International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47E

Discrete semiconductor devices

 
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SC 47E Project files (181)

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PNW 47E-3-6 ED1

Amendment to IEC 747-3 - Measuring methods, forward recovery time of a rectifier diode or a signal diode

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  • Deleted items
EN U 47E(US)/2/NP
PNW 47E-29 ED1

Revised letter symbol of integrated circuit microwave amplifiers - Amendment to IEC 748-3

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  • DEL
  • Deleted items
EN U 47E/29/NP
PNW 47E-45 ED1

IEC 747 - Part 9: Insulated gate bipolar transistors (IGBTs) - Section 1: Blank detail specification for IGBTs for switching applications

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  • DEL
  • Deleted items
EN U 47E/45/NP
PNW 47E-82 ED1

Amendment to IEC 747-1 - Thermal power cycle test

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  • DEL
  • Deleted items
EN U 47E/82/NP
PNW 47E-86 ED1

Amendment to IEC 747-4 - Measuring methods for integrated circuit microwave frequency converters

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  • DEL
  • Deleted items
EN U 47E/86/NP
PNW 47E-87 ED1

Amendment to IEC 747-4 - Terminology, essential ratings and characteristics for integrated circuit microwave frequency converters

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  • DEL
  • Deleted items
EN U 47E/87/NP
PNW 47E-179 ED1

Semiconductor devices, Discrete devices, Semiconductor flow sensor

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  • Deleted items
EN U 47E/179/NP PDF file 80 kB
PNW 47E-297 ED1

Semiconductor devices - Discrete devices - Part 16-5: Microwave integrated circuits - Oscillators

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  • DEL
  • Deleted items
EN U 47E/297/NP PDF file 431 kB
PNW 47E-299 ED1

Semiconductor devices - Discrete Devices - Part 14-6: Semiconductor sensors - Test method of CMOS image sensor module

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  • DEL
  • Deleted items
EN U 47E/299/NP PDF file 731 kB
PNW 47E-312 ED1

Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators

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  • Deleted items
EN U 47E/312/NP PDF file 437 kB
PNW 47E-328 ED1

Semiconductor devices - Discrete devices - Part 14-x: Semiconductor sensors - Test method of CMOS image sensor module

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  • Deleted items
EN U 47E/328/NP PDF file 571 kB
PNW 47E-329 ED1

Semiconductor devices - Discrete devices - Part 14-7: Semiconductor sensors - Humidity

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  • DEL
  • Deleted items
EN U 47E/329/NP PDF file 468 kB
PNW 47E-352 ED1

Semiconductor devices - magnetic and capacitive coupler for safe isolation

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  • DEL
  • Deleted items
EN U 47E/352/NP PDF file 390 kB
PNW 47E-462 ED1

Future IEC 60747-16-6: Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers

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EN U 47E/462/NP PDF file 322 kB
PNW 47E-494 ED1

Future IEC 60747-14-x: Semiconductor devices - Part 14-x: Semiconductor sensor - Test method of eutectic bonding for sensors

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EN U 47E/494/NP PDF file 579 kB
PNW 47E-495 ED1

Future IEC 60747-14-x: Semiconductor devices - Part 14-x: Semiconductor sensors - Sensor media compatibility

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EN U 47E/495/NP PDF file 228 kB
PNW 47E-526 ED1

Future IEC 60747-14-10: Semiconductor devices - Part 14-10: Semiconductor sensors - Test and evaluation methods for implantable glucose sensor

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EN U 47E/526/NP PDF file 1730 kB
PNW 47E-550 ED1

Future IEC 60747-14-11: Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature

PRVN
  • PRVN
  • Preparation of RVN
EN U 47E/550/NP PDF file 3068 kB
PNW 47E-555 ED1

Future IEC 60747-18-2: Semiconductor devices - Part 18-2: Semiconductor bio sensors - Evaluation process of lens-free CMOS photonic array sensor package module

PRVN
  • PRVN
  • Preparation of RVN
EN N 47E/555/NP PDF file 1524 kB
PNW 47E-560 ED1

