International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 49

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection

 
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TC 49 Project files (214)

Project

Reference

Current

Stage

Language

Frcst

Date

CLC

Document

Reference

Downloads
PNW 49-372 Ed. 1.0

Surface acoustic wave (SAW) filters - Part 3: Standard outlines

DEL
  • DEL
  • Deleted items
E 49/372
PNW 49-373 Ed. 1.0

Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections

DEL
  • DEL
  • Deleted items
E 49/373
PNW 49-428 Ed. 1.0

Project of SAW materials standardization

DEL
  • DEL
  • Deleted items
E 49/428
PNW 49-430 Ed. 1.0

Guide to the use of waveguide type dielectric resonators

DEL
  • DEL
  • Deleted items
E 49/430
PNW 49-433 Ed. 1.0

Standard for the Test-fixture of Surface Mounting Quartz Crystal Units

DEL
  • DEL
  • Deleted items
E 49/433
PNW 49-434 Ed. 1.0

Standard to the Test-fixture with load-capacitance of Surface Mounting Quartz Crystal Units

DEL
  • DEL
  • Deleted items
E 49/434
PNW 49-572 Ed. 1.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials - Materials for dielectric devices

DEL
  • DEL
  • Deleted items
E 49/572
PNW 49-715 Ed. 1.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials for dielectric devices

DEL
  • DEL
  • Deleted items
E 49/715
PNW 49-775 Ed. 1.0

SAW duplexers - Part 2: Guide to the use

DEL
  • DEL
  • Deleted items
E 2009-03 49/775
PNW 49-777 Ed. 1.0

Waveguide type dielectric resonators, General information and test conditions - Measurement method of conductivity at interface between conductor and dielectric material at microwave frequency

DEL
  • DEL
  • Deleted items
E 49/777
PNW 49-833 Ed. 1.0

Surface acoustic wave oscillators of assessed quality - Part 1: Generic specification

DEL
  • DEL
  • Deleted items
E 49/833
PNW 49-874 Ed. 1.0

Waveguide type dielectric resonators, Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

DEL
  • DEL
  • Deleted items
E 49/874
PNW 49-938 Ed. 1.0

Guide to measurement method of nonilinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)

DEL
  • DEL
  • Deleted items
E 49/938
PNW 49-961 Ed. 1.0

Surface Acoustic Wave (SAW) Controlled Oscillators Using SAW Resonators and SAW Delay Lines - Part 1: Generic specification

DEL
  • DEL
  • Deleted items
E 49/961
PNW 49-1145 Ed. 1.0

Chemical sensor devices using piezoelectric acoustic wave and vibrations

DEL
  • DEL
  • Deleted items
E 49/1145
PNW 49-1198 Ed. 1.0

Crystal Unit with Temperature Sensor

PNW
  • PNW
  • Proposed New Work
E 49/1198
IEC 60122-1 Ed. 2.0

Quartz crystal units for frequency control and selection. Part 1: Standard values and test conditions

DELPUB
  • DELPUB
  • Deleted Publication
E
IEC 60122-1 Ed. 3.0

Quartz crystal units of assessed quality - Part 1: Generic specification

PPUB
  • PPUB
  • Publication issued
B 2002-04 yes Webstore
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60122-1 am1 Ed. 3.0

Quartz crystal units of assessed quality - Part 1: Generic specification

ACDV
  • ACDV
  • Draft approved for Committee Draft with Vote
E 2017-12 yes
IEC 60122-2 Ed. 2.0

Quartz crystal units for frequency control and selection. Part 2: Guide to the use of quartz crystal units for frequency control and selection

PPUB
  • PPUB
  • Publication issued
B Webstore
IEC 60122-2-1 Ed. 1.0

Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection - Section One: Quartz crystal units for microprocessor clock supply

PPUB
  • PPUB
  • Publication issued
B Webstore
PPUB
  • PPUB
  • Publication issued
B Webstore
IEC 60122-3 Ed. 2.0

Quartz crystal units for frequency control and selection. Part 3: Standard outlines and pin connections

DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60122-3 Ed. 3.0

Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections

DELPUB
  • DELPUB
  • Deleted Publication
B 2001-06 yes
IEC 60122-3 Ed. 4.0

Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections

PPUB
  • PPUB
  • Publication issued
B 2010-10 yes Webstore
IEC 60122-3 am1 Ed. 3.0

Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections

DEL
  • DEL
  • Deleted items
E 2010-12 yes 49/817
DELPUB
  • DELPUB
  • Deleted Publication
B
DELPUB
  • DELPUB
  • Deleted Publication
B 49(C.O.)209
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC/TR 60283 Ed. 1.0

Methods for the measurement of frequency and equivalent resistance of unwanted resonances of filter crystal units

WPUB
  • WPUB
  • Publication withdrawn
B
IEC 60302 Ed. 1.0

Standard definitions and methods of measurement for piezoelectric vibrators operating over the frequency range up to 30 MHz

DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60368-1 Ed. 3.0

Piezoelectric filters - Part 1: General information, standard values and test conditions

DELPUB
  • DELPUB
  • Deleted Publication
B 49(C.O.)207
IEC 60368-1 Ed. 4.0

Piezoelectric filters of assessed quality - Part 1: Generic specification

PPUB
  • PPUB
  • Publication issued
E yes Webstore
IEC 60368-1 am1 Ed. 4.0

Amendment 1 - Piezoelectric filters of assessed quality - Part 1: Generic specification

PPUB
  • PPUB
  • Publication issued
B yes Webstore
IEC 60368-1 am1 fF Ed. 4.0

Amendment 1 - Piezoelectric filters of assessed quality - Part 1: Generic specification

MERGED
  • MERGED
  • Merged project
F 2013-02
IEC 60368-2-1 Ed. 2.0

Piezoelectric filters. Part 2: Guide to the use of piezoelectric filters - Section One: Quartz crystal filters

PPUB
  • PPUB
  • Publication issued
B Webstore
IEC 60368-2-1 Ed. 3.0

Systematic review of IEC 368-2-1 (1988)

DEL
  • DEL
  • Deleted items
B
IEC 60368-2-2 Ed. 1.0

Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters

PPUB
  • PPUB
  • Publication issued
B Webstore
IEC 60368-3 Ed. 2.0

Piezoelectric filters - Part 3: Standard outlines

DELPUB
  • DELPUB
  • Deleted Publication
B 49(C.O.)208
IEC 60368-3 Ed. 3.0

Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections

DELPUB
  • DELPUB
  • Deleted Publication
B 2001-06 yes
IEC 60368-3 Ed. 4.0

Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections

PPUB
  • PPUB
  • Publication issued
B 2010-11 yes Webstore
IEC 60368-3 am1 Ed. 3.0

Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections

DEL
  • DEL
  • Deleted items
E 2010-12 yes 49/818
IEC 60368-4 Ed. 1.0

Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval

PPUB
  • PPUB
  • Publication issued
B yes Webstore
IEC 60368-4-1 Ed. 1.0

Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval

PPUB
  • PPUB
  • Publication issued
B yes Webstore
IEC 60444-1 Ed. 2.0

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network

PPUB
  • PPUB
  • Publication issued
B Webstore
PPUB
  • PPUB
  • Publication issued
B yes Webstore
IEC 60444-2 Ed. 1.0

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

PPUB
  • PPUB
  • Publication issued
B Webstore
IEC/TR 60444-3 Ed. 1.0

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the parallel capacitance Co

WPUB
  • WPUB
  • Publication withdrawn
B
IEC/TR 60444-4 Ed. 1.0

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz

PPUB
  • PPUB
  • Publication issued
B Webstore
IEC/TR 60444-4 Ed. 2.0

Systematic review of IEC 444-4 (1988)

