International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47A

Integrated circuits

 
export to xls file

SC 47A Project files (154)

Project

Reference

Current

Stage

Language

Frcst

Date

CLC

Document

Reference

Downloads
PWI 47A-1 ED1

IEC 62433-3 Ed.1: Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions

DEL
  • DEL
  • Deleted items
EN U
PWI 47A-2 ED1

IEC 62433-4 Ed.1: ICIM-CI, Integrated Circuit Immunity Model, Conducted Immunity

DEL
  • DEL
  • Deleted items
EN U
PWI 47A-3 ED1

IEC 62228-2 Ed.1: Integrated circuits - EMC Evaluation of LIN transceivers

DEL
  • DEL
  • Deleted items
EN U
PNW 47A-474 ED1

Semiconductor devices - Integrated circuits - Part 1: General

DEL
  • DEL
  • Deleted items
EN U 47A/474/NP
PNW 47A-537 ED1

Integrated film circuits - Materials - Part 1: Substrates

DEL
  • DEL
  • Deleted items
EN U 47A/537/NP PDF file 50 kB
PNW 47A-538 ED1

Integrated film circuits - Materials - Part 2: Methods for the assessment of conductive pastes

DEL
  • DEL
  • Deleted items
EN U 47A/538/NP PDF file 169 kB
PNW 47A-539 ED1

Integrated film circuits - Materials - Part 3: Methods for the assessment of dielectric pastes

DEL
  • DEL
  • Deleted items
EN U 47A/539/NP PDF file 56 kB
PNW 47A-540 ED1

Integrated film circuits - Materials - Part 4: Methods for judgement of thick film resistor compositions

DEL
  • DEL
  • Deleted items
EN U 47A/540/NP PDF file 58 kB
PNW 47A-786 ED1

Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method

DEL
  • DEL
  • Deleted items
EN U 47A/786/NP PDF file 240 kB
PNW 47A-787 ED1

Semiconductor devices - Integrated circuits - Part 2-xx: Digital integrated circuits - Unified wide power supply voltage range CMOS DC interface standard for non-terminated digital integrated circuits

DEL
  • DEL
  • Deleted items
EN U 47A/787/NP PDF file 228 kB
PNW TS 47A-789 ED1

Integrated circuits - Measurement of electromagnetic immunity - Part 6: Local Injection Horn Antenna (LIHA) method

CAN
  • CAN
  • Draft Cancelled
EN U 47A/789/NP PDF file 1484 kB
PNW 47A-935 ED1

Integrated circuits - Fine alignment of stacked dies in three dimensional integrated circuits

DEL
  • DEL
  • Deleted items
EN U 47A/935/NP PDF file 774 kB
PNW 47A-878A ED1

Future IEC 62433-4: EMC IC modelling Part 4: Models of Integrated Circuits for EMI behavioural simulation, Conducted Immunity modelling (ICIM-CI)

DEL
  • DEL
  • Deleted items
EN U 47A/878A/NP PDF file 1132 kB
IEC 60148 ED3

Systematic review of IEC 148 (1969)

DEL
  • DEL
  • Deleted items
EN-FR U
IEC 60148:1969 ED2

Letter symbols for semiconductor devices and integrated microcircuits

WPUB
  • WPUB
  • Publication Withdrawn
EN-FR U
IEC 60748-1:2002 ED2

Semiconductor devices - Integrated circuits - Part 1: General

PPUB
  • PPUB
  • Publication issued
EN-FR N Webstore
IEC 60748-1:1984 ED1

Semiconductor devices. Integrated circuits. Part 1: General

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR U
IEC 60748-1:1984/AMD1:1991 ED1

Amendment 1 - Semiconductor devices. Integrated circuits. Part 1: General

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR U
IEC 60748-1:1984/AMD2:1993 ED1

Amendment 2 - Semiconductor devices. Integrated circuits. Part 1: General

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR U
IEC 60748-1:1984/AMD3:1995 ED1