Future IEC 60747-18-3: Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package module with fluidic system

PNW
  • PNW
  • New Work Item Proposal
EN N 47E/560/NP PDF file 2219 kB
IEC 60747-2:2016 ED3

Semiconductor devices - Part 2: Discrete devices - Rectifier diodes

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  • Publication issued
EN-FR 2016-03 N Webstore
IEC 60747-2:2000 ED2

Semiconductor devices - Discrete devices and integrated circuits - Part 2: Rectifier diodes

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  • Publication Deleted
EN-FR 2000-02 U 47(US)/786/NP
IEC 60747-2:1983 ED1

Semiconductor devices - Discrete devices - Part 2: Rectifier diodes

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  • Publication Deleted
EN-FR U
IEC 60747-2:1983/AMD1:1992 ED1

Amendment 1 - Semiconductor devices - Discrete devices - Part 2: Rectifier diodes

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  • Publication Deleted
EN-FR U
IEC 60747-2:1983/AMD2:1993 ED1

Amendment 2 - Semiconductor devices - Discrete devices - Part 2: Rectifier diodes

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  • Publication Deleted
EN-FR U
IEC 60747-2:1983/AMD3/FRAG2 ED1

Rectifier diodes, terms related to ratings and characteristics, to be included in IEC 747-2

MERGED
  • MERGED
  • Fragment merged
EN U 47(DE)/795/NP
IEC 60747-2:1983/AMD3/FRAG3 ED1

Amendment to IEC 747-2 - Essential ratings and characteristics: New Sub-clauses 7.10 and 7.11

MERGED
  • MERGED
  • Fragment merged
EN U 47(DE)/798/NP
IEC 60747-2-1 ED2

Systematic review of IEC 747-2-1 (1989)

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  • DEL
  • Deleted items
EN-FR U
IEC 60747-2-1:1989 ED1

Semiconductor devices - Discrete devices - Part 2: Rectifier diodes - Section One: Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A

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EN-FR U
IEC 60747-2-2:1993 ED1

Semiconductor devices - Discrete devices - Part 2: Rectifier diodes - Section 2: Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A

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  • Publication Withdrawn
EN-FR U
IEC 60747-3:2013 ED2

Semiconductor devices - Part 3: Discrete devices: Signal, switching and regulator diodes

PPUB
  • PPUB
  • Publication issued
EN-FR 2013-07 N Webstore
IEC 60747-3:1985 ED1

Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes

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EN-FR U
IEC 60747-3:1985/AMD1:1991 ED1

Amendment 1 - Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes

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  • DELPUB
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EN-FR U
IEC 60747-3:1985/AMD2:1993 ED1

Amendment 2 - Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR U
IEC 60747-3-1 ED2

Systematic review of IEC 747-3-1 (1986)

DEL
  • DEL
  • Deleted items
EN-FR U
IEC 60747-3-1:1986 ED1

Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section One: Blank detail specification for signal diodes, switching diodes and controlled-avalanche diodes

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  • WPUB
  • Publication Withdrawn
EN-FR U
IEC 60747-3-2 ED2

Systematic review of IEC 747-3-2 (1986)

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  • DEL
  • Deleted items
EN-FR U
IEC 60747-3-2:1986 ED1

Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section Two: Blank detail specification for voltage-regulator diodes and voltage-reference diodes,excluding temperature-compensated precision reference diodes

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  • Publication Withdrawn
EN-FR U
IEC 60747-4:2007 ED2

Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors

PPUB
  • PPUB
  • Publication issued
EN-FR 2007-09 N Webstore
IEC 60747-4:2007/FRAG2 ED2

Terminology and letter symbols for integrated circuit microwave frequency prescalers to be included in IEC 747-4

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  • MERGED
  • Fragment merged
EN U 47E/31/NP
IEC 60747-4:2007/FRAG3 ED2

Measuring methods for integrated circuit microwave frequency prescalers to be included in IEC 747-4

