International Standards and Conformity Assessment for all electrical, electronic and related technologies

Approved NewProjects

(2017-01-27 to 2017-07-26)

 
Total Documents
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Project

Reference

Current

Stage

Proposer

Working

Group

Project

Leader

Document

Reference

Closing

Date

SC 3D - Product properties and classes and their identification
PNW 3D-293 ED

PNW 3D-293: STANDARDIZED PRODUCT ONTOLOGY REGISTER AND TRANSFER BY DATA PARCELS – Part 8: Web service interface for data parcels

PRVN Secretariat Akira Hosokawa 3D/293/NP 2017-06-02
TC 14 - Power transformers
IEC 60076-25 ED1

PNW 14-893: Power transformers - Part XX: Neutral grounding resistors - General Design requirements and test procedures (Proposed as part of IEC 60076 series)

ACD SECRETARIAT PT 60076-25 Hakam EL ASSAD 14/893/NP 2017-05-12
SC 17A - Switching devices
PNW 17A-1144

PNW 17A-1144: High-voltage switchgear and controlgear – Alternating current circuit-breakers with intentionally non-simultaneous pole operation

PRVN Secretariat Anne Bosma 17A/1144/NP 2017-07-07
TC 23 - Electrical accessories
PNW 23-772

PNW 23-772: Methodology for determining the energy efficiency class of electrical accessories

PRVN Secretariat WG 9 Claus-Dieter Ziebell 23/772/NP 2017-07-21
TC 29 - Electroacoustics
PNW 29-953

PNW 29-953: Electroacoustics – Modular instrumentation for acoustic measurement

PRVN Secretariat Jes Sørensen 29/953/NP 2017-07-21
SC 32B - Low-voltage fuses
IEC 60269-7 ED1

PNW 32B-670: Low-voltage fuses - Part 7: Fuse links for the protection of batteries

ACD Secretariat PT 60269-7 Jean-François DE PALMA 32B/670/NP 2017-05-19
SC 34A - Lamps
IEC 63146 ED1

PNW 34A-1998: LED packages for general lighting - Performance information requirements

ACD Germany WG 4 Andreas Scholtz 34A/1998/NP 2017-06-02
IEC 62868-2-1 ED1

PNW 34A-1999: Particular requirements for semi-integrated organic light emitting diode (OLED) modules

ACD Korea, Republic of WG 3 JEUNG MO KANG 34A/1999/NP 2017-06-16
IEC 62868-2-2 ED1

PNW 34A-2000: OLED light sources – Safety – Part 2-2: Particular requirements for integrated organic light emitting diode (OLED) modules

ACD Japan WG 3 Yasuki Kawashima 34A/2000/NP 2017-06-16
TC 38 - Instrument transformers
IEC/IEEE TS 61869-105 ED1

PNW TS 38-544: Instrument transformers - Part 105: Uncertainty evaluation in the calibration of Instrument Transformers

ACD Secretariat WG 55 Lorenzo Peretto 38/544/NP 2017-06-09
TC 45 - Nuclear instrumentation
IEC 63148 ED1

PNW 45-823: Requirements of tracking system for radioactive materials

ACD Korea, Republic of PT 63148 Tae Soon Park 45/823/NP 2017-05-12
SC 46F - RF and microwave passive components
IEC 63136-1 ED1

PNW 46F-365: Radio-frequency connectors Part XX: Sectional specification for RF coaxial connectors with 9.5mm inner diameter of outer conductor with quick lock coupling,series Q4.1-9.5

ACD CN WG 1 Guohua Chen 46F/365A/NP 2017-04-14
SC 47F - Micro-electromechanical systems
IEC 62047-35 ED1

PNW 47F-276: Semiconductor devices - Micro-electromechanical devices - Part 35: Standard test procedure for the anti-failure robustness of flexible or foldable electro-mechanical devices against bending deformation

ACD Japan WG 2 Shoji Kamiya 47F/276/NP 2017-07-07
TC 47 - Semiconductor devices
PNW 47-2381 ED

PNW 47-2381: Future IEC 62830-6: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 6- contact mode triboelectric energy harvesting

PRVN Korea, Republic of WG 7 Jae Yeong Park 47/2381/NP 2017-06-02
PNW 47-2387

PNW 47-2387: Semiconductor devices – Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) - Part 1: Fast BTI Test method