Amendment 3 - Semiconductor devices. Integrated circuits. Part 1: General

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR U 47A(SEC.)/314/CD
IEC 60748-1:1984/AMD4/FRAG7 ED1

Amendment to the definition of hybrid integrated circuits, in IEC 748-1

DEL
  • DEL
  • Deleted items
EN U 47/1400/CD
IEC 60748-2:1997 ED2

Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-2:1985 ED1

Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR U
IEC 60748-2:1985/AMD2:1993 ED1

Amendment 2 - Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR U
IEC 60748-2:1985/AMD4/FRAG6 ED1

Classification and definition for Programme Logic Devices (PLDs), to be added to IEC 748-1

MERGED
  • MERGED
  • Fragment merged
EN-FR U 47A(SEC.)/353/CDV
IEC 60748-2-1 ED2

Systematic review of IEC 748-2-1 (1991)

DEL
  • DEL
  • Deleted items
EN-FR U
IEC 60748-2-1:1991 ED1

Semiconductor devices - Integrated circuits - Part 2-1: Digital integrated circuits - Blank detail specification for bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-2-2 ED2

Systematic review of IEC 60748-2-2 (1992)

DEL
  • DEL
  • Deleted items
EN-FR U
IEC 60748-2-2:1992 ED1

Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section two: Family specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-2-2:1992/AMD1:1994 ED1

Amendment 1 - Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section two: Family specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-2-3 ED2

Systematic review of IEC 60748-2-3 (1992)

DEL
  • DEL
  • Deleted items
EN-FR U
IEC 60748-2-3:1992 ED1

Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section three: Blank detail specification for HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU)

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-2-4 ED2

Systematic review of IEC 60748-2-4 (1992)

DEL
  • DEL
  • Deleted items
EN-FR U
IEC 60748-2-4:1992 ED1

Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section four: Family specification for complementary MOS digital integrated circuits, series 4000 B and 4000 UB

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-2-5 ED2

Systematic review of IEC 60748-2-5 (1992)

DEL
  • DEL
  • Deleted items
EN-FR U
IEC 60748-2-5:1992 ED1

Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section five: Blank detail specification for complementary MOS digital integrated circuits (series 4000 B and 4000 UB)

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-2-6 ED2

Systematic review of IEC 60748-2-6 (1991)

DEL
  • DEL
  • Deleted items
EN-FR U
IEC 60748-2-6:1991 ED1

Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section Six: Blank detail specification for microprocessor integrated circuits

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-2-7 ED2

Systematic review of IEC 748-2-7 (1992)

DEL
  • DEL
  • Deleted items
EN-FR U
IEC 60748-2-7:1992 ED1

Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section seven: Blank detail specification for integrated circuit fusible-link programmable bipolar read-only memories

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-2-8:1993 ED1

Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section Eight: Blank detail specification for integrated circuit static read/write memories

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-2-9:1994 ED1

Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 9: Blank detail specification for MOS ultraviolet light erasable electrically programmable read-only memories

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-2-10:1994 ED1

Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 10: Blank detail specification for integrated circuit dynamic read/write memories

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-2-11:1999 ED1

Semiconductor devices - Integrated circuits - Part 2-11: Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-2-12:2001 ED1

Semiconductor devices - Integrated circuits - part2-12: Digital integrated circuits - Blank detail specification for programmable logic devices (PLDs)

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-2-20:2008 ED2

Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits

PPUB
  • PPUB
  • Publication issued
EN-FR 2008-06 N Webstore
IEC 60748-2-20:2000 ED1

Semiconductor devices - Integrated circuits Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR 2000-10 U 47A/591/FDIS PDF file 213 kB
IEC 60748-3 ED2

Systematic review of IEC 748-3 (1986)

DEL
  • DEL
  • Deleted items
EN-FR U
IEC 60748-3:1986 ED1

Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-3:1986/AMD1:1991 ED1

Amendment 1 - Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-3:1986/AMD2:1994 ED1

Amendment 2 - Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-3-1 ED2

Systematic review of IEC 748-3-1 (1991)