MERGED
  • MERGED
  • Fragment merged
EN U 47E/32/NP
IEC 60747-4:2007/AMD1 ED2

Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors

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  • RPUB
  • Publication received and registered
EN-FR 2016-10 N 47E/499/CDV
PDF file 234 kB

PDF file 234 kB
IEC 60747-4:2001+AMD1:1993+AMD2:1999 CSV ED1.2

Semiconductor devices - Discrete devices - Part 4: Microwave devices

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EN-FR U
IEC 60747-4:1991 ED1

Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors

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  • DELPUB
  • Publication Deleted
EN-FR U
IEC 60747-4:1991/AMD1:1993 ED1

Amendment 1 - Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors

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EN-FR U
IEC 60747-4:1991/AMD2:1999 ED1

Amendment 2 - Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors

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  • Publication Deleted
EN 1999-04 U 47E/123/FDIS PDF file 155 kB
IEC 60747-4:1991/AMD2:1999/FRAG2 ED1

Essential ratings and characteristics for integrated circuit microwave amplifiers, to be included in IEC 747-4

MERGED
  • MERGED
  • Fragment merged
EN U 47E(SEC.)/2/CD
IEC 60747-4:1991/AMD2:1999/FRAG3 ED1

Additional essential ratings and characteristics for microwave field effect transistors into IEC 747-4

MERGED
  • MERGED
  • Fragment merged
EN-FR U 47E(SEC.)/3/CDV
IEC 60747-4:1991/AMD2:1999/FRAG4 ED1

Revised and additional measuring methods for microwave field effect transistors - Amendment to Document 47(C.O.)1261

MERGED
  • MERGED
  • Fragment merged
EN-FR U 47E(SEC.)/4/CDV
IEC 60747-4:1991/AMD2:1999/FRAG6 ED1

Measuring methods of integrated circuit microwave amplifiers, to be included in IEC 747-4

MERGED
  • MERGED
  • Fragment merged
EN U 47(JP)/846/NP
IEC 60747-4-1:2000 ED1

Semiconductor devices - Discrete devices - Part 4-1: Microwave diodes and transistors - Microwave field effect transistors - Blank detail specification

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EN 1996-12 U 47(SEC.)/1140/CD
IEC 60747-4-2:2000 ED1

Semiconductor devices - Discrete devices - Part 4-2: Microwave diodes and transistors - Integrated-circuit microwave amplifiers - Blank detail specification

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  • Publication Withdrawn
EN 1998-10 U 47(JP)/847/NP
IEC 60747-4-4 ED1

Semiconductor devices - Generic specification for microwave field effect transistors

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EN U 47(FR)/864/NP
IEC 60747-5-1:2002+AMD1:2001+AMD2:2002 CSV ED1.2

Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General

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EN-FR U
IEC 60747-5-1:1997 ED1

Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General

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EN-FR 1997-08 U 47C/173/FDIS
IEC 60747-5-1:1997/AMD1:2001 ED1

Amendment 1 - Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General

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EN-FR 2001-03 U 47E/178/FDIS PDF file 156 kB
PDF file 155 kB
IEC 60747-5-1:1997/AMD2:2002 ED1

Amendment 2 - Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General

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EN-FR 2002-04 Y 47E/208/FDIS PDF file 175 kB
PDF file 177 kB
IEC 60747-5-2:2009+AMD1:2002 CSV ED1.1

Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics

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EN-FR U
IEC 60747-5-2:1997 ED1

Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics

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EN-FR 1997-08 U 47C/173/FDIS
IEC 60747-5-2:1997/AMD1:2002 ED1

Amendment 1 - Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics

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  • DELPUB
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EN-FR 2002-04 Y 47E/209/FDIS PDF file 190 kB
PDF file 206 kB
IEC 60747-5-3:2009+AMD1:2002 CSV ED1.1

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

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EN-FR U
IEC 60747-5-3:1997 ED1

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

DELPUB
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EN-FR 1997-08 U 47C/173/FDIS
IEC 60747-5-3:1997/AMD1:2002 ED1

