International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47E

Discrete semiconductor devices

 
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SC 47E Project files (181)

Project

Reference

Current

Stage

Language

Frcst

Date

CLC

Document

Reference

Downloads
PNW 47E-3-6 Ed. 1.0

Amendment to IEC 747-3 - Measuring methods, forward recovery time of a rectifier diode or a signal diode

DEL
  • DEL
  • Deleted items
E 47E(US)2
PNW 47E-29 Ed. 1.0

Revised letter symbol of integrated circuit microwave amplifiers - Amendment to IEC 748-3

DEL
  • DEL
  • Deleted items
E 47E/29
PNW 47E-45 Ed. 1.0

IEC 747 - Part 9: Insulated gate bipolar transistors (IGBTs) - Section 1: Blank detail specification for IGBTs for switching applications

DEL
  • DEL
  • Deleted items
E 47E/45
PNW 47E-82 Ed. 1.0

Amendment to IEC 747-1 - Thermal power cycle test

DEL
  • DEL
  • Deleted items
E 47E/82
PNW 47E-86 Ed. 1.0

Amendment to IEC 747-4 - Measuring methods for integrated circuit microwave frequency converters

DEL
  • DEL
  • Deleted items
E 47E/86
PNW 47E-87 Ed. 1.0

Amendment to IEC 747-4 - Terminology, essential ratings and characteristics for integrated circuit microwave frequency converters

DEL
  • DEL
  • Deleted items
E 47E/87
PNW 47E-179 Ed. 1.0

Semiconductor devices, Discrete devices, Semiconductor flow sensor

DEL
  • DEL
  • Deleted items
E 47E/179
PNW 47E-297 Ed. 1.0

Semiconductor devices - Discrete devices - Part 16-5: Microwave integrated circuits - Oscillators

DEL
  • DEL
  • Deleted items
E 47E/297
PNW 47E-299 Ed. 1.0

Semiconductor devices - Discrete Devices - Part 14-6: Semiconductor sensors - Test method of CMOS image sensor module

DEL
  • DEL
  • Deleted items
E 47E/299
PNW 47E-312 Ed. 1.0

Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators

DEL
  • DEL
  • Deleted items
E 47E/312
PNW 47E-328 Ed. 1.0

Semiconductor devices - Discrete devices - Part 14-x: Semiconductor sensors - Test method of CMOS image sensor module

DEL
  • DEL
  • Deleted items
E 47E/328
PNW 47E-329 Ed. 1.0

Semiconductor devices - Discrete devices - Part 14-7: Semiconductor sensors - Humidity

DEL
  • DEL
  • Deleted items
E 47E/329
PNW 47E-352 Ed. 1.0

Semiconductor devices - magnetic and capacitive coupler for safe isolation

DEL
  • DEL
  • Deleted items
E 47E/352
PNW 47E-462 Ed. 1.0

Future IEC 60747-16-6: Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers

DEL
  • DEL
  • Deleted items
E 47E/462
PNW 47E-494 Ed. 1.0

Future IEC 60747-14-x: Semiconductor devices - Part 14-x: Semiconductor sensor - Test method of eutectic bonding for sensors

DEL
  • DEL
  • Deleted items
E 47E/494
PNW 47E-495 Ed. 1.0

Future IEC 60747-14-x: Semiconductor devices - Part 14-x: Semiconductor sensors - Sensor media compatibility

DEL
  • DEL
  • Deleted items
E 47E/495
PNW 47E-526 Ed. 1.0

Future IEC 60747-14-10: Semiconductor devices - Part 14-10: Semiconductor sensors - Test and evaluation methods for implantable glucose sensor

DEL
  • DEL
  • Deleted items
E 47E/526
PNW 47E-550 Ed. 1.0

Future IEC 60747-14-11: Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature

PNW
  • PNW
  • Proposed New Work
E 47E/550
PNW 47E-555 Ed. 1.0

Future IEC 60747-18-2: Semiconductor devices - Part 18-2: Semiconductor bio sensors - Evaluation process of lens-free CMOS photonic array sensor package module

PNW
  • PNW
  • Proposed New Work
E 47E/555
IEC 60747-2 Ed. 1.0

Semiconductor devices. Discrete devices. Part 2: Rectifier diodes

DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60747-2 Ed. 2.0

Semiconductor devices - Discrete devices and integrated circuits - Part 2: Rectifier diodes