DEL
  • DEL
  • Deleted items
B
IEC 60444-5 Ed. 1.0

Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction

PPUB
  • PPUB
  • Publication issued
B Webstore
IEC 60444-5 am1 Ed. 1.0

Measurement of surface mounting quartz crystal units

DEL
  • DEL
  • Deleted items
E
IEC 60444-6 Ed. 1.0

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

DELPUB
  • DELPUB
  • Deleted Publication
B 1994-02
IEC 60444-6 Ed. 2.0

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

PPUB
  • PPUB
  • Publication issued
B 2013-06 yes Webstore
IEC 60444-7 Ed. 1.0

Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units

PPUB
  • PPUB
  • Publication issued
B yes Webstore
IEC 60444-7 fF Ed. 1.0

Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units

MERGED
  • MERGED
  • Merged project
F 2013-02
IEC 60444-8 Ed. 1.0

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

PPUB
  • PPUB
  • Publication issued
B yes Webstore
IEC 60444-8 Ed. 2.0

Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units

ADIS
  • ADIS
  • Approved for FDIS circulation
B 2017-04 yes
IEC 60444-8 fF Ed. 1.0

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

MERGED
  • MERGED
  • Merged project
F
IEC 60444-9 Ed. 1.0

Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units

PPUB
  • PPUB
  • Publication issued
B 2007-01 yes Webstore
IEC 60444-9 fF Ed. 1.0

Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units

MERGED
  • MERGED
  • Merged project
F 2013-06
IEC 60444-10 Ed. 1.0

Measurement of quartz crystal units parameters - Part 10: Test fixture for crystal devices in GHz band

DEL
  • DEL
  • Deleted items
E 2013-11 49/960
IEC/TS 60444-10 Ed. 1.0

Piezoelectric and dielectric devices for frequency control and selection - Measurement of quartz crystal unit parameters - Method for the determination of equivalent electrical parameters for GHz band

MERGED
  • MERGED
  • Merged project
E 2007-02 49/726
IEC 60444-11 Ed. 1.0

Measrurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency f<sub>L</sub> and the effective load capacitance C<sub>Leff>/sub> using automatic network analyzer techniques and error correction

PPUB
  • PPUB
  • Publication issued
B 2010-10 yes Webstore
IEC 60483 Ed. 1.0

Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling

PPUB
  • PPUB
  • Publication issued
B Webstore
IEC 60642 Ed. 1.0

Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions

PPUB
  • PPUB
  • Publication issued
B Webstore
IEC 60642 Ed. 2.0

Systematic review of IEC 642 (1979)

DEL
  • DEL
  • Deleted items
B
PPUB
  • PPUB
  • Publication issued
B Webstore
IEC 60642-2 Ed. 1.0

Piezoelectric ceramic resonator units - Part 2: Guide to the use of piezoelectric ceramic resonator units

PPUB
  • PPUB
  • Publication issued
B Webstore
IEC 60642-3 Ed. 1.0

Piezoelectric ceramic resonators - Part 3: Standard outlines

PPUB
  • PPUB
  • Publication issued
B Webstore
IEC 60679-1 Ed. 1.0

Quartz crystal controlled oscillators. Part 1: General information, test conditions and methods

DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60679-1 Ed. 2.0

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

DELPUB
  • DELPUB
  • Deleted Publication
B yes
IEC 60679-1 Ed. 3.0

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

PPUB
  • PPUB
  • Publication issued
B 2006-08 yes Webstore
IEC 60679-1 Ed. 4.0

Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1 : Generic specification

CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote
E 2017-07 yes
IEC 60679-1 f1 Ed. 4.0

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

MERGED
  • MERGED
  • Merged project
E 2013-03 yes 49/940A
IEC 60679-1 f2 Ed. 2.0

Amendment to IEC 679-1: Quartz crystal controlled oscillators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specifitacion

MERGED
  • MERGED
  • Merged project
B
IEC 60679-1 fF Ed. 3.0

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

MERGED
  • MERGED
  • Merged project
F 2011-05
DELPUB
  • DELPUB
  • Deleted Publication
B
DELPUB
  • DELPUB
  • Deleted Publication
B yes
IEC 60679-1 am1 Ed. 3.0

Quartz crystal controlled oscillators of assessed quality-Part 1: Generic apecification

MERGED
  • MERGED
  • Merged project
E 2016-07 yes
IEC 60679-1 am1 f1 Ed. 3.0

Quartz crystal controlled oscillators of assessed quality- Part 1: Generic specification

MERGED
  • MERGED
  • Merged project
E 2013-04 yes 49/965
DEL 60679-1 am2 Ed. 2.0