PRVN Japan WG 5 Hideya Matsuyama 47/2387/NP 2017-06-30
PNW 47-2388

PNW 47-2388: Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Part 2: Test method for defects using optical inspection

PRVN Japan WG 5 Jun-ichi Ohno 47/2388A/NP 2017-06-30
TC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
IEC 63041-3 ED1

PNW 49-1215: Piezoelectric Sensors – Part 3: Physical Sensors

ACD DE WG 13 Richard Grünwald 49/1215/NP 2017-06-16
TC 56 - Dependability
IEC 63142 ED1

PNW 56-1730: A global methodology for reliability data prediction of electronic components

ACD Secretariat PT 2.25 Michel Giraudeau 56/1730/NP 2017-05-26
SC 62B - Diagnostic imaging equipment
IEC 61223-3-6 ED1

PNW 62B-1042: EVALUATION AND ROUTINE TESTING IN MEDICAL IMAGING DEPARTMENTS – Part 3-6 Acceptance and Constancy tests – Imaging performance of MAMMOGRAPHIC TOMOSYNTHESIS mode of operation of MAMMOGRAPHIC X-RAY EQUIPMENT

CD US WG 31 Andrew Smith 62B/1060/CD 2017-03-17
SC 65C - Industrial networks
IEC 61784-6 ED1

PNW 65C-875: Industrial communication networks – Profiles – Part 6: Time sensitive networking profile for industrial use based on IEEE 802.1 and IEEE 802.3

ACD Secretariat PT 61784-6 Ludwig Winkel 65C/875/NP 2017-06-16
TC 90 - Superconductivity
IEC 61788-26 ED1

PNW 90-381: Superconductivity – Part 26: Critical current measurement – DC critical current of RE-Ba-Cu-O composite superconductors

ACD Secretariat WG 3 Gen NISHIJIMA 90/381/NP 2017-04-28
TC 100 - Audio, video and multimedia systems and equipment
PNW 100-2922

PNW 100-2922: Sound system equipment - Electrical and mechanical measurements

PRVN Germany Wolfgang Klippel 100/2922/NP 2017-07-14
IEC 62680-1-4 ED1

PNW 100-2942: Universal Serial Bus interfaces for data and power - Part 1-4: Common Components – USB Type-C™ Authentication Specification

ACDV SECRETARIAT PT 62680-1-4 Jeff Ravencraft 100/2942/NP 2017-06-23
TC 110 - Electronic display devices
IEC 62906-5-5 ED1

PNW 110-857: Future IEC 62906-5-5: Lawer display devices – Part 5-5: Optical measuring methods of raster-scanning retina direct projection devices

ACD JP WG 10 Manabu Ishimoto 110/857/NP 2017-05-12
TC 113 - Nanotechnology for electrotechnical products and systems
PNW TS 113-357

PNW TS 113-357: Nanomanufacturing–Key control characteristics–Part 3-3: Luminescent nanomaterials - Determination of fluorescence lifetime using Time Correlated Single Photon Counting(TCSPC)

PRVN China WG 10 Yiqun WANG 113/357/NP 2017-06-23
TC 114 - Marine energy - Wave, tidal and other water current converters
IEC TS 62600-3 ED1

PNW TS 114-218: Marine energy – Wave, tidal and other water current converters – Part 3: Measurement of mechanical loads (proposed IEC TS 62600-3)

ACD Secretariat PT 62600-3 Anton Schaap 114/218/NP 2017-06-30
TC 119 - Printed Electronics
IEC 62899-505 ED1

PNW 119-155: Future IEC 62899-50X : Printed Electronics - Part 50X : Quality Assessment - Flexible gas sensor: Mechanical and Thermal testing

ACD Korea, Republic of WG 5 HYUN JONG KIM 119/155A/NP 2017-05-26
PNW 119-157

PNW 119-157: Future IEC 62899-202-5 : Printed electronics – Part 202-5 : Materials - Conductive film – Environment reliability test of a printed metal based conductive layer on flexible substrate

PRVN Korea, Republic of WG 2 Haekyoung Kim 119/157/NP 2017-06-09
SC 121A - Low-voltage switchgear and controlgear
IEC 60947-9-2 ED1

PNW 121A-141: Low-voltage switchgear and controlgear - Active arc-fault mitigation systems - Part 9-2: Optical-based internal arc-detection and mitigation devices

ACD Low-voltage switchgear and controlgear WG 19 Eric Bettega 121A/141/NP 2017-06-02