DELPUB
  • DELPUB
  • Deleted Publication
B 2000-02
IEC 60747-2 Ed. 3.0

Semiconductor devices - Part 2: Discrete devices - Rectifier diodes

PPUB
  • PPUB
  • Publication issued
B 2016-03 no Webstore
DELPUB
  • DELPUB
  • Deleted Publication
B
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60747-2 am3 f2 Ed. 1.0

Rectifier diodes, terms related to ratings and characteristics, to be included in IEC 747-2

MERGED
  • MERGED
  • Merged project
E 47(DE)795
IEC 60747-2 am3 f3 Ed. 1.0

Amendment to IEC 747-2 - Essential ratings and characteristics: New Sub-clauses 7.10 and 7.11

MERGED
  • MERGED
  • Merged project
E 47(DE)798
IEC 60747-2-1 Ed. 1.0

Semiconductor devices. Discrete devices - Part 2: Rectifier diodes - Section One: Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A

WPUB
  • WPUB
  • Publication withdrawn
B
IEC 60747-2-1 Ed. 2.0

Systematic review of IEC 747-2-1 (1989)

DEL
  • DEL
  • Deleted items
B
IEC 60747-2-2 Ed. 1.0

Semiconductor devices - Discrete devices - Part 2: Rectifier diodes - Section 2: Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A

WPUB
  • WPUB
  • Publication withdrawn
B
IEC 60747-3 Ed. 1.0

Semiconductor devices. Discrete devices. Part 3: Signal (including switching) and regulator diodes

DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60747-3 Ed. 2.0

Semiconductor devices - Part 3: Discrete devices: Signal, switching and regulator diodes

PPUB
  • PPUB
  • Publication issued
B 2013-07 no Webstore
DELPUB
  • DELPUB
  • Deleted Publication
B
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60747-3-1 Ed. 1.0

Semiconductor devices. Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section One: Blank detail specification for signal diodes, switching diodes and controlled-avalanche diodes

WPUB
  • WPUB
  • Publication withdrawn
B
IEC 60747-3-1 Ed. 2.0

Systematic review of IEC 747-3-1 (1986)

DEL
  • DEL
  • Deleted items
B
IEC 60747-3-2 Ed. 1.0

Semiconductor devices. Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section Two: Blank detail specification for voltage-regulator diodes and voltage-reference diodes,excluding temperature-compensated precision reference diodes

WPUB
  • WPUB
  • Publication withdrawn
B
IEC 60747-3-2 Ed. 2.0

Systematic review of IEC 747-3-2 (1986)

DEL
  • DEL
  • Deleted items
B
IEC 60747-4 Ed. 1.0

Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors

DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60747-4 Ed. 1.2

Semiconductor devices - Discrete devices - Part 4: Microwave devices

DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60747-4 Ed. 2.0

Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors

PPUB
  • PPUB
  • Publication issued
B 2007-09 no Webstore
IEC 60747-4 f2 Ed. 2.0

Terminology and letter symbols for integrated circuit microwave frequency prescalers to be included in IEC 747-4

MERGED
  • MERGED
  • Merged project
E 47E/31
IEC 60747-4 f3 Ed. 2.0

Measuring methods for integrated circuit microwave frequency prescalers to be included in IEC 747-4

MERGED
  • MERGED
  • Merged project
E 47E/32
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60747-4 am1 Ed. 2.0

Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors

BPUB
  • BPUB
  • Publication being printed
B 2016-10 no
DELPUB
  • DELPUB
  • Deleted Publication
E 1999-04
IEC 60747-4 am2 f2 Ed. 1.0

Essential ratings and characteristics for integrated circuit microwave amplifiers, to be included in IEC 747-4

MERGED
  • MERGED
  • Merged project
E 47E(Sec.)2
IEC 60747-4 am2 f3 Ed. 1.0

Additional essential ratings and characteristics for microwave field effect transistors into IEC 747-4

MERGED
  • MERGED
  • Merged project
B
IEC 60747-4 am2 f4 Ed. 1.0

Revised and additional measuring methods for microwave field effect transistors - Amendment to Document 47(C.O.)1261

MERGED
  • MERGED
  • Merged project
B 47E(Sec.)4
IEC 60747-4 am2 f6 Ed. 1.0

Measuring methods of integrated circuit microwave amplifiers, to be included in IEC 747-4