A standardized test procedure for the characterization of latch up in crystal controlled oscillators CMOS integrated circuits

MERGED
  • MERGED
  • Merged project
E
DELPUB
  • DELPUB
  • Deleted Publication
B yes
DEL 60679-2 Ed. 2.0

Systematic review of IEC 672-2 (1981)

DEL
  • DEL
  • Deleted items
B
IEC 60679-2 Ed. 1.0

Quartz crystal controlled oscillators. Part 2: Guide to the use of quartz crystal controlled oscillators

PPUB
  • PPUB
  • Publication issued
B Webstore
IEC 60679-3 Ed. 1.0

Quartz crystal controlled oscillators. Part 3: Standard outlines and lead connections

DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60679-3 Ed. 2.0

Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections

DELPUB
  • DELPUB
  • Deleted Publication
B 2001-06 yes
IEC 60679-3 Ed. 3.0

Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections

PPUB
  • PPUB
  • Publication issued
B 2013-01 yes Webstore
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60679-3 am1 Ed. 2.0

Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections

DEL
  • DEL
  • Deleted items
E 2010-12 yes 49/819
IEC 60679-4 Ed. 1.0

Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval

PPUB
  • PPUB
  • Publication issued
B yes Webstore
IEC 60679-4-1 Ed. 1.0

Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval

PPUB
  • PPUB
  • Publication issued
B yes Webstore
IEC 60679-5 Ed. 1.0

Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval

PPUB
  • PPUB
  • Publication issued
B yes Webstore
IEC 60679-5-1 Ed. 1.0

Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval

PPUB
  • PPUB
  • Publication issued
B yes Webstore
IEC 60679-6 Ed. 1.0

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

PPUB
  • PPUB
  • Publication issued
B 2011-03 yes Webstore
IEC/PAS 60679-6 Ed. 1.0

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide

DELPUB
  • DELPUB
  • Deleted Publication
E 2008-02 49/784
IEC 60679-3A Ed. 1.0

First supplement

DELPUB
  • DELPUB
  • Deleted Publication
B 49(C.O.)205
IEC 60689 Ed. 1.0

Measurements and test methods for 32 kHz quartz crystal units for wrist watches and standard values

DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60689 Ed. 2.0

Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values

PPUB
  • PPUB
  • Publication issued
B 2008-12 yes Webstore
IEC 60689 fF Ed. 2.0

Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values

MERGED
  • MERGED
  • Merged project
F 2013-06
IEC 60758 Ed. 2.0

Synthetic quartz crystal - Specifications and guide to the use

DELPUB
  • DELPUB
  • Deleted Publication
B 49(C.O.)218
IEC 60758 Ed. 3.0

Synthetic quartz crystal - Specifications and guide to the use

DELPUB
  • DELPUB
  • Deleted Publication
E 2005-01 yes
IEC 60758 Ed. 4.0

Synthetic quartz crystal - Specifications and guidelines for use

DELPUB
  • DELPUB
  • Deleted Publication
B 2008-11 yes
IEC 60758 Ed. 5.0

Synthetic quartz crystal - Specifications and guidelines for use

PPUB
  • PPUB
  • Publication issued
E 2016-05 yes Webstore
IEC 60758 fF Ed. 4.0

Synthetic quartz crystal - Specifications and guidelines for use

MERGED
  • MERGED
  • Merged project
F 2012-01
IEC 60758 am1 Ed. 2.0

Amendment No. 1

DELPUB
  • DELPUB
  • Deleted Publication
B
DELPUB
  • DELPUB
  • Deleted Publication
B
DEL 60862-1 Ed. 2.0

Systematic review of IEC 862-1 (1989)

DEL
  • DEL
  • Deleted items
B
IEC 60862-1 Ed. 1.0

Surface acoustic wave (SAW) filters. Part 1: General information, standard values and test conditions - Chapter I: General information and standard values - Chapter II: Test conditions

DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60862-1 Ed. 2.0

Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification

DELPUB
  • DELPUB
  • Deleted Publication
B 2003-06 yes
IEC 60862-1 Ed. 3.0

Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification

PPUB
  • PPUB
  • Publication issued
B 2015-09 yes Webstore
IEC 60862-2 Ed. 1.0

Surface acoustic wave (SAW) filters - Part 2: Guide to the use of surface acoustic wave filters (Chapter III)

DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60862-2 Ed. 2.0

Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidance on use

DELPUB
  • DELPUB
  • Deleted Publication
B 2002-06 yes
IEC 60862-2 Ed. 3.0

Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use

PPUB
  • PPUB
  • Publication issued
B 2012-03 yes Webstore
DEL 60862-3 Ed. 2.0

Systematic review of IEC 862-3 (1986)

DEL
  • DEL
  • Deleted items
B
IEC 60862-3 Ed. 1.0

Surface acoustic wave (SAW) filters. Part 3: Standard outlines (Chapter IV)

DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60862-3 Ed. 2.0

Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines

PPUB
  • PPUB
  • Publication issued
B 2002-12 yes Webstore
IEC 60862-3 f1 Ed. 3.0

IEC 60862-3 Ed.3: Surface acoustic wave (SAW) resonators - Part 3: Standard outlines

MERGED
  • MERGED
  • Merged project
E yes 49/672
IEC 61019-1 Ed. 1.0

Surface acoustic wave (SAW) resonators - Part 1: Generic specification

PPUB
  • PPUB
  • Publication issued
B yes Webstore
IEC 61019-1 fF Ed. 1.0

Surface acoustic wave (SAW) resonators - Part 1: Generic specification

MERGED
  • MERGED
  • Merged project
F 2011-05
DEL 61019-1-1 Ed. 2.0

Systematic review of IEC 1019-1-1 (1990)

DEL
  • DEL
  • Deleted items
B
IEC 61019-1-1 Ed. 1.0

Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 1: General information and standard values

DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 61019-1-2 Ed. 1.0

Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 2: Test conditions

DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 61019-2 Ed. 1.0

Surface acoustic wave (SAW) resonators - Part 2: Guide to the use

DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 61019-2 Ed. 2.0

Surface acoustic wave (SAW) resonators - Part 2: Guide to the use

PPUB
  • PPUB
  • Publication issued
B yes Webstore
IEC 61019-2 fF Ed. 2.0

Surface acoustic wave (SAW) resonators - Part 2: Guide to the use

MERGED
  • MERGED
  • Merged project
F 2013-08
IEC 61019-3 Ed. 1.0

Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections

PPUB
  • PPUB
  • Publication issued
B Webstore
IEC 61019-3 Ed. 2.0

Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections

DEL
  • DEL
  • Deleted items
E 2008-01 yes 49/737
IEC 61019-3 f1 Ed. 2.0

IEC 61019-3 Ed.2: Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections

MERGED
  • MERGED
  • Merged project
E yes 49/673
IEC 61080 Ed. 1.0

Guide to the measurement of equivalent electrical parameters of quartz crystal units

PPUB
  • PPUB
  • Publication issued
B Webstore
IEC 61178-1 Ed. 1.0

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification

DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 61178-2 Ed. 1.0

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval

PPUB
  • PPUB
  • Publication issued
B Webstore
IEC 61178-2-1 Ed. 1.0

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2-1: Sectional specification - Capability approval - Blank detail specification

PPUB
  • PPUB
  • Publication issued
B Webstore
IEC 61178-3 Ed. 1.0

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval

PPUB
  • PPUB
  • Publication issued
B Webstore
IEC 61178-3-1 Ed. 1.0

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3-1: Sectional specification - Qualification approval - Blank detail specification

PPUB
  • PPUB
  • Publication issued
B Webstore
IEC 61240 Ed. 1.0

Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules

DELPUB
  • DELPUB
  • Deleted Publication
B 1994-04 49(C.O.)276
IEC 61240 Ed. 2.0

Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules

PPUB
  • PPUB
  • Publication issued
B 2012-08 yes Webstore
IEC 61240 Ed. 3.0

Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules

BPUB
  • BPUB
  • Publication being printed
E 2016-10 yes
IEC 61240 am1 Ed. 1.0

Piezoelectric devices - Preparation of outline drawings of quartz crystal units, crystal filters, crystal oscillators, and surface acoustic wave (SAW) for frequency control and selection - General rules

