IEC 60122-1

Edition 3.0 (2002-08-09)

Quartz crystal units of assessed quality - Part 1: Generic specification

Stability Date: 2015

IEC 60122-2

Edition 2.0 (1983-01-01)

Quartz crystal units for frequency control and selection. Part 2: Guide to the use of quartz crystal units for frequency control and selection

Stability Date: 2015

IEC 60122-2-1

Edition 1.0 (1991-07-22)

Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection - Section One: Quartz crystal units for microprocessor clock supply

Stability Date: 2015

IEC 60122-2-1-am1

Edition 1.0 (1993-09-06)

Amendment 1 - Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection - Section One: Quartz crystal units for microprocessor clock supply

Stability Date: 2015

IEC 60122-3

Edition 4.0 (2010-10-11)

Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections

Stability Date: 2015

IEC 60368-1

Edition 4.0 (2000-03-10)

Piezoelectric filters of assessed quality - Part 1: Generic specification

Stability Date: 2015

IEC 60368-1-am1

Edition 4.0 (2004-08-17)

Amendment 1 - Piezoelectric filters of assessed quality - Part 1: Generic specification

Stability Date: 2015

IEC 60368-2-1

Edition 2.0 (1988-06-30)

Piezoelectric filters. Part 2: Guide to the use of piezoelectric filters - Section One: Quartz crystal filters

Stability Date: 2015

IEC 60368-2-2

Edition 1.0 (1996-07-25)

Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters

Stability Date: 2015

IEC 60368-3

Edition 4.0 (2010-11-25)

Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections

Stability Date: 2015

IEC 60368-4

Edition 1.0 (2000-08-10)

Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval

Stability Date: 2015

IEC 60368-4-1

Edition 1.0 (2000-11-09)

Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval

Stability Date: 2015

IEC 60444-1

Edition 2.0 (1986-08-15)

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network

Stability Date: 2015

IEC 60444-1-am1

Edition 2.0 (1999-08-13)

Amendment 1 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network

Stability Date: 2015

IEC 60444-2

Edition 1.0 (1980-01-01)

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

Stability Date: 2015

IEC/TR 60444-4

Edition 1.0 (1988-06-30)

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz

Stability Date: 2015

IEC 60444-5

Edition 1.0 (1995-04-07)

Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction

Stability Date: 2015

IEC 60444-6

Edition 1.0 (1995-03-01)

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

Stability Date: 2012

IEC 60444-7

Edition 1.0 (2004-04-05)

Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units

Stability Date: 2015

IEC 60444-8

Edition 1.0 (2003-07-04)

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

Stability Date: 2015

IEC 60444-8

Edition 1.0 (2003-07-04)

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

Stability Date: 2015

IEC 60444-9

Edition 1.0 (2007-02-20)

Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units

Stability Date: 2015

IEC 60444-11

Edition 1.0 (2010-10-07)

Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency f<sub>L</sub> and the effective load capacitance C<sub>Leff</sub> using automatic network analyzer techniques and error correction

Stability Date: 2015

IEC 60483

Edition 1.0 (1976-01-01)

Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling

Stability Date: 2015

IEC 60642

Edition 1.0 (1979-01-01)

Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions

Stability Date: 2015

IEC 60642-am1

Edition 1.0 (1992-09-30)

Amendment 1 - Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions

Stability Date: 2015

IEC 60642-2

Edition 1.0 (1994-02-08)

Piezoelectric ceramic resonator units - Part 2: Guide to the use of piezoelectric ceramic resonator units

Stability Date: 2015

IEC 60642-3

Edition 1.0 (1992-03-15)

Piezoelectric ceramic resonators - Part 3: Standard outlines

Stability Date: 2015

IEC 60679-1

Edition 3.0 (2007-04-11)

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

Stability Date: 2012

IEC 60679-1

Edition 3.0 (2007-04-11)

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

Stability Date: 2012

IEC 60679-2

Edition 1.0 (1981-01-01)

Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators

Stability Date: 2015

IEC 60679-3

Edition 3.0 (2012-12-14)

Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections

Stability Date: 2015

IEC 60679-4

Edition 1.0 (1997-11-28)

Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval

Stability Date: 2015

IEC 60679-4-1

Edition 1.0 (1998-02-19)

Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval

Stability Date: 2015

IEC 60679-5

Edition 1.0 (1998-04-15)

Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval

Stability Date: 2015

IEC 60679-5-1

Edition 1.0 (1998-04-29)

Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval

Stability Date: 2015

IEC 60679-6

Edition 1.0 (2011-03-14)

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

Stability Date: 2015

IEC 60689

Edition 2.0 (2008-11-27)

Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values

Stability Date: 2015

IEC 60758

Edition 4.0 (2008-11-13)

Synthetic quartz crystal - Specifications and guidelines for use

Stability Date: 2015

IEC 60758

Edition 4.0 (2008-11-13)

Synthetic quartz crystal - Specifications and guidelines for use

Stability Date: 2015

IEC 60862-1

Edition 2.0 (2003-05-19)

Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification

Stability Date: 2012

IEC 60862-1

Edition 2.0 (2003-05-19)

Versión Oficial En español - Filtros de ondas acústicas de superficie (OAS) con calidad evaluada. Parte 1: Especificación genérica.

