International Standards and Conformity Assessment
for all electrical, electronic and related technologies
SC 47E |
Discrete semiconductor devices |

Preview | Reference, Edition, Date, Title | Language |
|---|---|---|
| IEC 60747-2
Edition 2.0 (2000-03-21)Semiconductor devices - Discrete devices and integrated circuits - Part 2: Rectifier diodesStability Date: 2014 | EN-FR |
| IEC 60747-2-2
Edition 1.0 (1993-10-08)Semiconductor devices - Discrete devices - Part 2: Rectifier diodes - Section 2: Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 AStability Date: 2014 | EN-FR |
| IEC 60747-3
Edition 1.0 (1985-07-30)Semiconductor devices - Discrete devices - Part 3: Signal (including
switching) and regulator diodesStability Date: 2012 | EN-FR |
| No preview | IEC 60747-3-am1
Edition 1.0 (1991-11-25)Amendment 1 - Semiconductor devices - Discrete devices - Part 3: Signal (including
switching) and regulator diodesStability Date: 2012 | EN-FR |
| No preview | IEC 60747-3-am2
Edition 1.0 (1993-11-30)Amendment 2 - Semiconductor devices - Discrete devices - Part 3: Signal (including
switching) and regulator diodesStability Date: 2012 | EN-FR |
| IEC 60747-4
Edition 2.0 (2007-08-23)Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistorsStability Date: 2014 | EN-FR |
| IEC 60747-5-1
Edition 1.2 (2002-05-14)Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - GeneralStability Date: 2013 | EN-FR |
| IEC 60747-5-1
Edition 1.0 (1997-09-05)Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
Stability Date: 2013 | EN-FR |
| No preview | IEC 60747-5-1-am1
Edition 1.0 (2001-03-22)Amendment 1 - Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - GeneralStability Date: 2013 | EN-FR |
| No preview | IEC 60747-5-1-am2
Edition 1.0 (2002-03-25)Amendment 2 - Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - GeneralStability Date: 2013 | EN-FR |
| IEC 60747-5-2
Edition 1.1 (2009-11-25)Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristicsStability Date: 2013 | EN-FR |
| IEC 60747-5-2
Edition 1.0 (1997-09-10)Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics Stability Date: 2013 | EN-FR |
| No preview | IEC 60747-5-2-am1
Edition 1.0 (2002-03-25)Amendment 1 - Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristicsStability Date: 2013 | EN-FR |
| IEC 60747-5-3
Edition 1.1 (2009-11-25)Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methodsStability Date: 2013 | EN-FR |
| IEC 60747-5-3
Edition 1.0 (1997-09-05)Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods Stability Date: 2013 | EN-FR |
| No preview | IEC 60747-5-3-am1
Edition 1.0 (2002-03-25)Amendment 1 - Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methodsStability Date: 2013 | EN-FR |
| IEC 60747-5-4
Edition 1.0 (2006-02-23)Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasersStability Date: 2013 | EN-FR |
| IEC 60747-5-5
Edition 1.0 (2007-09-26)Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - PhotocouplersStability Date: 2012 | EN-FR |
| IEC 60747-6
Edition 2.0 (2000-12-21)Semiconductor devices - Part 6: Thyristors Stability Date: 2014 | EN-FR |
| IEC 60747-6-3
Edition 1.0 (1993-11-19)Semiconductor devices - Discrete devices - Part 6: Thyristors - Section Three: Blank detail specification for reverse blocking triode thyristors, ambient and case-rated, for currents greater than 100 AStability Date: 2014 | EN-FR |
| IEC 60747-7
Edition 3.0 (2010-12-16)Semiconductor devices - Discrete devices - Part 7: Bipolar transistorsStability Date: 2015 | EN-FR |
| IEC 60747-8
Edition 3.0 (2010-12-15)Semiconductor devices - Discrete devices - Part 8: Field-effect transistorsStability Date: 2015 | EN-FR |
| IEC 60747-8-2
Edition 1.0 (1993-02-15)Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section two: Blank detail specification for field-effect transistors for case-rated power amplifier applicationsStability Date: 2013 | EN-FR |
| IEC 60747-8-3
Edition 1.0 (1995-04-20)Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section 3: Blank detail specification for case-rated field effect transistors for switching applicationsStability Date: 2013 | EN-FR |
| IEC 60747-8-4
Edition 1.0 (2004-09-24)Discrete semiconductor devices - Part 8-4: Metal-oxide-semiconductor field-effect transistors (MOSFETs) for power switching applicationsStability Date: 2013 | EN-FR |
| IEC 60747-9
Edition 2.0 (2007-09-26)Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)Stability Date: 2017 | EN-FR |
| IEC 60747-10
Edition 2.0 (1991-05-21)Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuitsStability Date: 2015 | EN-FR |
| No preview | IEC 60747-10-am3
Edition 2.0 (1996-08-23)Amendment 3 - Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuitsStability Date: 2015 | EN-FR |
