1 Ed. 1.0  

Dispositifs à semi-conducteurs - Interface à semi-conducteurs pour les communications via le corps humain - Partie 1: Exigences générales
47/2195/CDV2012-01ADIS
  • ADIS
  • Approved for FDIS circulation

2014-10

DEC
  • DEC
  • Draft at Editing Check

2015-02

06B. N. Lee2015-11
IEC 62779-2 Ed. 1.0  

Dispositifs à semiconducteurs - Interface à semi-conducteurs pour les communications via le corps humain - Partie 2: Caractérisation des performances d'interfaçage
47/2196/CDV2012-03ADIS
  • ADIS
  • Approved for FDIS circulation

2014-10

DEC
  • DEC
  • Draft at Editing Check

2015-02

06J. H. Hwang2015-11
IEC 62779-3 Ed. 1.0  

Dispositifs à semiconducteurs - Interface à semiconducteurs pour les communications via le corps humain - Partie 3: Type fonctionnel et ses conditions d'utilisation
47/2227/CDV2013-01CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote

2015-04

ADIS
  • ADIS
  • Approved for FDIS circulation

2015-10

06S. W. Kang2016-06
IEC 62830-1 Ed. 1.0  

Dispositifs à semi-conducteurs - Dispositifs à semi-conducteurs pour récupération et génération d'énergie - Partie 1: Récupération d'énergie piézoélectrique basée sur des vibrations
47/2214/CDV2012-08CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote

2014-12

ADIS
  • ADIS
  • Approved for FDIS circulation

2015-06

07J. Y. Park, C. L. Cha2016-02
IEC 62830-2 Ed. 1.0  

Dispositifs à semiconducteurs - Dispositifs à semiconducteurs pour récupération et production d'énergie - Partie 2: Récupération d'énergie thermoélectrique basée sur la puissance thermoélectrique
47/2229/CDV2012-08CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote

2015-04

ADIS
  • ADIS
  • Approved for FDIS circulation

2015-10

07H. J. Ryu, C. L. Cha2016-06
IEC 62830-3 Ed. 1.0  

Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting
47/2198/CD2013-07ACDV
  • ACDV
  • Draft approved for Committee Draft with Vote

2014-11

CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote

2015-01

07J. Y. Park and C. L. Cha2016-07
IEC 62880-1 Ed. 1.0  

Semiconductor devices - Wafer level reliability for semiconductor devices - Part 1: Copper stress migration test method
47/2191/CD2013-06ACDV
  • ACDV
  • Draft approved for Committee Draft with Vote

2014-05

CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote

2015-09

05H. Matsuyama2017-01
IEC 62951-1 Ed. 1.0  

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates
47/2224/CD2014-091CD
  • 1CD
  • 1st Committee Draft

2015-01

A2CD
  • A2CD
  • Approved for 2nd Committee Draft

2015-05

06S.H. Choa, W.J. Kim2017-06
IEC 62969-1 Ed. 1.0  

Semiconductor devices - Semiconductor interfaces for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
47/2205/NP2014-12ANW
  • ANW
  • Approved New Work

2014-12

1CD
  • 1CD
  • 1st Committee Draft

2015-10

06C. L. Cha, N. S. Kim2017-08
IEC 62969-2 Ed. 1.0  

Semiconductor devices - Semiconductor interfaces for automotive vehicles - Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors
47/2206/NP2014-12ANW
  • ANW
  • Approved New Work

2014-12

1CD
  • 1CD
  • 1st Committee Draft

2015-10

06H. J. Ryu, C. L. Cha2017-08
IEC 62969-3 Ed. 1.0  

Semiconductor devices - Semiconductor interfaces for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors
47/2207/NP2014-12ANW
  • ANW
  • Approved New Work

2014-12

1CD
  • 1CD
  • 1st Committee Draft

2015-10

06J. Y. Park, C. L. Cha2017-08
IEC 62969-4 Ed. 1.0  

Semiconductor devices - Semiconductor interfaces for automotive vehicles - Part 4: Evaluation methods of data interface for automotive vehicle sensors
47/2208/NP2014-12ANW
  • ANW
  • Approved New Work

2014-12

1CD
  • 1CD
  • 1st Committee Draft

2015-10

06K. B. Yeon, W. J. Kim2017-08
PNW 47-2225 Ed. 1.0  

Future IEC 60749-41 Ed.1: Semiconductor devices - mechanical and climatic test methods - Part 41: Reliability testing methods of non-volatile memory devices
47/2225/NP PNW
  • PNW
  • Proposed New Work

2015-02

ANW
  • ANW
  • Approved New Work

2015-06

02J. Lynch 
PNW 47-2234 Ed. 1.0  

Future IEC 62830-5 Ed.1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 5: Test method for measuring generated power from flexible thermoelectric devices
47/2234/NP PNW
  • PNW
  • Proposed New Work

2015-05

ANW
  • ANW
  • Approved New Work

2015-09

N.S. Kim, C.L. Cha 
PNW 47-2235 Ed. 1.0  

Future IEC 62951-2 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Acceleration test for electron mobility, sub-threshold swing, and threshold voltage of flexible devices
47/2235/NP PNW
  • PNW
  • Proposed New Work

2015-05

ANW
  • ANW
  • Approved New Work

2015-09

H.J. Ryu, H.S. Kim 
PNW 47-2236 Ed. 1.0  

Future IEC 62951-3 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics (?, SS, Vth) on flexible substrates under bulging
47/2236/NP PNW
  • PNW
  • Proposed New Work

2015-05

ANW
  • ANW
  • Approved New Work

2015-09

D.K. Kim, H.J. Ryu 
PNW 47-2237 Ed. 1.0  

Future IEC 62951-4 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for films and substrates for flexible semiconductor devices
47/2237/NP PNW
  • PNW
  • Proposed New Work

2015-05

ANW
  • ANW
  • Approved New Work

2015-09

S.H. Choa, W.J. Kim 
PNW 47-2238 Ed. 1.0  

Future IEC 62951-5 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials and devices
47/2238/NP PNW
  • PNW
  • Proposed New Work

2015-05

ANW
  • ANW
  • Approved New Work

2015-09

J.C. Lee 
PNW 47-2239 Ed. 1.0  

Future IEC 62951-6 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
47/2239/NP PNW
  • PNW
  • Proposed New Work

2015-05

ANW
  • ANW
  • Approved New Work

2015-09

J.W. Chung 
PNW 47-2240 Ed. 1.0  

Future IEC 62830-4 Ed.1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices
47/2240/NP PNW
  • PNW
  • Proposed New Work

2015-05

ANW
  • ANW
  • Approved New Work

2015-09

J.Y. Park