MERGED
  • MERGED
  • Merged project
E
IEC 60747-4-1 Ed. 1.0

Semiconductor devices - Discrete devices - Part 4-1: Microwave diodes and transistors - Microwave field effect transistors - Blank detail specification

WPUB
  • WPUB
  • Publication withdrawn
E 1996-12
IEC 60747-4-2 Ed. 1.0

Semiconductor devices - Discrete devices - Part 4-2: Microwave diodes and transistors - Integrated-circuit microwave amplifiers - Blank detail specification

WPUB
  • WPUB
  • Publication withdrawn
E 1998-10
DEL 60747-4-4 Ed. 1.0

Semiconductor devices - Generic specification for microwave field effect transistors

DEL
  • DEL
  • Deleted items
E 47(FR)864
DEL 60747-5-1 Ed. 1.0

Blank detail specification for optocouplers/photocouplers (with output transistor)

DEL
  • DEL
  • Deleted items
E
IEC 60747-5-1 Ed. 1.0

Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General

DELPUB
  • DELPUB
  • Deleted Publication
B 1997-08
IEC 60747-5-1 Ed. 1.2

Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General

DELPUB
  • DELPUB
  • Deleted Publication
B
DELPUB
  • DELPUB
  • Deleted Publication
B 2001-03
DELPUB
  • DELPUB
  • Deleted Publication
B 2002-04 yes
IEC 60747-5-2 Ed. 1.0

Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics

DELPUB
  • DELPUB
  • Deleted Publication
B 1997-08
IEC 60747-5-2 Ed. 1.1

Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics

DELPUB
  • DELPUB
  • Deleted Publication
B
DELPUB
  • DELPUB
  • Deleted Publication
B 2002-04 yes
IEC 60747-5-3 Ed. 1.0

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

DELPUB
  • DELPUB
  • Deleted Publication
B 1997-08
IEC 60747-5-3 Ed. 1.1

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

DELPUB
  • DELPUB
  • Deleted Publication
B
DELPUB
  • DELPUB
  • Deleted Publication
B 2002-04 yes
IEC 60747-5-4 Ed. 1.0

Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

PPUB
  • PPUB
  • Publication issued
B no Webstore
IEC 60747-5-5 Ed. 1.0

Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers

PPUB
  • PPUB
  • Publication issued
B 2007-10 no Webstore
IEC 60747-5-5 Ed. 2.0

Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers

AMW
  • AMW
  • Approved Maintenance Work
E 2017-12 yes 47E/520
IEC 60747-5-5 am1 Ed. 1.0

Amendment 1 - Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers

PPUB
  • PPUB
  • Publication issued
B 2013-05 no Webstore
IEC 60747-5-6 Ed. 1.0

Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

PPUB
  • PPUB
  • Publication issued
B 2016-03 no Webstore
IEC 60747-5-7 Ed. 1.0

Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors

PPUB
  • PPUB
  • Publication issued
B 2016-02 no Webstore
IEC 60747-6 Ed. 1.0

Semiconductor devices. Discrete devices. Part 6: Thyristors

DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60747-6 Ed. 2.0

Semiconductor devices - Part 6: Thyristors

DELPUB
  • DELPUB
  • Deleted Publication
B 2000-09
IEC 60747-6 Ed. 3.0

Semiconductor devices - Part 6: Discrete devices - Thyristors

PPUB
  • PPUB
  • Publication issued
B 2016-04 no Webstore
DELPUB
  • DELPUB
  • Deleted Publication
B
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60747-6 am3 f1 Ed. 1.0

Revision of Clause 2, Thermal measurements of IEC 747-6, Chapter IV

MERGED
  • MERGED
  • Merged project
B
IEC 60747-6 am3 f2 Ed. 1.0

Addition to Document 47(Sec.)1150: Revision of Clause 2, Thermal measurements of IEC 747-6, Chapter IV

DEL
  • DEL
  • Deleted items
E
IEC 60747-6 am3 f4 Ed. 1.0

Measuring the turn-off behaviour of GTO-thyristors

MERGED
  • MERGED
  • Merged project
B
IEC 60747-6-1 Ed. 1.0

Semiconductor devices. Discrete devices - Part 6: Thyristors - Section One: Blank detail specification for reverse blocking triode thyristors, ambient and case-rated, up to 100 A