DEL
  • DEL
  • Deleted items
EN-FR U
IEC 60748-3-1:1991 ED1

Semiconductor devices. Integrated circuits - Part 3: Analogue integrated circuits - Section one: Blank detail specification for monolithic integrated operational amplifiers

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-4:1997 ED2

Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-4:1997/FRAG1 ED2

Interface integrated circuits - Measuring methods of linear ADC and DAC

MERGED
  • MERGED
  • Fragment merged
EN-FR U 47A(SEC.)/300/CDV
IEC 60748-4:1997/FRAG3 ED2

Interface integrated circuits - Amendments and additions to the IEC 748-4, Chapter II, Clause 2 for Category II

MERGED
  • MERGED
  • Fragment merged
EN-FR U 47A(SEC.)/333/CDV
IEC 60748-4:1997/FRAG4 ED2

Letter symbols for use with ISDN - Oriented modular interface circuits (Revision of IEC 748-4)

MERGED
  • MERGED
  • Fragment merged
EN U 47A(U.K.)/244/NP
IEC 60748-4:1997/FRAG5 ED2

Revision of IEC 748-4 - Interface integrated circuits - Measuring methods of linear ADC and DAC

MERGED
  • MERGED
  • Fragment merged
EN U 47A(U.K.)/245/NP
IEC 60748-4:1997/FRAG6 ED2

Amendment to 47A(Sec.)300 - Measuring methods of maximum operating frequency of ADC

MERGED
  • MERGED
  • Fragment merged
EN U 47A(JP)/211/NP
IEC 60748-4:1987 ED1

Semiconductor devices. Integrated circuits. Part 4: Interface integrated circuits.

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR U
IEC 60748-4:1987/AMD1:1991 ED1

Amendment 1 - Semiconductor devices. Integrated circuits. Part 4: Interface integrated circuits.

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR U
IEC 60748-4:1987/AMD2:1994 ED1

Amendment 2 - Semiconductor devices. Integrated circuits. Part 4: Interface integrated circuits.

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR U
IEC 60748-4-1:1993 ED1

Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 1: Blank detail specification for linear digital-to-analogue converters (DAC)

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-4-2:1993 ED1

Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 2: Blank detail specification for linear analogue-to-digital converters (ADC)

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-4-3:2006 ED1

Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)

PPUB
  • PPUB
  • Publication issued
EN 2006-08 N Webstore
IEC 60748-5:1997 ED1

Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits

PPUB
  • PPUB
  • Publication issued
EN-FR Y Webstore
IEC 60748-5:1997/FRAG1 ED1

Classification of integrated circuits - New IEC 748-5

MERGED
  • MERGED
  • Fragment merged
EN-FR U 47A(SEC.)/352/CDV
IEC 60748-5:1997/FRAG3 ED1

Amendment to IEC 748-5 - Chapter V: Acceptance and reliability

DEL
  • DEL
  • Deleted items
EN-FR U 47A/403/CDV
IEC 60748-11:1990 ED1

Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-11:1990/AMD1:1995 ED1

Amendment 1 - Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-11:1990/AMD2:1999 ED1

Amendment 2 - Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-11-1 ED2

Systematic review of IEC 60748-11-1 (1992)

DEL
  • DEL
  • Deleted items
EN-FR U
IEC 60748-11-1:1992 ED1

Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-20 ED2

Systematic review of IEC 748-20 (1988)

DEL
  • DEL
  • Deleted items
EN-FR U
IEC 60748-20:1988 ED1

Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-20:1988/AMD1:1995 ED1

Amendment 1 - Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
MERGED
  • MERGED
  • Fragment merged
EN-FR U 47A(SEC.)/350/CDV
IEC 60748-20-1:1994 ED1

Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-21:1997 ED2

Semiconductor devices - Integrated circuits - Part 21: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-21:1991 ED1

Semiconductor devices. Integrated circuits - Part 21: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedure.

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR U
IEC 60748-21-1:1997 ED2

Semiconductor devices - Integrated circuits - Part 21-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-21-1:1991 ED1

Semiconductor devices - Integrated circuits - Part 21; Section One: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedure.