Amendment 1 - Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

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  • DELPUB
  • Publication Deleted
EN-FR 2002-04 Y 47E/210/FDIS PDF file 233 kB
PDF file 237 kB
IEC 60747-5-4:2006 ED1

Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

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  • Publication issued
EN-FR N Webstore
IEC 60747-5-5 ED2

Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers

CD
  • CD
  • Draft circulated as CD
EN 2017-12 Y 47E/559/CD PDF file 804 kB
IEC 60747-5-5:2007 ED1

Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers

PPUB
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  • Publication issued
EN-FR 2007-10 N Webstore
IEC 60747-5-5:2007/AMD1:2013 ED1

Amendment 1 - Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers

PPUB
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  • Publication issued
EN-FR 2013-05 N Webstore
IEC 60747-5-6:2016 ED1

Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

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  • Publication issued
EN-FR 2016-03 N Webstore
IEC 60747-5-7:2016 ED1

Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors

PPUB
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  • Publication issued
EN-FR 2016-02 N Webstore
IEC 60747-6:2016 ED3

Semiconductor devices - Part 6: Discrete devices - Thyristors

PPUB
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  • Publication issued
EN-FR 2016-04 N Webstore
IEC 60747-6:2000 ED2

Semiconductor devices - Part 6: Thyristors

DELPUB
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  • Publication Deleted
EN-FR 2000-09 U 47(SEC.)/1149/CD
IEC 60747-6:1983 ED1

Semiconductor devices - Discrete devices - Part 6: Thyristors

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EN-FR U
IEC 60747-6:1983/AMD1:1991 ED1

Amendment 1 - Semiconductor devices - Discrete devices - Part 6: Thyristors

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  • Publication Deleted
EN-FR U
IEC 60747-6:1983/AMD2:1994 ED1

Amendment 2 - Semiconductor devices - Discrete devices - Part 6: Thyristors

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR U
IEC 60747-6:1983/AMD3/FRAG1 ED1

Revision of Clause 2, Thermal measurements of IEC 747-6, Chapter IV

MERGED
  • MERGED
  • Fragment merged
EN-FR U 47(SEC.)/1322/CDV
IEC 60747-6:1983/AMD3/FRAG2 ED1

Addition to Document 47(Sec.)1150: Revision of Clause 2, Thermal measurements of IEC 747-6, Chapter IV

DEL
  • DEL
  • Deleted items
EN U
IEC 60747-6:1983/AMD3/FRAG4 ED1

Measuring the turn-off behaviour of GTO-thyristors

MERGED
  • MERGED
  • Fragment merged
EN-FR U 47(SEC.)/1319/CDV
IEC 60747-6-1 ED2

Systematic review of IEC 747-6-1 (1989)

DEL
  • DEL
  • Deleted items
EN-FR U
IEC 60747-6-1:1989 ED1

Semiconductor devices - Discrete devices - Part 6: Thyristors - Section One: Blank detail specification for reverse blocking triode thyristors, ambient and case-rated, up to 100 A

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  • Publication Withdrawn
EN-FR U
IEC 60747-6-2 ED2

Systematic review of IEC 747-6-2 (1991)

DEL
  • DEL
  • Deleted items
EN-FR U
IEC 60747-6-2:1991 ED1

Semiconductor devices - Discrete devices - Part 6: Thyristors - Section Two: Blank detail specification for bidirectional triode thyristors (triacs), ambient or case-rated, up to 100 A

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  • Publication Withdrawn
EN-FR U
IEC 60747-6-3:1993 ED1

Semiconductor devices - Discrete devices - Part 6: Thyristors - Section Three: Blank detail specification for reverse blocking triode thyristors, ambient and case-rated, for currents greater than 100 A

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  • Publication Withdrawn
EN-FR U
IEC 60747-7:2010 ED3

Semiconductor devices - Discrete devices - Part 7: Bipolar transistors

PPUB
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  • Publication issued
EN-FR 2011-01 N Webstore
IEC 60747-7:2000 ED2