WPUB
  • WPUB
  • Publication withdrawn
B
IEC 60747-6-1 Ed. 2.0

Systematic review of IEC 747-6-1 (1989)

DEL
  • DEL
  • Deleted items
B
IEC 60747-6-2 Ed. 1.0

Semiconductor devices. Discrete devices - Part 6: Thyristors - Section Two: Blank detail specification for bidirectional triode thyristors (triacs), ambient or case-rated, up to 100 A

WPUB
  • WPUB
  • Publication withdrawn
B
IEC 60747-6-2 Ed. 2.0

Systematic review of IEC 747-6-2 (1991)

DEL
  • DEL
  • Deleted items
B
IEC 60747-6-3 Ed. 1.0

Semiconductor devices - Discrete devices - Part 6: Thyristors - Section Three: Blank detail specification for reverse blocking triode thyristors, ambient and case-rated, for currents greater than 100 A

WPUB
  • WPUB
  • Publication withdrawn
B
IEC 60747-7 Ed. 1.0

Semiconductor devices. Discrete devices. Part 7: Bipolar transistors

DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60747-7 Ed. 2.0

Semiconductor discrete devices and integrated circuits - Part 7: Bipolar transistors

DELPUB
  • DELPUB
  • Deleted Publication
B 2000-07
IEC 60747-7 Ed. 3.0

Semiconductor devices - Discrete devices - Part 7: Bipolar transistors

PPUB
  • PPUB
  • Publication issued
B 2011-01 no Webstore
DELPUB
  • DELPUB
  • Deleted Publication
B
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60747-7 am3 f1 Ed. 1.0

New concepts and letter symbols for insulated-gate bipolar transistors and (true) bipolar transistors, adaptations in existing standards (IGBT'S)

MERGED
  • MERGED
  • Merged project
B
IEC 60747-7 am3 f4 Ed. 1.0

Amendment to the scope of IEC 747-7

MERGED
  • MERGED
  • Merged project
E 47(DE)796
IEC 60747-7 am3 f6 Ed. 1.0

Supplement to IEC 747-7 - Pulse methods for collector-base cut-off current and emitter-base cut-off current

MERGED
  • MERGED
  • Merged project
E 47E(Sec.)5
IEC 60747-7 am3 f7 Ed. 1.0

Supplement to Chapter IV of IEC 747-7 - Measuring method for noise figure and power gain of bipolar transistors

DEL
  • DEL
  • Deleted items
E
IEC 60747-7 am3 f8 Ed. 1.0

Supplement to Chapter IV of IEC 747-7 - Measuring method for R.F. output power gain of a bipolar power transistors

DEL
  • DEL
  • Deleted items
E
IEC 60747-7 am3 f9 Ed. 1.0

Supplement to Chapter IV of IEC 747-7 - Measuring method for mixer power gain of a bipolar transistors

DEL
  • DEL
  • Deleted items
E
IEC 60747-7-1 Ed. 1.0

Semiconductor devices. Discrete devices - Part 7: Bipolar transistors - Section One: Blank detail specification for ambient-rated bipolar transistors for low and high-frequency amplification

WPUB
  • WPUB
  • Publication withdrawn
B
IEC 60747-7-1 Ed. 2.0

Systematic review of IEC 747-7-1 (1989)

DEL
  • DEL
  • Deleted items
B
IEC 60747-7-2 Ed. 1.0

Semiconductor devices. Discrete devices - Part 7: Bipolar transistors - Section Two: Blank detail specification for case-rated bipolar transistors for low-frequency amplification

WPUB
  • WPUB
  • Publication withdrawn
B
IEC 60747-7-2 Ed. 2.0

Systematic review of IEC 747-7-2 (1989)

DEL
  • DEL
  • Deleted items
B
IEC 60747-7-3 Ed. 1.0

Semiconductor devices. Discrete devices - Part 7: Bipolar transistors - Section three: Blank detail specification for bipolar transistors for switching applications

WPUB
  • WPUB
  • Publication withdrawn
B
IEC 60747-7-3 Ed. 2.0

Systematic review of IEC 747-7-3 (1991)

DEL
  • DEL
  • Deleted items
B
IEC 60747-7-4 Ed. 1.0

Semiconductor devices. Discrete devices - Part 7: Bipolar transistors - Section Four: Blank detail specification for case-rated bipolar transistors for high-frequency amplification