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR U
IEC 60748-22:1997 ED2

Semiconductor devices - Integrated circuits - Part 22: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-22:1992 ED1

Semiconductor devices. Integrated circuits - Part 22: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures.

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR U
IEC 60748-22-1:1997 ED2

Semiconductor devices - Integrated circuits - Part 22-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-22-1:1991 ED1

Semiconductor devices. Integrated circuits - Part 22 - Section One: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures.

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR U
IEC 60748-23-1:2002 ED1

Semiconductor devices - Integrated circuits - Part 23-1: Hybrid integrated circuits and film structures - Manufacturing line certification - Generic specification

PPUB
  • PPUB
  • Publication issued
EN-FR N Webstore
IEC 60748-23-2:2002 ED1

Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests

PPUB
  • PPUB
  • Publication issued
EN N Webstore
IEC 60748-23-3:2002 ED1

Semiconductor devices - Integrated circuits - Part 23-3: Hybrid integrated circuits and film structures - Manufacturing line certification - Manufacturers' self-audit checklist and report

PPUB
  • PPUB
  • Publication issued
EN N Webstore
IEC 60748-23-4:2002 ED1

Semiconductor devices - Integrated circuits - Part 23-4: Hybrid integrated circuits and film structures - Manufacturing line certification - Blank detail specification

PPUB
  • PPUB
  • Publication issued
EN N Webstore
IEC 60748-23-5:2003 ED1

Semiconductor devices - Integrated circuits, Part 23-5: Hybrid integrated circuits and film structures - Manufacturing line certification - Procedure for qualification approval

PPUB
  • PPUB
  • Publication issued
EN N Webstore
IEC 61739:1996 ED1

Integrated circuits - Part 1: Procedures for manufacturing line approval and quality management

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 61748 ED1

Manufacturing line approval (QML) for MCM

DEL
  • DEL
  • Deleted items
EN-FR Y 47A/541/CDV PDF file 285 kB
IEC 61928 ED1

Internal inspection after encapsulation

DEL
  • DEL
  • Deleted items
EN U 47A/407/NP
IEC 61933 ED1

Transient energy - Electrostatic discharge sensitivity testing - Machine model

DEL
  • DEL
  • Deleted items
EN U 47A/410/NP
IEC 61943:1999 ED1

Integrated circuits - Manufacturing line approval application guideline

PPUB
  • PPUB
  • Publication issued
EN-FR Y Webstore
IEC TS 61944:2000 ED1

Integrated circuits - Manufacturing line approval - Demonstration vehicles

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC TS 61945:2000 ED1

Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 61962 ED1

Electromagnetic compatibility measurement procedures for integrated circuits

MERGED
  • MERGED
  • Fragment merged
EN U 47A/429/NP
IEC 61964:1999 ED1

Integrated circuits - Memory devices pin configurations

PPUB
  • PPUB
  • Publication issued
EN-FR Y Webstore
IEC 61967/FRAG2 ED1

Integrated circuits, Measurement of electromagnetic emission

DEL
  • DEL
  • Deleted items
EN U 47A/525/NP
IEC 61967-1:2002 ED1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions

PPUB
  • PPUB
  • Publication issued
EN-FR Y Webstore
IEC TR 61967-1-1:2015 ED2

Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format

PPUB
  • PPUB
  • Publication issued
EN 2015-09 N Webstore
IEC TR 61967-1-1:2010 ED1

Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR 2010-05 N 47A/827A/DTR PDF file 1005 kB
IEC 61967-2:2005 ED1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method

PPUB
  • PPUB
  • Publication issued
EN-FR Y Webstore
IEC TS 61967-3:2014 ED2

Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method

PPUB
  • PPUB
  • Publication issued
EN-FR 2014-08 N Webstore
IEC TS 61967-3:2005 ED1

Integrated circuits - Measurement of electromagnetic emissions, 150 KHz to 1 GHz - Part 3: Measurement of radiated emissions - Surface scan method