Semiconductor discrete devices and integrated circuits - Part 7: Bipolar transistors

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR 2000-07 U 47(SEC.)/1275/CD
IEC 60747-7:1988 ED1

Semiconductor devices - Discrete devices - Part 7: Bipolar transistors

DELPUB
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  • Publication Deleted
EN-FR U
IEC 60747-7:1988/AMD1:1991 ED1

Amendment 1 - Semiconductor devices - Discrete devices - Part 7: Bipolar transistors

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  • Publication Deleted
EN-FR U
IEC 60747-7:1988/AMD2:1994 ED1

Amendment 2 - Semiconductor devices - Discrete devices - Part 7: Bipolar transistors

DELPUB
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  • Publication Deleted
EN-FR U
IEC 60747-7:1988/AMD3/FRAG1 ED1

New concepts and letter symbols for insulated-gate bipolar transistors and (true) bipolar transistors, adaptations in existing standards (IGBT'S)

MERGED
  • MERGED
  • Fragment merged
EN-FR U 47(SEC.)/1251/CD
IEC 60747-7:1988/AMD3/FRAG4 ED1

Amendment to the scope of IEC 747-7

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  • MERGED
  • Fragment merged
EN U 47(DE)/796/NP
IEC 60747-7:1988/AMD3/FRAG6 ED1

Supplement to IEC 747-7 - Pulse methods for collector-base cut-off current and emitter-base cut-off current

MERGED
  • MERGED
  • Fragment merged
EN U 47E(SEC.)/5/CD
IEC 60747-7:1988/AMD3/FRAG7 ED1

Supplement to Chapter IV of IEC 747-7 - Measuring method for noise figure and power gain of bipolar transistors

DEL
  • DEL
  • Deleted items
EN U
IEC 60747-7:1988/AMD3/FRAG8 ED1

Supplement to Chapter IV of IEC 747-7 - Measuring method for R.F. output power gain of a bipolar power transistors

DEL
  • DEL
  • Deleted items
EN U
IEC 60747-7:1988/AMD3/FRAG9 ED1

Supplement to Chapter IV of IEC 747-7 - Measuring method for mixer power gain of a bipolar transistors

DEL
  • DEL
  • Deleted items
EN U
IEC 60747-7-1 ED2

Systematic review of IEC 747-7-1 (1989)

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  • Deleted items
EN-FR U
IEC 60747-7-1:1989 ED1

Semiconductor devices - Discrete devices - Part 7: Bipolar transistors - Section One: Blank detail specification for ambient-rated bipolar transistors for low and high-frequency amplification

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EN-FR U
IEC 60747-7-2 ED2

Systematic review of IEC 747-7-2 (1989)

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EN-FR U
IEC 60747-7-2:1989 ED1

Semiconductor devices - Discrete devices - Part 7: Bipolar transistors - Section Two: Blank detail specification for case-rated bipolar transistors for low-frequency amplification

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EN-FR U
IEC 60747-7-3 ED2

Systematic review of IEC 747-7-3 (1991)

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EN-FR U
IEC 60747-7-3:1991 ED1

Semiconductor devices - Discrete devices - Part 7: Bipolar transistors - Section three: Blank detail specification for bipolar transistors for switching applications

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EN-FR U
IEC 60747-7-4 ED2

Systematic review of IEC 747-7-4 (1991)

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  • Deleted items
EN-FR U
IEC 60747-7-4:1991 ED1

Semiconductor devices - Discrete devices - Part 7: Bipolar transistors - Section Four: Blank detail specification for case-rated bipolar transistors for high-frequency amplification

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  • Publication Withdrawn
EN-FR U
IEC 60747-7-5:2005 ED1

Semiconductor devices - Discrete devices - Part 7-5: Bipolar transistors for power switching applications

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  • Publication Deleted
EN 2005-08 N 47E/279/FDIS PDF file 557 kB
IEC 60747-8:2010 ED3

Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

PPUB
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  • Publication issued
EN-FR 2010-12 N Webstore
IEC 60747-8:2000 ED2

S emiconductor devices - Part 8: Field-effect transistors

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  • Publication Deleted
EN-FR 2000-07 U 47(SEC.)/1252/CD
IEC 60747-8:1984 ED1

Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

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EN-FR U
IEC 60747-8:1984/AMD1:1991 ED1

Amendment 1 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

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EN-FR U
IEC 60747-8:1984/AMD2:1993 ED1

Amendment 2 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

DELPUB
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  • Publication Deleted
EN-FR U
IEC 60747-8:1984/AMD3/FRAG2 ED1

Additional ratings and characteristics and amendments in the measuring methods for power switching field-effect transistors, to be included in IEC 747-8

MERGED
  • MERGED
  • Fragment merged
EN-FR U 47(SEC.)/1285/CD
IEC 60747-8:1984/AMD3/FRAG3 ED1

Additional concepts for field-effect transistors in IEC 747-8

MERGED
  • MERGED
  • Fragment merged
EN U 47(SEC.)/1312/CD
IEC 60747-8:1984/AMD3/FRAG4 ED1

Terminology - Revised and new concepts for field-effect transistors in IEC 747-1 and 747-8

MERGED
  • MERGED
  • Fragment merged
EN-FR U 47(SEC.)/1317/CDV
IEC 60747-8:1984/AMD3/FRAG5 ED1

Transfer of terms and letter symbols applicable to field-effect transistors contained in IEC 747-7, Sub-clauses 6.4.2.2, 6.4.2.3 to IEC 747-8, Sub-clause 4.3.5

MERGED
  • MERGED
  • Fragment merged
EN U 47(U.K.)/1114/NP
IEC 60747-8-1 ED2

Systematic review of IEC 747-8-1 (1987)

DEL
  • DEL
  • Deleted items
EN-FR U
IEC 60747-8-1:1987 ED1

Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section One: Blank detail specification for single-gate field-effect transistors up to 5 W and 1 GHz

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  • Publication Withdrawn
EN-FR U
IEC 60747-8-2:1993 ED1

Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section two: Blank detail specification for field-effect transistors for case-rated power amplifier applications

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  • Publication Withdrawn
EN-FR U
IEC 60747-8-3:1995 ED1

Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section 3: Blank detail specification for case-rated field effect transistors for switching applications

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  • Publication Withdrawn
EN-FR 1994-08 U
IEC 60747-8-4:2004 ED1

Discrete semiconductor devices - Part 8-4: Metal-oxide-semiconductor field-effect transistors (MOSFETs) for power switching applications

WPUB
  • WPUB
  • Publication Withdrawn
EN-FR 2004-09 N 47E/259/FDIS PDF file 715 kB
PDF file 730 kB
IEC 60747-9 ED3

Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)

ACD
  • ACD
  • Approved for CD
EN 2018-12 N 47E/548/CD PDF file 888 kB
IEC 60747-9:2007 ED2

Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)

PPUB
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  • Publication issued
EN-FR 2007-10 N Webstore
IEC 60747-9:2001+AMD1:2001 CSV ED1.1

Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)

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EN-FR U
IEC 60747-9:1998 ED1

Semiconductor devices - Part 9: Insulated-gate bipolar transistors (IGBTs)

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EN-FR 1998-08 U 47(SEC.)/1282/CD
IEC 60747-9:1998/FRAG2 ED1

Discrete devices - Terminology - Concepts related to insulated-gate bipolar transistors, IGBT's

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EN-FR U
IEC 60747-9:1998/AMD1:2001 ED1

Amendment 1 - Semiconductor devices - Part 9: Insulated-gate bipolar transistors (IGBTs)

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EN-FR 2001-09 N 47E/194/FDIS PDF file 495 kB
PDF file 494 kB
IEC 60747-9:1998/AMD2 ED1

Amendment to IEC 60747-9 - IGBTs

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EN U 47E/100/NP
IEC 60747-10:1991 ED2

Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits

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EN-FR U
IEC 60747-10:1991/AMD1:1995 ED2

Amendment 1 - Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits

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EN-FR U 47A(SEC.)/287/CD
IEC 60747-10:1991/AMD2:1996 ED2

Amendment No. 2 to IEC 747-10.