WPUB
  • WPUB
  • Publication withdrawn
B
IEC 60747-7-4 Ed. 2.0

Systematic review of IEC 747-7-4 (1991)

DEL
  • DEL
  • Deleted items
B
IEC 60747-7-5 Ed. 1.0

Semiconductor devices - Discrete devices - Part 7-5: Bipolar transistors for power switching applications

DELPUB
  • DELPUB
  • Deleted Publication
E 2005-08 no
IEC 60747-8 Ed. 1.0

Semiconductor devices. Discrete devices. Part 8: Field-effect transistors

DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60747-8 Ed. 2.0

Semiconductor devices - Part 8: Field-effect transistors

DELPUB
  • DELPUB
  • Deleted Publication
B 2000-07
IEC 60747-8 Ed. 3.0

Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

PPUB
  • PPUB
  • Publication issued
B 2010-12 no Webstore
DELPUB
  • DELPUB
  • Deleted Publication
B
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60747-8 am3 f2 Ed. 1.0

Additional ratings and characteristics and amendments in the measuring methods for power switching field-effect transistors, to be included in IEC 747-8

MERGED
  • MERGED
  • Merged project
B 47(Sec.)1285
IEC 60747-8 am3 f3 Ed. 1.0

Additional concepts for field-effect transistors in IEC 747-8

MERGED
  • MERGED
  • Merged project
E 47(Sec.)1312
IEC 60747-8 am3 f4 Ed. 1.0

Terminology - Revised and new concepts for field-effect transistors in IEC 747-1 and 747-8

MERGED
  • MERGED
  • Merged project
B
IEC 60747-8 am3 f5 Ed. 1.0

Transfer of terms and letter symbols applicable to field-effect transistors contained in IEC 747-7, Sub-clauses 6.4.2.2, 6.4.2.3 to IEC 747-8, Sub-clause 4.3.5

MERGED
  • MERGED
  • Merged project
E 47(U.K.)1114
IEC 60747-8-1 Ed. 1.0

Semiconductor devices. Discrete devices - Part 8: Field-effect transistors - Section One: Blank detail specification for single-gate field-effect transistors up to 5 W and 1 GHz

WPUB
  • WPUB
  • Publication withdrawn
B
IEC 60747-8-1 Ed. 2.0

Systematic review of IEC 747-8-1 (1987)

DEL
  • DEL
  • Deleted items
B
IEC 60747-8-2 Ed. 1.0

Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section two: Blank detail specification for field-effect transistors for case-rated power amplifier applications

WPUB
  • WPUB
  • Publication withdrawn
B
IEC 60747-8-3 Ed. 1.0

Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section 3: Blank detail specification for case-rated field effect transistors for switching applications

WPUB
  • WPUB
  • Publication withdrawn
B 1994-08 47(C.O.)1350
IEC 60747-8-4 Ed. 1.0

Discrete semiconductor devices - Part 8-4: Metal-oxide-semiconductor field-effect transistors (MOSFETs) for power switching applications

WPUB
  • WPUB
  • Publication withdrawn
B 2004-09 no
IEC 60747-9 Ed. 1.0

Surface mounting technology - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)

DELPUB
  • DELPUB
  • Deleted Publication
B 1998-08
IEC 60747-9 Ed. 1.1

Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)

DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60747-9 Ed. 2.0

Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)

PPUB
  • PPUB
  • Publication issued
B 2007-10 no Webstore
IEC 60747-9 Ed. 3.0

Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)

1CD
  • 1CD
  • 1st Committee Draft
E 2018-12 no
IEC 60747-9 f2 Ed. 1.0

Discrete devices - Terminology - Concepts related to insulated-gate bipolar transistors, IGBT's

MERGED
  • MERGED
  • Merged project
B 47(C.O.)1339
DELPUB
  • DELPUB
  • Deleted Publication
B 2001-09 no
IEC 60747-9 am2 Ed. 1.0

Amendment to IEC 60747-9 - IGBTs

DEL
  • DEL
  • Deleted items
E 47E/100
IEC 60747-10 Ed. 2.0

Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits

WPUB
  • WPUB
  • Publication withdrawn
B
DELPUB
  • DELPUB
  • Deleted Publication
B
DELPUB
  • DELPUB
  • Deleted Publication
B
WPUB
  • WPUB
  • Publication withdrawn
B 1995-12
IEC 60747-11 Ed. 1.0

Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices

WPUB
  • WPUB
  • Publication withdrawn
B
IEC 60747-11 Ed. 2.0

Systematic review to IEC 747-11 (1985)

DEL
  • DEL
  • Deleted items
B
WPUB
  • WPUB
  • Publication withdrawn
B
WPUB
  • WPUB
  • Publication withdrawn
B 1996-06
IEC 60747-11 am2 f2 Ed. 1.0

Inclusion of visual standards for discrete semiconductor devices in IEC 747-11

DEL
  • DEL
  • Deleted items
E
IEC 60747-11 am2 f3 Ed. 1.0

Amendment to IEC 747-11 to include a procedure for qualification approval of small lots

MERGED
  • MERGED
  • Merged project
B
IEC 60747-14 f2 Ed. 1.0

Essential ratings and characteristics for semiconductor pressure sensor elements

MERGED
  • MERGED
  • Merged project
E
IEC 60747-14 f3 Ed. 1.0

Terminology - Concepts and letter symbols for semiconductor pressure sensors

MERGED
  • MERGED
  • Merged project
E 47(Sec.)1253
IEC 60747-14 f4 Ed. 1.0

General rules and methods of measurement for mini-mold type Hall sensors

MERGED
  • MERGED
  • Merged project
E
IEC 60747-14 f5 Ed. 1.0

Semiconductor temperature sensors, concepts and letter symbols

MERGED
  • MERGED
  • Merged project
E 47(DE)797
IEC 60747-14-1 Ed. 1.0

Semiconductor devices - Part 14-1: Semiconductor sensors - General and classification

DELPUB
  • DELPUB
  • Deleted Publication
E 2000-10
IEC 60747-14-1 Ed. 2.0

Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors

PPUB
  • PPUB
  • Publication issued
B 2010-01 no Webstore
IEC 60747-14-2 Ed. 1.0

Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements

PPUB
  • PPUB
  • Publication issued
E Webstore
IEC 60747-14-3 Ed. 1.0

Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors

DELPUB
  • DELPUB
  • Deleted Publication
E 2001-07 no
IEC 60747-14-3 Ed. 2.0

Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors

PPUB
  • PPUB
  • Publication issued
B 2009-04 no Webstore
IEC 60747-14-4 Ed. 1.0

Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers

PPUB
  • PPUB
  • Publication issued
B 2011-02 no Webstore
IEC 60747-14-5 Ed. 1.0

Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor

PPUB
  • PPUB
  • Publication issued
B 2010-02 no Webstore
IEC 60747-14-6 Ed. 1.0

Semiconductor devices - Part 14-6: Semiconductor sensor - Humidity sensor

3CD
  • 3CD
  • 3rd Committee Draft
E 2017-04
IEC 60747-14-7 Ed. 1.0

Semiconductor devices - Part 14-7: Semiconductor sensor - Flow meter

3CD
  • 3CD
  • 3rd Committee Draft
E 2017-04
IEC 60747-14-8 Ed. 1.0

Semiconductor devices - Part 14-8: Semiconductor sensor - Oil quality sensor

3CD
  • 3CD
  • 3rd Committee Draft
E 2017-04
IEC 60747-14-10 Ed. 1.0

Future IEC 60747-14-10: Semiconductor devices - Part 14-10: Semiconductor sensors - Performance evaluation methods for wearable glucose sensors

ANW
  • ANW
  • Approved New Work
E 2018-12 47E/542
IEC 60747-15 Ed. 1.0

Discrete semiconductor devices - Part 15: Isolated power semiconductor devices

DELPUB
  • DELPUB
  • Deleted Publication
B 2003-06 no
IEC 60747-15 Ed. 2.0

Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices

PPUB
  • PPUB
  • Publication issued
B 2011-01 yes Webstore
IEC 60747-15 fF Ed. 1.0