| IEC 60747-11
Edition 1.0 (1985-01-01)Semiconductor devices. Discrete devices. Part 11: Sectional
specification for discrete devicesStability Date: 2015 | EN-FR |
| No preview | IEC 60747-11-am1
Edition 1.0 (1991-11-01)Amendment 1 - Semiconductor devices. Discrete devices. Part 11: Sectional
specification for discrete devicesStability Date: 2015 | EN-FR |
| No preview | IEC 60747-11-am2
Edition 1.0 (1996-05-22)Amendment 2 - Semiconductor devices. Discrete devices. Part 11: Sectional
specification for discrete devicesStability Date: 2015 | EN-FR |
| IEC 60747-14-1
Edition 2.0 (2010-01-21)Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensorsStability Date: 2015 | EN-FR |
| IEC 60747-14-2
Edition 1.0 (2000-11-09)Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elementsStability Date: 2015 | EN |
| IEC 60747-14-3
Edition 2.0 (2009-04-29)Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensorsStability Date: 2015 | EN-FR |
| IEC 60747-14-4
Edition 1.0 (2011-01-27)Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometersStability Date: 2015 | EN-FR |
| IEC 60747-14-5
Edition 1.0 (2010-02-11)Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensorStability Date: 2015 | EN-FR |
| IEC 60747-15
Edition 2.0 (2010-12-16)Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devicesStability Date: 2015 | EN-FR |
| IEC 60747-16-1
Edition 1.0 (2001-11-20)Semiconductor devices - Part 16-1: Microwave integrated circuits - AmplifiersStability Date: 2014 | EN-FR |
| IEC 60747-16-1
Edition 1.1 (2007-03-13)Semiconductor devices - Part 16-1: Microwave integrated circuits - AmplifiersStability Date: 2014 | EN |
| IEC 60747-16-1
Edition 1.0 (2001-11-20)Semiconductor devices - Part 16-1: Microwave integrated circuits - AmplifiersStability Date: 2014 | EN |
| No preview | IEC 60747-16-1-am1
Edition 1.0 (2007-01-26)Amendment 1 - Semiconductor devices - Part 16-1: Microwave integrated circuits - AmplifiersStability Date: 2014 | EN-FR |
| No preview | IEC 60747-16-1-am1
Edition 1.0 (2007-01-26)Amendment 1 - Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers Stability Date: 2014 | EN |
| IEC 60747-16-2
Edition 1.1 (2008-01-22)Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalersStability Date: 2017 | EN |
| IEC 60747-16-2
Edition 1.0 (2001-03-22)Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalersStability Date: 2017 | EN |
| No preview | IEC 60747-16-2-am1
Edition 1.0 (2007-10-18)Amendment 1 - Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalersStability Date: 2017 | EN |
| IEC 60747-16-3
Edition 1.1 (2010-04-28)Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency convertersStability Date: 2015 | EN-FR |
| IEC 60747-16-3
Edition 1.0 (2002-05-07)Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency convertersStability Date: 2015 | EN-FR |
| IEC 60747-16-3
Edition 1.0 (2002-05-07)Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency convertersStability Date: 2015 | EN |
| No preview | IEC 60747-16-3-am1
Edition 1.0 (2009-03-10)Amendment 1 - Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency convertersStability Date: 2015 | EN-FR |
| No preview | IEC 60747-16-3-am1
Edition 1.0 (2009-03-10)Amendment 1 - Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency convertersStability Date: 2015 | EN |
| IEC 60747-16-4
Edition 1.1 (2011-04-21)Semiconductor devices - Part 16-4: Microwave integrated circuits - SwitchesStability Date: 2015 | EN-FR |
| IEC 60747-16-4
Edition 1.0 (2004-07-28)Semiconductor devices - Part 16-4: Microwave integrated circuits - SwitchesStability Date: 2015 | EN-FR |
| IEC 60747-16-4
Edition 1.1 (2011-04-21)Semiconductor - devices - Part 16-4: Microwave integrated circuits - SwitchesStability Date: 2015 | EN |
| IEC 60747-16-4
Edition 1.0 (2004-07-28)Semiconductor devices - Part 16-4: Microwave integrated circuits - SwitchesStability Date: 2015 | EN |
| No preview | IEC 60747-16-4-am1
Edition 1.0 (2009-03-10)Amendment 1 - Semiconductor devices - Part 16-4: Microwave integrated circuits - SwitchesStability Date: 2015 | EN-FR |
| No preview | IEC 60747-16-4-am1
Edition 1.0 (2009-03-10)Amendment 1 - Semiconductor devices - Part 16-4: Microwave integrated circuits - SwitchesStability Date: 2015 | EN |
| IEC 60747-16-10
Edition 1.0 (2004-07-15)Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuitsStability Date: 2014 | EN-FR |
| IEC 60747-16-10
Edition 1.0 (2004-07-15)Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuitsStability Date: 2014 | EN |
| IEC/PAS 60747-17
Edition 1.0 (2011-11-17)Semiconductor devices - Discrete devices - Part 17: Magnetic and capacitive coupler for basic and reinforced isolation Stability Date: 2014 | EN |