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EN-FR U 47/1389/FDIS
IEC 60747-10:1991/AMD3:1996 ED2

Amendment 3 - Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits

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EN-FR 1995-12 U 47(SEC.)/1151A/CD
IEC 60747-11 ED2

Systematic review to IEC 747-11 (1985)

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EN-FR U
IEC 60747-11:1985 ED1

Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices

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EN-FR U
IEC 60747-11:1985/AMD1:1991 ED1

Amendment 1 - Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices

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EN-FR U
IEC 60747-11:1985/AMD2:1996 ED1

Amendment 2 - Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices

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EN-FR 1996-06 U 47(SEC.)/1318/CDV
IEC 60747-11:1985/AMD2:1996/FRAG2 ED1

Inclusion of visual standards for discrete semiconductor devices in IEC 747-11

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  • DEL
  • Deleted items
EN U 47E(SEC.)/6/CDV
IEC 60747-11:1985/AMD2:1996/FRAG3 ED1

Amendment to IEC 747-11 to include a procedure for qualification approval of small lots

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EN-FR U 47(SEC.)/1288/CD
IEC 60747-14/FRAG2 ED1

Essential ratings and characteristics for semiconductor pressure sensor elements

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EN U 47(SEC.)/1300/CD
IEC 60747-14/FRAG3 ED1

Terminology - Concepts and letter symbols for semiconductor pressure sensors

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  • Fragment merged
EN U 47(SEC.)/1253/CD
IEC 60747-14/FRAG4 ED1

General rules and methods of measurement for mini-mold type Hall sensors

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  • Fragment merged
EN U 47(SEC.)/1277/CD
IEC 60747-14/FRAG5 ED1

Semiconductor temperature sensors, concepts and letter symbols

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EN U 47(DE)/797/NP
IEC 60747-14-1:2010 ED2

Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors

PPUB
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EN-FR 2010-01 N Webstore
IEC 60747-14-1:2000 ED1

Semiconductor devices - Part 14-1: Semiconductor sensors - General and classification

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EN 2000-10 U 47E/157/FDIS PDF file 154 kB
IEC 60747-14-2:2000 ED1

Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements

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EN U Webstore
IEC 60747-14-3:2009 ED2

Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors

PPUB
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EN-FR 2009-04 N Webstore
IEC 60747-14-3:2001 ED1

Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors

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EN 2001-07 N 47(SEC.)/1299/CD
IEC 60747-14-4:2011 ED1

Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers

PPUB
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EN-FR 2011-02 N Webstore
IEC 60747-14-5:2010 ED1

Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor

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EN-FR 2010-02 N Webstore
IEC 60747-14-6 ED1

Semiconductor devices - Part 14-6: Semiconductor sensor - Humidity sensor

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EN 2017-04 U 47E/489/CD PDF file 487 kB
IEC 60747-14-7 ED1

Semiconductor devices - Part 14-7: Semiconductor sensor - Flow meter

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EN 2017-04 U 47E/491/CD PDF file 314 kB
IEC 60747-14-8 ED1

Semiconductor devices - Part 14-8: Semiconductor sensor - Oil quality sensor

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  • Preparation of CC
EN 2017-04 U 47E/493/CD PDF file 203 kB
IEC 60747-14-10 ED1

Future IEC 60747-14-10: Semiconductor devices - Part 14-10: Semiconductor sensors - Performance evaluation methods for wearable glucose sensors

ACD
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EN 2018-12 U 47E/542/NP PDF file 2162 kB
IEC 60747-15:2010 ED2

Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices

PPUB
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  • Publication issued
EN-FR 2011-01 Y Webstore
IEC 60747-15:2003 ED1