Stability Date: 2012

IEC 60862-2

Edition 3.0 (2012-05-07)

Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use

Stability Date: 2015

IEC 60862-3

Edition 2.0 (2003-10-08)

Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines

Stability Date: 2015

IEC 60862-3

Edition 2.0 (2003-10-08)

Versión Oficial En español - Filtros de ondas acústicas de superficie (OAS) con calidad garantizada. Parte 3: Diseños normalizados.

Stability Date: 2015

IEC 61019-1

Edition 1.0 (2004-11-02)

Surface acoustic wave (SAW) resonators - Part 1: Generic specification

Stability Date: 2015

IEC 61019-1

Edition 1.0 (2004-11-02)

Surface acoustic wave (SAW) resonators - Part 1: Generic specification

Stability Date: 2015

IEC 61019-2

Edition 2.0 (2005-05-12)

Surface acoustic wave (SAW) resonators - Part 2: Guide to the use

Stability Date: 2015

IEC 61019-3

Edition 1.0 (1991-12-24)

Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections

Stability Date: 2015

IEC 61080

Edition 1.0 (1991-12-31)

Guide to the measurement of equivalent electrical parameters of quartz crystal units

Stability Date: 2015

IEC 61178-2

Edition 1.0 (1993-03-31)

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval

Stability Date: 2015

IEC 61178-2-1

Edition 1.0 (1993-03-31)

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval - Section 1: Blank detail specification

Stability Date: 2015

IEC 61178-3

Edition 1.0 (1993-03-31)

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval

Stability Date: 2015

IEC 61178-3-1

Edition 1.0 (1993-03-31)

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval - Section 1: Blank detail specification

Stability Date: 2015

IEC 61240

Edition 2.0 (2012-07-25)

Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules

Stability Date: 2015

IEC 61253-1

Edition 1.0 (1993-12-17)

Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval

Stability Date: 2015

IEC 61253-2

Edition 1.0 (1993-12-17)

Piezoelectric ceramic resonators - A Specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval

Stability Date: 2015

IEC 61253-2-1

Edition 1.0 (1993-12-17)

Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E

Stability Date: 2015

IEC 61261-1

Edition 1.0 (1994-03-24)

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval

Stability Date: 2015

IEC 61261-2

Edition 1.0 (1994-03-11)

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval

Stability Date: 2015

IEC 61261-2-1

Edition 1.0 (1994-03-11)

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E

Stability Date: 2015

IEC 61337-1

Edition 1.0 (2004-11-02)

Filters using waveguide type dielectric resonators - Part 1: Generic specification

Stability Date: 2015

IEC 61337-1

Edition 1.0 (2004-11-02)

Versión Oficial en Español - Filtros que utilizan resonadores dieléctricos tipo guía de onda. Parte 1: Especificaciones generales

Stability Date: 2015

IEC 61337-2

Edition 1.0 (2004-07-06)

Filters using waveguide type dielectric resonators - Part 2: Guidance for use

Stability Date: 2015

IEC 61338-1

Edition 1.0 (2004-11-02)

Waveguide type dielectric resonators - Part 1: Generic specification

Stability Date: 2015

IEC 61338-1-3

Edition 1.0 (1999-11-30)

Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency

Stability Date: 2015

IEC 61338-1-4

Edition 1.0 (2005-11-08)

Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency

Stability Date: 2015

IEC/PAS 61338-1-5

Edition 1.0 (2010-05-19)

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

Stability Date: 2015

IEC 61338-2

Edition 1.0 (2004-05-27)

Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications

Stability Date: 2015

IEC 61338-4

Edition 1.0 (2005-03-23)

Waveguide type dielectric resonators - Part 4: Sectional specification

Stability Date: 2015

IEC 61338-4-1

Edition 1.0 (2005-03-23)

Waveguide type dielectric resonators - Part 4-1: Blank detail specification

Stability Date: 2015

IEC 61837-1

Edition 2.0 (2012-04-20)

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines

Stability Date: 2016

IEC 61837-2

Edition 2.0 (2011-05-27)

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

Stability Date: 2014

IEC 61837-3

Edition 1.0 (2000-08-30)

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures

Stability Date: 2014

IEC 61837-4

Edition 1.0 (2004-05-26)

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines

Stability Date: 2014

IEC/TS 61994-1

Edition 2.0 (2007-08-30)

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators

Stability Date: 2015

IEC/TS 61994-2

Edition 2.0 (2011-06-17)

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters

Stability Date: 2014

IEC/TS 61994-3

Edition 2.0 (2011-07-26)

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric and dielectric oscillators

Stability Date: 2014

IEC/TS 61994-4-1

Edition 2.0 (2007-08-29)

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal

Stability Date: 2015

IEC/TS 61994-4-2

Edition 2.0 (2011-03-08)

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics

Stability Date: 2015

IEC/TS 61994-4-3

Edition 1.0 (2008-02-22)

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials - Materials for dielectric devices

Stability Date: 2015

IEC/TS 61994-4-4

Edition 2.0 (2010-06-24)

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for surface acoustic wave (SAW) devices

Stability Date: 2015

IEC 62276

Edition 2.0 (2012-10-19)

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Stability Date: 2015

IEC 62575-2

Edition 1.0 (2012-07-25)

Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use

Stability Date: 2015

IEC 62604-2

Edition 1.0 (2011-11-28)

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guideline for the use

Stability Date: 2014