International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 49

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection

 
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TC 49 Project files (204)

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PNW 49-372 Ed. 1.0

Surface acoustic wave (SAW) filters - Part 3: Standard outlines
DEL
  • DEL
  • Deleted items
E49/372
PNW 49-373 Ed. 1.0

Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections
DEL
  • DEL
  • Deleted items
E49/373
PNW 49-428 Ed. 1.0

Project of SAW materials standardization
DEL
  • DEL
  • Deleted items
E49/428
PNW 49-430 Ed. 1.0

Guide to the use of waveguide type dielectric resonators
DEL
  • DEL
  • Deleted items
E49/430
PNW 49-433 Ed. 1.0

Standard for the Test-fixture of Surface Mounting Quartz Crystal Units
DEL
  • DEL
  • Deleted items
E49/433
PNW 49-434 Ed. 1.0

Standard to the Test-fixture with load-capacitance of Surface Mounting Quartz Crystal Units
DEL
  • DEL
  • Deleted items
E49/434
PNW 49-572 Ed. 1.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials - Materials for dielectric devices
DEL
  • DEL
  • Deleted items
E49/572
PNW 49-715 Ed. 1.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials for dielectric devices
DEL
  • DEL
  • Deleted items
E49/715
PNW 49-775 Ed. 1.0

SAW duplexers - Part 2: Guide to the use
DEL
  • DEL
  • Deleted items
E2009-0349/775
PNW 49-777 Ed. 1.0

Waveguide type dielectric resonators, General information and test conditions - Measurement method of conductivity at interface between conductor and dielectric material at microwave frequency
DEL
  • DEL
  • Deleted items
E49/777
PNW 49-833 Ed. 1.0

Surface acoustic wave oscillators of assessed quality - Part 1: Generic specification
DEL
  • DEL
  • Deleted items
E49/833
PNW 49-874 Ed. 1.0

Waveguide type dielectric resonators, Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
DEL
  • DEL
  • Deleted items
E49/874
PNW 49-938 Ed. 1.0

Guide to measurement method of nonilinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
DEL
  • DEL
  • Deleted items
E49/938
PNW 49-961 Ed. 1.0

Surface Acoustic Wave (SAW) Controlled Oscillators Using SAW Resonators and SAW Delay Lines - Part 1: Generic specification
DEL
  • DEL
  • Deleted items
E49/961
IEC 60122-1 Ed. 2.0

Quartz crystal units for frequency control and selection. Part 1: Standard values and test conditions
DELPUB
  • DELPUB
  • Deleted Publication
E
IEC 60122-1 Ed. 3.0

Quartz crystal units of assessed quality - Part 1: Generic specification
PPUB
  • PPUB
  • Publication issued
B2002-04yesWebstore
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60122-1 am1 Ed. 3.0

Quartz crystal units of assessed quality - Part 1: Generic specification
A2CD
  • A2CD
  • Approved for 2nd Committee Draft
E2013-04yes
IEC 60122-2 Ed. 2.0

Quartz crystal units for frequency control and selection. Part 2: Guide to the use of quartz crystal units for frequency control and selection
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC 60122-2-1 Ed. 1.0

Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection - Section One: Quartz crystal units for microprocessor clock supply
PPUB
  • PPUB
  • Publication issued
BWebstore
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC 60122-3 Ed. 2.0

Quartz crystal units for frequency control and selection. Part 3: Standard outlines and pin connections
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60122-3 Ed. 3.0

Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
DELPUB
  • DELPUB
  • Deleted Publication
B2001-06yes
IEC 60122-3 Ed. 4.0

Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
PPUB
  • PPUB
  • Publication issued
B2010-10yesWebstore
IEC 60122-3 am1 Ed. 3.0

Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
DEL
  • DEL
  • Deleted items
E2010-12yes49/817
DELPUB
  • DELPUB
  • Deleted Publication
B
DELPUB
  • DELPUB
  • Deleted Publication
B49(C.O.)209
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60283 Ed. 1.0

Methods for the measurement of frequency and equivalent resistance of unwanted resonances of filter crystal units
WPUB
  • WPUB
  • Publication withdrawn
B
IEC 60302 Ed. 1.0

Standard definitions and methods of measurement for piezoelectric vibrators operating over the frequency range up to 30 MHz
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60368-1 Ed. 3.0