Discrete semiconductor devices - Part 15: Isolated power semiconductor devices

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EN-FR 2003-06 N 47E/236/FDIS PDF file 874 kB
MERGED
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FR 2013-02 U
IEC 60747-16-1:2007+AMD1:2007 CSV ED1.1

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

PPUB
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  • Publication issued
EN U Webstore
IEC 60747-16-1:2001 ED1

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

PPUB
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EN-FR Y Webstore
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FR 2012-05 U
IEC 60747-16-1:2001/AMD1:2007 ED1

Amendment 1 - Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

PPUB
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EN-FR 2006-08 Y Webstore
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FR 2012-03 U
IEC 60747-16-1:2001/AMD2 ED1

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

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EN-FR 2016-10 Y 47E/500/CDV PDF file 235 kB
PDF file 234 kB
IEC 60747-16-2:2008+AMD1:2007 CSV ED1.1

Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers

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EN U Webstore
IEC 60747-16-2:2001 ED1

Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers

PPUB
  • PPUB
  • Publication issued
EN U Webstore
IEC 60747-16-2:2001/AMD1:2007 ED1

Amendment 1 - Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers

PPUB
  • PPUB
  • Publication issued
EN 2007-11 N Webstore
IEC 60747-16-3:2010+AMD1:2009 CSV ED1.1

Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters

PPUB
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  • Publication issued
EN-FR U Webstore
IEC 60747-16-3:2002 ED1

Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters

PPUB
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  • Publication issued
EN-FR Y Webstore
MERGED
  • MERGED
  • Publication merged with EN version
FR 2010-04 U
IEC 60747-16-3:2002/AMD1:2009 ED1

Amendment 1 - Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters

PPUB
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  • Publication issued
EN-FR 2009-03 Y Webstore
MERGED
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FR 2010-04 U
IEC 60747-16-3:2002/AMD2 ED1

Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters

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EN 2017-10 Y 47E/545/CDV
PDF file 207 kB
IEC 60747-16-4:2011+AMD1:2009 CSV ED1.1

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

PPUB
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EN-FR U Webstore
IEC 60747-16-4:/FRAGf+AMD1:2009 CSV ED1.1

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

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EN-FR U
IEC 60747-16-4:2004 ED1

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

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EN-FR Y Webstore
MERGED
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FR 2011-06 U
IEC 60747-16-4:2004/AMD1:2009 ED1

Amendment 1 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

PPUB
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  • Publication issued
EN-FR 2009-03 Y Webstore
MERGED
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FR 2011-06 U
IEC 60747-16-4:2004/AMD2 ED1

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

APUB
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EN 2017-10 Y 47E/546/CDV
PDF file 205 kB
IEC 60747-16-5:2013 ED1

Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators

PPUB
  • PPUB
  • Publication issued
EN-FR 2013-06 Y Webstore
IEC 60747-16-6 ED1

Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers

ACD
  • ACD
  • Approved for CD
EN 2018-06 U 47E/510/NP PDF file 476 kB
IEC 60747-16-10:2004 ED1

Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits

PPUB
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EN-FR Y Webstore
MERGED
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FR 2012-09 U
IEC 60747-17 ED1

Semiconductor devices - Magnetic and capacitive coupler for basic and reinforced isolation

CDM
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  • CD to be discussed at meeting
EN 2017-06 U 47E/536/CD PDF file 752 kB
IEC PAS 60747-17:2011 ED1

Semiconductor devices - Discrete devices - Part 17: Magnetic and capacitive coupler for basic and reinforced isolation

PPUB
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  • Publication issued
EN 2011-10 U Webstore
IEC 60747-17/FRAG1 ED1

Future IEC 60747-17 Ed. 1.0: Semiconductor devices - Discrete devices - Part 17: Magnetic and capacitive coupler for basic and reinforced isolation

DEL
  • DEL
  • Deleted items
EN U 47E/413/NP PDF file 545 kB
IEC 60747-18-1 ED1

Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensor

PCC
  • PCC
  • Preparation of CC
EN 2018-12 U 47E/554/CD PDF file 1947 kB