Discrete semiconductor devices - Part 15: Isolated power semiconductor devices

MERGED
  • MERGED
  • Merged project
F 2013-02
IEC 60747-16-1 Ed. 1.0

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

PPUB
  • PPUB
  • Publication issued
B yes Webstore
IEC 60747-16-1 Ed. 1.1

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

PPUB
  • PPUB
  • Publication issued
E Webstore
IEC 60747-16-1 fF Ed. 1.0

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

MERGED
  • MERGED
  • Merged project
F 2012-05
IEC 60747-16-1 am1 Ed. 1.0

Amendment 1 - Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

PPUB
  • PPUB
  • Publication issued
B 2006-08 yes Webstore
IEC 60747-16-1 am1 fF Ed. 1.0

Amendment 1 - Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

MERGED
  • MERGED
  • Merged project
F 2012-03
IEC 60747-16-1 am2 Ed. 1.0

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

BPUB
  • BPUB
  • Publication being printed
B 2016-10 yes
IEC 60747-16-2 Ed. 1.0

Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers

PPUB
  • PPUB
  • Publication issued
E Webstore
IEC 60747-16-2 Ed. 1.1

Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers

PPUB
  • PPUB
  • Publication issued
E Webstore
IEC 60747-16-2 am1 Ed. 1.0

Amendment 1 - Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers

PPUB
  • PPUB
  • Publication issued
E 2007-11 no Webstore
IEC 60747-16-3 Ed. 1.0

Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters

PPUB
  • PPUB
  • Publication issued
B yes Webstore
IEC 60747-16-3 Ed. 1.1

Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters

PPUB
  • PPUB
  • Publication issued
B Webstore
IEC 60747-16-3 fF Ed. 1.0

Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters

MERGED
  • MERGED
  • Merged project
F 2010-04
IEC 60747-16-3 am1 Ed. 1.0

Amendment 1 - Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters

PPUB
  • PPUB
  • Publication issued
B 2009-03 yes Webstore
IEC 60747-16-3 am1 fF Ed. 1.0

Amendment 1 - Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters

MERGED
  • MERGED
  • Merged project
F 2010-04
IEC 60747-16-3 am2 Ed. 1.0

Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters

CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote
E 2017-09 yes
IEC 60747-16-4 Ed. 1.0

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

PPUB
  • PPUB
  • Publication issued
B yes Webstore
IEC 60747-16-4 Ed. 1.1

Semiconductor - devices - Part 16-4: Microwave integrated circuits - Switches

PPUB
  • PPUB
  • Publication issued
B Webstore
IEC 60747-16-4 fF Ed. 1.0

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

MERGED
  • MERGED
  • Merged project
F 2011-06
IEC 60747-16-4 fF Ed. 1.1

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

MERGED
  • MERGED
  • Merged project
B
IEC 60747-16-4 am1 Ed. 1.0

Amendment 1 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

PPUB
  • PPUB
  • Publication issued
B 2009-03 yes Webstore
IEC 60747-16-4 am1 fF Ed. 1.0

Amendment 1 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

MERGED
  • MERGED
  • Merged project
F 2011-06
IEC 60747-16-4 am2 Ed. 1.0

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote
E 2017-09 yes
IEC 60747-16-5 Ed. 1.0

Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators

PPUB
  • PPUB
  • Publication issued
B 2013-06 yes Webstore
IEC 60747-16-6 Ed. 1.0

Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers

ANW
  • ANW
  • Approved New Work
E 2018-06 47E/510
IEC 60747-16-10 Ed. 1.0

Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits

PPUB
  • PPUB
  • Publication issued
B yes Webstore
IEC 60747-16-10 fF Ed. 1.0

Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits

MERGED
  • MERGED
  • Merged project
F 2012-09
IEC 60747-17 Ed. 1.0

Semiconductor devices - Magnetic and capacitive coupler for basic and reinforced isolation

CDM
  • CDM
  • Committee Draft to be discussed at Meeting
E 2017-06
IEC 60747-17 f1 Ed. 1.0

Future IEC 60747-17 Ed. 1.0: Semiconductor devices - Discrete devices - Part 17: Magnetic and capacitive coupler for basic and reinforced isolation

DEL
  • DEL
  • Deleted items
E 47E/413
IEC/PAS 60747-17 Ed. 1.0

Semiconductor devices - Discrete devices - Part 17: Magnetic and capacitive coupler for basic and reinforced isolation

PPUB
  • PPUB
  • Publication issued
E 2011-10 Webstore
IEC 60747-18-1 Ed. 1.0

Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensor

1CD
  • 1CD
  • 1st Committee Draft
E 2018-12