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR 2005-06 N 47A/697/DTS PDF file 358 kB
IEC 61967-3 ED1

Integrated circuits - Measurement of electromagnetic emission, 150 KHz to 1 GHz - Part 3: Measurement of radiated emissions, surface scan method (10 MHz to 3 GHz)

DEL
  • DEL
  • Deleted items
EN U 47A/532A/CD
IEC 61967-4:2006+AMD1:2006 CSV ED1.1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 61967-4:2002 ED1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method

PPUB
  • PPUB
  • Publication issued
EN-FR Y Webstore
IEC 61967-4:2002/AMD1:2006 ED1

Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method

PPUB
  • PPUB
  • Publication issued
EN-FR Y Webstore
IEC TR 61967-4-1:2005 ED1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method - Application guidance to IEC 61967-4

PPUB
  • PPUB
  • Publication issued
EN 2005-02 U Webstore
IEC 61967-5:2003 ED1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method

PPUB
  • PPUB
  • Publication issued
EN-FR Y Webstore
IEC 61967-6:2008+AMD1:2008 CSV ED1.1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 61967-6:2002 ED1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

PPUB
  • PPUB
  • Publication issued
EN-FR Y Webstore
IEC 61967-6:2002/COR1:2010 ED1

Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 61967-6:2002/AMD1:2008 ED1

Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

PPUB
  • PPUB
  • Publication issued
EN-FR 2008-03 Y Webstore
IEC 61967-7 ED1

Integrated circuits, Universal testboard for EMC measurement

MERGED
  • MERGED
  • Fragment merged
EN U 47A/552/NP PDF file 103 kB
IEC 61967-8:2011 ED1

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

PPUB
  • PPUB
  • Publication issued
EN-FR 2011-08 Y Webstore
IEC TS 62049 ED1

Guidance for QML approval achievement according to IEC 61739

CAN
  • CAN
  • Draft Cancelled
EN U 47A/473/NP
IEC 62132-1:2015 ED2

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions

PPUB
  • PPUB
  • Publication issued
EN-FR 2015-10 Y Webstore
IEC 62132-1:2006 ED1

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR 2006-01 Y 47A/734/FDIS PDF file 367 kB
PDF file 387 kB
IEC 62132-2:2010 ED1

Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method

PPUB
  • PPUB
  • Publication issued
EN-FR 2010-04 Y Webstore
IEC 62132-3:2007 ED1

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method

PPUB
  • PPUB
  • Publication issued
EN-FR 2007-10 Y Webstore
IEC 62132-4 ED2

Integrated circuits - Measurement of electoromagnatic immuity - Part 4: Direct RF power injection method

ACD
  • ACD
  • Approved for CD
EN 2018-12 Y
IEC 62132-4:2006 ED1

Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method

PPUB
  • PPUB
  • Publication issued
EN-FR Y Webstore
IEC 62132-5:2005 ED1

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method

PPUB
  • PPUB
  • Publication issued
EN-FR Y Webstore
IEC TS 62132-6 ED1

Integrated circuits - Measurement of electromagnetic immunity - Part 6: Local Injection Horn Antenna (LIHA) method

CAN
  • CAN
  • Draft Cancelled
EN 2012-12 U 47A/862/CD PDF file 1079 kB
IEC 62132-8:2012 ED1

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method

PPUB
  • PPUB
  • Publication issued
EN-FR 2012-07 Y Webstore
IEC TS 62132-9:2014 ED1

Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method

PPUB
  • PPUB
  • Publication issued
EN-FR 2014-08 N Webstore
IEC 62147 ED1

Unified Quality Management Standard for Approval / Certification

DEL
  • DEL
  • Deleted items
EN U 47A/623/CD PDF file 77 kB
IEC 62200 ED1

Integrated circuits, I/O Interface Model (IMIC)

CAN
  • CAN
  • Draft Cancelled
EN U 47A/575/NP PDF file 317 kB
IEC TS 62215-2:2007 ED1

Integrated circuits - Measurement of impulse immunity - Part 2: Synchronous transient injection method