DEL
  • DEL
  • Deleted items
E 2010-12 yes 49/822
IEC 61253-1 Ed. 1.0

Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval

PPUB
  • PPUB
  • Publication issued
B Webstore
IEC 61253-2 Ed. 1.0

Piezoelectric ceramic resonators - A Specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval

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IEC 61253-2-1 Ed. 1.0

Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E

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IEC 61261-1 Ed. 1.0

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval

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IEC 61261-2 Ed. 1.0

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval

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IEC 61261-2-1 Ed. 1.0

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E

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IEC 61337-1 Ed. 1.0

Filters using waveguide type dielectric resonators - Part 1: Generic specification

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B yes Webstore
IEC 61337-1 fF Ed. 1.0

Filters using waveguide type dielectric resonators - Part 1: Generic specification

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IEC 61337-1-1 Ed. 1.0

Filters using waveguide type dielectric resonators - Part 1: General information, standard values and test conditions - Section 1: General information and standard values

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IEC 61337-1-2 Ed. 1.0

Filters using waveguide type dielectric resonators - Part 1-2: Test conditions

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IEC 61337-2 Ed. 1.0

Filters using waveguide type dielectric resonators - Part 2: Guidance for use

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B 2003-12 yes Webstore
IEC 61337-2 fF Ed. 1.0

Filters using waveguide type dielectric resonators - Part 2: Guidance for use

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F 2013-08
IEC 61338-1 Ed. 1.0

Waveguide type dielectric resonators - Part 1: Generic specification

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B yes Webstore
IEC 61338-1 fF Ed. 1.0

Waveguide type dielectric resonators - Part 1: Generic specification

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F 2013-07
IEC 61338-1-1 Ed. 1.0

Waveguide type dielectric resonators - Part 1: General information and test conditions - Section 1: General information

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IEC 61338-1-2 Ed. 1.0

Waveguide type dielectric resonators - Part 1-2: General information and test conditions - Test conditions

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IEC 61338-1-3 Ed. 1.0

Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency

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IEC 61338-1-4 Ed. 1.0

Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency

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B 2004-12 yes Webstore
IEC 61338-1-4 fF Ed. 1.0

Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency

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F 2013-08
IEC 61338-1-5 Ed. 1.0

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

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B 2015-07 yes Webstore
IEC/PAS 61338-1-5 Ed. 1.0

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

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IEC 61338-2 Ed. 1.0

Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications

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B 2004-06 yes Webstore
IEC 61338-2 fF Ed. 1.0

Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications

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F 2013-08
IEC/PAS 61338-2 Ed. 1.0

Waveguide type dielectric resonators - Part 2: Guide to the use of waveguide type dielectric resonators

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IEC 61338-4 Ed. 1.0

Waveguide type dielectric resonators - Part 4: Sectional specification

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B 2004-12 yes Webstore
IEC 61338-4 fF Ed. 1.0

Waveguide type dielectric resonators - Part 4: Sectional specification

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F 2013-08
IEC 61338-4-1 Ed. 1.0

Waveguide type dielectric resonators - Part 4-1: Blank detail specification

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B yes Webstore
IEC 61338-4-1 fF Ed. 1.0

Waveguide type dielectric resonators - Part 4-1: Blank detail specification

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F 2013-02
IEC 61837-1 Ed. 1.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines

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IEC 61837-1 Ed. 2.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines

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B 2012-02 yes Webstore
IEC 61837-1 f1 Ed. 2.0

Maintenance cycle report on IEC 61837-1 Ed.1:Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines

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IEC 61837-1 am1 Ed. 1.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines

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IEC 61837-2 Ed. 1.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

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IEC 61837-2 Ed. 2.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

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B 2011-05 yes Webstore
IEC 61837-2 am1 Ed. 2.0

Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

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B 2014-03 yes Webstore
IEC 61837-3 Ed. 1.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures

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IEC 61837-3 Ed. 2.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures

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B 2015-04 yes Webstore
IEC 61837-3 am1 Ed. 1.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures

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E 2014-03 yes 49/1002
IEC 61837-4 Ed. 1.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines

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B 2004-06 yes
IEC 61837-4 Ed. 2.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines

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B 2015-03 yes Webstore
IEC 61837-4 fF Ed. 1.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines

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F 2012-01
IEC 61837-4 am1 Ed. 1.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines

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E 2014-03 yes 49/1003
IEC/TS 61994-1 Ed. 1.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators

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IEC/TS 61994-1 Ed. 2.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators

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E 2007-06 no Webstore
IEC/TS 61994-2 Ed. 1.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 2: Piezoelectric and dielectric filters

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IEC/TS 61994-2 Ed. 2.0

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters

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B 2011-06 no Webstore
IEC/TS 61994-3 Ed. 1.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 3: Piezoelectric and dielectric oscillators

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IEC/TS 61994-3 Ed. 2.0

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric and dielectric oscillators

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E 2011-07 no Webstore
IEC/TS 61994-4-1 Ed. 1.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal

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IEC/TS 61994-4-1 Ed. 2.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal

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E 2007-06 no Webstore
IEC/TS 61994-4-2 Ed. 1.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics

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IEC/TS 61994-4-2 Ed. 2.0

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics

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B 2011-03 no Webstore
IEC/TS 61994-4-3 Ed. 1.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials - Materials for dielectric devices

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E 2008-02 no Webstore
IEC/TS 61994-4-4 Ed. 1.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for Surface Acoustic Wave (SAW) devices

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IEC/TS 61994-4-4 Ed. 2.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for surface acoustic wave (SAW) devices

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E 2010-07 no Webstore
IEC 62276 Ed. 1.0

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

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IEC 62276 Ed. 2.0

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

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B 2012-11 yes Webstore
IEC 62276 Ed. 3.0

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

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IEC/PAS 62276 Ed. 1.0

Single crystal wafers applied for surface acoustic wave device - Specification and measuring method

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IEC/PAS 62277 Ed. 1.0

Test-fixture of surface mounting quartz crystal units

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IEC 62575-1 Ed. 1.0

Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification

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B 2015-10 yes Webstore
IEC 62575-2 Ed. 1.0

Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use

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B 2012-08 yes Webstore
IEC 62604-1 Ed. 1.0

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification

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B 2015-07 yes Webstore
IEC 62604-2 Ed. 1.0

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers - Part 2: Guidelines for the use

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B 2011-12 yes Webstore
IEC 62604-2 Ed. 2.0

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use

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E 2017-06 yes
IEC 62643-1 Ed. 1.0

Electrostatic Micro Electro Mechanical Systems (MEMS) oscillators of assembled quality - Part 1 : Generic specification

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E 2012-10
IEC 62761 Ed. 1.0

Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)

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B 2014-03 yes Webstore
IEC 62884-1 Ed. 1.0

Measurement techniques of piezoelectric, dieletric and electrostatic oscillators - Part 1: Basic methods for the measurement

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E 2017-05 yes
IEC 62884-2 Ed. 1.0

Measurement technique of piezoelectric, dieletric and electrostatic oscillators - Part 2: Phase jitter measurement method

1CD
  • 1CD
  • 1st Committee Draft
E 2018-07 yes
IEC 62884-3 Ed. 1.0

Measurement techniques of piezoelectric, dieletric and electrostatic oscillators - Part 3: Frequency aging test methods

A2CD
  • A2CD
  • Approved for 2nd Committee Draft
E 2018-07 yes
IEC 62884-4 Ed. 1.0

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods

A2CD
  • A2CD
  • Approved for 2nd Committee Draft
E 2017-04
IEC 63041-1 Ed. 1.0

Sensor devices using piezoelectric bulk or surface acoustic waves - Part 1: Generic specifications

A2CD
  • A2CD
  • Approved for 2nd Committee Draft
E 2017-12
IEC 63041-2 Ed. 1.0

Sensor devices using piezoelectric bulk or surface acoustic waves - Part 2: Chemical sensors and Biosensors

A2CD
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  • Approved for 2nd Committee Draft
E 2017-12
IEC 60368B Ed. 3.0

Piezoelectric filters. Second supplement

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