International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 49

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection

 
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TC 49 Publications (82)

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IEC 60122-1:2002

Edition 3.0 (2002-08-09)

Quartz crystal units of assessed quality - Part 1: Generic specification

EN-FR
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IEC 60122-2:1983

Edition 2.0 (1983-01-01)

Quartz crystal units for frequency control and selection. Part 2: Guide to the use of quartz crystal units for frequency control and selection

EN-FR, RU
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IEC 60122-2-1:1991

Edition 1.0 (1991-07-22)

Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection - Section One: Quartz crystal units for microprocessor clock supply

EN-FR
No preview
IEC 60122-2-1:1991/AMD1:1993

Edition 1.0 (1993-09-06)

Amendment 1 - Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection - Section One: Quartz crystal units for microprocessor clock supply

EN-FR
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IEC 60122-3:2010

Edition 4.0 (2010-10-11)

Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections

EN-FR
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IEC 60368-1:2000+AMD1:2004 CSV

Edition 4.1 (2013-05-28)

Piezoelectric filters of assessed quality - Part 1: Generic specification

EN-FR
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IEC 60368-1:2000

Edition 4.0 (2000-03-10)

Piezoelectric filters of assessed quality - Part 1: Generic specification

EN-FR
No preview
IEC 60368-1:2000/AMD1:2004

Edition 4.0 (2004-08-17)

Amendment 1 - Piezoelectric filters of assessed quality - Part 1: Generic specification

EN-FR, EN
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IEC 60368-2-1:1988

Edition 2.0 (1988-06-30)

Piezoelectric filters. Part 2: Guide to the use of piezoelectric filters - Section One: Quartz crystal filters

EN-FR, RU
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IEC 60368-2-2:1996

Edition 1.0 (1996-07-25)

Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters

EN-FR
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IEC 60368-3:2010

Edition 4.0 (2010-11-25)

Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections

EN-FR
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IEC 60368-4:2000

Edition 1.0 (2000-08-10)

Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval

EN-FR
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IEC 60368-4-1:2000

Edition 1.0 (2000-11-09)

Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval

EN-FR
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IEC 60444-1:1986

Edition 2.0 (1986-08-15)

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network

EN-FR, RU
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IEC 60444-1:1986/AMD1:1999

Edition 2.0 (1999-08-13)

Amendment 1 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network

EN-FR
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IEC 60444-2:1980

Edition 1.0 (1980-01-01)

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

EN-FR, RU
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IEC TR 60444-4:1988

Edition 1.0 (1988-06-30)

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz

EN-FR, RU
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IEC 60444-5:1995

Edition 1.0 (1995-04-07)

Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction

EN-FR
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IEC 60444-6:2013

Edition 2.0 (2013-06-19)

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

EN-FR
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IEC 60444-7:2004

Edition 1.0 (2004-04-05)

Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units

EN-FR, EN
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IEC 60444-8:2003

Edition 1.0 (2003-07-04)

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

EN-FR, EN
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IEC 60444-9:2007

Edition 1.0 (2007-02-20)

Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units

EN-FR, EN
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IEC 60444-11:2010

Edition 1.0 (2010-10-07)

Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction

EN-FR
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IEC 60483:1976

Edition 1.0 (1976-01-01)

Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling

EN-FR, RU
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IEC 60642:1979

Edition 1.0 (1979-01-01)

Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions

EN-FR, RU
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IEC 60642:1979/AMD1:1992

Edition 1.0 (1992-09-30)

Amendment 1 - Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions

EN-FR
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IEC 60642-2:1994

Edition 1.0 (1994-02-08)

Piezoelectric ceramic resonator units - Part 2: Guide to the use of piezoelectric ceramic resonator units

EN-FR
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IEC 60642-3:1992

Edition 1.0 (1992-03-15)

Piezoelectric ceramic resonators - Part 3: Standard outlines

EN-FR
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IEC 60679-1:2007

Edition 3.0 (2007-04-11)

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

EN-FR, EN
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IEC 60679-2:1981

Edition 1.0 (1981-01-01)

Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators

EN-FR, RU
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IEC 60679-3:2012

Edition 3.0 (2012-12-14)

Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections

EN-FR
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IEC 60679-4:1997

Edition 1.0 (1997-11-28)

Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval

EN-FR
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IEC 60679-4-1:1998

Edition 1.0 (1998-02-19)

Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval

EN-FR
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IEC 60679-5:1998

Edition 1.0 (1998-04-15)

Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval

EN-FR
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IEC 60679-5-1:1998

Edition 1.0 (1998-04-29)

Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval

EN-FR
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IEC 60679-6:2011

Edition 1.0 (2011-03-14)

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

EN-FR
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IEC 60689:2008

Edition 2.0 (2008-11-27)

Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values

EN-FR, EN
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IEC 60758:2008

Edition 4.0 (2008-11-13)

Synthetic quartz crystal - Specifications and guidelines for use

EN-FR, EN
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IEC 60862-1:2003

Edition 2.0 (2003-05-19)

Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification

EN-FR, ES
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IEC 60862-2:2012

Edition 3.0 (2012-05-07)

Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use

EN-FR
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IEC 60862-3:2003

Edition 2.0 (2003-10-08)

Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines

EN-FR, ES
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IEC 61019-1:2004

Edition 1.0 (2004-11-02)

Surface acoustic wave (SAW) resonators - Part 1: Generic specification

EN-FR, EN
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IEC 61019-2:2005

Edition 2.0 (2005-05-12)

Surface acoustic wave (SAW) resonators - Part 2: Guide to the use

EN-FR, EN
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IEC 61019-3:1991

Edition 1.0 (1991-12-24)

Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections

EN-FR
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IEC 61080:1991

Edition 1.0 (1991-12-31)

Guide to the measurement of equivalent electrical parameters of quartz crystal units

EN-FR
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IEC 61178-2:1993

Edition 1.0 (1993-03-31)

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval

EN-FR
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IEC 61178-2-1:1993

Edition 1.0 (1993-03-31)

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval - Section 1: Blank detail specification

EN-FR
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IEC 61178-3:1993

Edition 1.0 (1993-03-31)

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval

EN-FR
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IEC 61178-3-1:1993

Edition 1.0 (1993-03-31)

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval - Section 1: Blank detail specification

EN-FR
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IEC 61240:2012

Edition 2.0 (2012-07-25)

Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules

EN-FR
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IEC 61253-1:1993

Edition 1.0 (1993-12-17)

Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval

EN-FR
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IEC 61253-2:1993

Edition 1.0 (1993-12-17)

Piezoelectric ceramic resonators - A Specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval

EN-FR
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IEC 61253-2-1:1993

Edition 1.0 (1993-12-17)

Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E

EN-FR
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IEC 61261-1:1994

Edition 1.0 (1994-03-24)

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval

EN-FR
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IEC 61261-2:1994

Edition 1.0 (1994-03-11)

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval

EN-FR
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IEC 61261-2-1:1994

Edition 1.0 (1994-03-11)

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E

EN-FR
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IEC 61337-1:2004

Edition 1.0 (2004-11-02)

Filters using waveguide type dielectric resonators - Part 1: Generic specification

EN-FR, EN, ES
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IEC 61337-2:2004

Edition 1.0 (2004-07-06)

Filters using waveguide type dielectric resonators - Part 2: Guidance for use

EN-FR, EN
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IEC 61338-1:2004

Edition 1.0 (2004-11-02)

Waveguide type dielectric resonators - Part 1: Generic specification

EN-FR, EN
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IEC 61338-1-3:1999

Edition 1.0 (1999-11-30)

Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency

EN-FR
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IEC 61338-1-4:2005

Edition 1.0 (2005-11-08)

Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency

EN-FR, EN
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IEC PAS 61338-1-5:2010

Edition 1.0 (2010-05-19)

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

EN
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IEC 61338-2:2004

Edition 1.0 (2004-05-27)

Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications

EN-FR, EN
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IEC 61338-4:2005

Edition 1.0 (2005-03-23)

Waveguide type dielectric resonators - Part 4: Sectional specification

EN-FR, EN
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IEC 61338-4-1:2005

Edition 1.0 (2005-03-23)

Waveguide type dielectric resonators - Part 4-1: Blank detail specification

EN-FR, EN
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IEC 61837-1:2012

Edition 2.0 (2012-04-20)

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines

EN-FR
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IEC 61837-2:2011+AMD1:2014 CSV

Edition 2.1 (2014-03-14)

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

EN-FR
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IEC 61837-2:2011

Edition 2.0 (2011-05-27)

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

EN-FR
No preview
IEC 61837-2:2011/AMD1:2014

Edition 2.0 (2014-03-14)

Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

EN-FR
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IEC 61837-3:2000

Edition 1.0 (2000-08-30)

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures

EN-FR
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IEC 61837-4:2004

Edition 1.0 (2004-05-26)

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines

EN-FR, EN
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IEC TS 61994-1:2007

Edition 2.0 (2007-08-30)

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators

EN
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IEC TS 61994-2:2011

Edition 2.0 (2011-06-17)

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters

EN-FR
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IEC TS 61994-3:2011

Edition 2.0 (2011-07-26)

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric and dielectric oscillators

EN
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IEC TS 61994-4-1:2007

Edition 2.0 (2007-08-29)

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal

EN
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IEC TS 61994-4-2:2011

Edition 2.0 (2011-03-08)

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics

EN-FR
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IEC TS 61994-4-3:2008

Edition 1.0 (2008-02-22)

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials - Materials for dielectric devices

EN
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IEC TS 61994-4-4:2010

Edition 2.0 (2010-06-24)

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for surface acoustic wave (SAW) devices

EN
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IEC 62276:2012

Edition 2.0 (2012-10-19)

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

EN-FR
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IEC 62575-2:2012

Edition 1.0 (2012-07-25)

Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use

EN-FR
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IEC 62604-2:2011

Edition 1.0 (2011-11-28)

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guideline for the use

EN-FR
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IEC 62761:2014

Edition 1.0 (2014-02-19)

Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)

EN-FR