PPUB
  • PPUB
  • Publication issued
EN 2007-11 N Webstore
IEC 62215-3:2013 ED1

Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method

PPUB
  • PPUB
  • Publication issued
EN-FR 2013-06 Y Webstore
IEC TS 62228:2007 ED1

Integrated circuits - EMC evaluation of CAN transceivers

PPUB
  • PPUB
  • Publication issued
EN 2007-12 N Webstore
IEC 62228-1 ED1

Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions

CD
  • CD
  • Draft circulated as CD
EN 2018-10 U 47A/995/CD PDF file 215 kB
IEC 62228-2:2016 ED1

Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers

PPUB
  • PPUB
  • Publication issued
EN-FR 2016-12 Y Webstore
IEC 62228-3 ED1

Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers

ACD
  • ACD
  • Approved for CD
EN 2018-12 Y
IEC TS 62404:2007 ED1

Logic digital integrated circuits - Specification for I/O interface model for integrated circuit (IMIC version 1.3)

PPUB
  • PPUB
  • Publication issued
EN 2007-12 Y Webstore
IEC TS 62433-1:2011 ED1

EMC IC modelling - Part 1: General modelling framework

PPUB
  • PPUB
  • Publication issued
EN-FR 2011-05 N Webstore
IEC 62433-2 ED2

EMC IC Modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)

CFDIS
  • CFDIS
  • Draft circulated as FDIS
EN-FR 2017-03 Y 47A/999/FDIS PDF file 3280 kB
PDF file 3337 kB
IEC 62433-2:2008 ED1

EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)

PPUB
  • PPUB
  • Publication issued
EN-FR 2008-10 Y Webstore
MERGED
  • MERGED
  • Publication merged with EN version
FR 2012-10 U
IEC TR 62433-2-1:2010 ED1

EMC IC modelling - Part 2-1: Theory of black box modelling for conducted emission

PPUB
  • PPUB
  • Publication issued
EN-FR 2010-10 N Webstore
IEC 62433-3 ED1

EMC IC modelling - Part 3: Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)

CFDIS
  • CFDIS
  • Draft circulated as FDIS
EN-FR 2017-03 Y 47A/1000/FDIS PDF file 2797 kB
PDF file 2898 kB
IEC 62433-4:2016 ED1

EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)

PPUB
  • PPUB
  • Publication issued
EN-FR 2016-06 Y Webstore
IEC 62433-4:2016/FRAG1 ED1

ICIM-CI, Integrated Circuit Immunity Model, Conducted Immunity

DEL
  • DEL
  • Deleted items
EN U
IEC 63011-1 ED1

Integrated circuits - Three dimensional integrated circuits - Part 1: General conditions and definitions

CD
  • CD
  • Draft circulated as CD
EN 2019-02 U 47A/996/CD PDF file 420 kB
IEC 63011-2 ED1

Semiconductor devices - Advanced hybrid integrated circuits - Alignment of stacked dies having fine pitch interconnect

ACD
  • ACD
  • Approved for CD
EN 2018-06 U 47A/961/NP PDF file 304 kB
IEC 63011-3 ED1

Integrated circuits - Three dimensional integrated circuits - Part 3: A model and measurement conditions of Through Silicon Via

CD
  • CD
  • Draft circulated as CD
EN 2019-02 U 47A/997/CD PDF file 515 kB
IEC 60148A ED3

Systematic review of IEC 148A (1974)

DEL
  • DEL
  • Deleted items
EN-FR U
IEC 60148A:1974 ED2

First supplement - Letter symbols for semiconductor devices and integrated microcircuits

WPUB
  • WPUB
  • Publication Withdrawn
EN-FR U
IEC 60148B ED3

Systematic review of IEC 148B (1979)

DEL
  • DEL
  • Deleted items
EN-FR U
IEC 60148B:1979 ED2

Supplement B - Letter symbols for semiconductor devices and integrated microcircuits

WPUB
  • WPUB
  • Publication Withdrawn
EN-FR U