Piezoelectric filters - Part 1: General information, standard values and test conditions
DELPUB
  • DELPUB
  • Deleted Publication
B49(C.O.)207
IEC 60368-1 Ed. 4.0

Piezoelectric filters of assessed quality - Part 1: Generic specification
PPUB
  • PPUB
  • Publication issued
EyesWebstore
IEC 60368-1 am1 Ed. 4.0

Amendment 1 - Piezoelectric filters of assessed quality - Part 1: Generic specification
PPUB
  • PPUB
  • Publication issued
ByesWebstore
IEC 60368-1 am1 fF Ed. 4.0

Amendment 1 - Piezoelectric filters of assessed quality - Part 1: Generic specification
MERGED
  • MERGED
  • Merged project
F2013-02
IEC 60368-2-1 Ed. 2.0

Piezoelectric filters. Part 2: Guide to the use of piezoelectric filters - Section One: Quartz crystal filters
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC 60368-2-1 Ed. 3.0

Systematic review of IEC 368-2-1 (1988)
DEL
  • DEL
  • Deleted items
B
IEC 60368-2-2 Ed. 1.0

Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC 60368-3 Ed. 2.0

Piezoelectric filters - Part 3: Standard outlines
DELPUB
  • DELPUB
  • Deleted Publication
B49(C.O.)208
IEC 60368-3 Ed. 3.0

Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
DELPUB
  • DELPUB
  • Deleted Publication
B2001-06yes
IEC 60368-3 Ed. 4.0

Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
PPUB
  • PPUB
  • Publication issued
B2010-11yesWebstore
IEC 60368-3 am1 Ed. 3.0

Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
DEL
  • DEL
  • Deleted items
E2010-12yes49/818
IEC 60368-4 Ed. 1.0

Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval
PPUB
  • PPUB
  • Publication issued
ByesWebstore
IEC 60368-4-1 Ed. 1.0

Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval
PPUB
  • PPUB
  • Publication issued
ByesWebstore
IEC 60444-1 Ed. 2.0

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
PPUB
  • PPUB
  • Publication issued
BWebstore
PPUB
  • PPUB
  • Publication issued
ByesWebstore
IEC 60444-2 Ed. 1.0

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC/TR 60444-3 Ed. 1.0

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the parallel capacitance Co
WPUB
  • WPUB
  • Publication withdrawn
B
IEC/TR 60444-4 Ed. 1.0

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC/TR 60444-4 Ed. 2.0

Systematic review of IEC 444-4 (1988)
DEL
  • DEL
  • Deleted items
B
IEC 60444-5 Ed. 1.0

Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC 60444-5 am1 Ed. 1.0

Measurement of surface mounting quartz crystal units
DEL
  • DEL
  • Deleted items
E
IEC 60444-6 Ed. 1.0

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
DELPUB
  • DELPUB
  • Deleted Publication
B1994-02
IEC 60444-6 Ed. 2.0

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
PPUB
  • PPUB
  • Publication issued
B2013-06yesWebstore
IEC 60444-7 Ed. 1.0

Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
PPUB
  • PPUB
  • Publication issued
ByesWebstore
IEC 60444-7 fF Ed. 1.0

Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
MERGED
  • MERGED
  • Merged project
F2013-02
IEC 60444-8 Ed. 1.0

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
PPUB
  • PPUB
  • Publication issued
ByesWebstore
IEC 60444-8 Ed. 2.0

Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
2CD
  • 2CD
  • 2nd Committee Draft
E2014-12yes
IEC 60444-8 fF Ed. 1.0

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
MERGED
  • MERGED
  • Merged project
F
IEC 60444-9 Ed. 1.0

Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
PPUB
  • PPUB
  • Publication issued
B2007-01yesWebstore
IEC 60444-9 fF Ed. 1.0

Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
MERGED
  • MERGED
  • Merged project
F2013-06
IEC 60444-10 Ed. 1.0

Measurement of quartz crystal units parameters - Part 10: Test fixture for crystal devices in GHz band
DEL
  • DEL
  • Deleted items
E2013-1149/960
IEC/TS 60444-10 Ed. 1.0

Piezoelectric and dielectric devices for frequency control and selection - Measurement of quartz crystal unit parameters - Method for the determination of equivalent electrical parameters for GHz band
MERGED
  • MERGED
  • Merged project
E2007-0249/726
IEC 60444-11 Ed. 1.0

Measrurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency f<sub>L</sub> and the effective load capacitance C<sub>Leff>/sub> using automatic network analyzer techniques and error correction
PPUB
  • PPUB
  • Publication issued
B2010-10yesWebstore
IEC 60483 Ed. 1.0

Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC 60642 Ed. 1.0

Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC 60642 Ed. 2.0

Systematic review of IEC 642 (1979)
DEL
  • DEL
  • Deleted items
B
IEC 60642 am1 Ed. 1.0

Amendment No. 1
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC 60642-2 Ed. 1.0

Piezoelectric ceramic resonator units - Part 2: Guide to the use of piezoelectric ceramic resonator units
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC 60642-3 Ed. 1.0

Piezoelectric ceramic resonators - Part 3: Standard outlines
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC 60679-1 Ed. 1.0

Quartz crystal controlled oscillators. Part 1: General information, test conditions and methods
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60679-1 Ed. 2.0

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
DELPUB
  • DELPUB
  • Deleted Publication
Byes
IEC 60679-1 Ed. 3.0

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
PPUB
  • PPUB
  • Publication issued
B2006-08yesWebstore
IEC 60679-1 Ed. 4.0

Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1 : Generic specification
2CD
  • 2CD
  • 2nd Committee Draft
E2015-03yes
IEC 60679-1 f1 Ed. 4.0

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
MERGED
  • MERGED
  • Merged project
E2013-03yes49/940A
IEC 60679-1 f2 Ed. 2.0

Amendment to IEC 679-1: Quartz crystal controlled oscillators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specifitacion
MERGED
  • MERGED
  • Merged project
B
IEC 60679-1 fF Ed. 3.0

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
MERGED
  • MERGED
  • Merged project
F2011-05
DELPUB
  • DELPUB
  • Deleted Publication
B
DELPUB
  • DELPUB
  • Deleted Publication
Byes
IEC 60679-1 am1 Ed. 3.0

Quartz crystal controlled oscillators of assessed quality-Part 1: Generic apecification
A2CD
  • A2CD
  • Approved for 2nd Committee Draft
E2014-03yes
IEC 60679-1 am1 f1 Ed. 3.0

Quartz crystal controlled oscillators of assessed quality- Part 1: Generic specification
MERGED
  • MERGED
  • Merged project
E2013-04yes49/965
DEL 60679-1 am2 Ed. 2.0

A standardized test procedure for the characterization of latch up in crystal controlled oscillators CMOS integrated circuits
MERGED
  • MERGED
  • Merged project
E
DELPUB
  • DELPUB
  • Deleted Publication
Byes
DEL 60679-2 Ed. 2.0

Systematic review of IEC 672-2 (1981)
DEL
  • DEL
  • Deleted items
B
IEC 60679-2 Ed. 1.0

Quartz crystal controlled oscillators. Part 2: Guide to the use of quartz crystal controlled oscillators
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC 60679-3 Ed. 1.0

Quartz crystal controlled oscillators. Part 3: Standard outlines and lead connections
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60679-3 Ed. 2.0

Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
DELPUB
  • DELPUB
  • Deleted Publication
B2001-06yes
IEC 60679-3 Ed. 3.0

Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
PPUB
  • PPUB
  • Publication issued
B2013-01yesWebstore
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60679-3 am1 Ed. 2.0

Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
DEL
  • DEL
  • Deleted items
E2010-12yes49/819
IEC 60679-4 Ed. 1.0

Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval
PPUB
  • PPUB
  • Publication issued
ByesWebstore
IEC 60679-4-1 Ed. 1.0

Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval
PPUB
  • PPUB
  • Publication issued
ByesWebstore
IEC 60679-5 Ed. 1.0

Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
PPUB
  • PPUB
  • Publication issued
ByesWebstore
IEC 60679-5-1 Ed. 1.0

Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval
PPUB
  • PPUB
  • Publication issued
ByesWebstore
IEC 60679-6 Ed. 1.0

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
PPUB
  • PPUB
  • Publication issued
B2011-03yesWebstore
IEC/PAS 60679-6 Ed. 1.0

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
DELPUB
  • DELPUB
  • Deleted Publication
E2008-0249/784
IEC 60679-3A Ed. 1.0

First supplement
DELPUB
  • DELPUB
  • Deleted Publication
B49(C.O.)205
IEC 60689 Ed. 1.0

Measurements and test methods for 32 kHz quartz crystal units for wrist watches and standard values
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60689 Ed. 2.0

Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
PPUB
  • PPUB
  • Publication issued
B2008-12yesWebstore
IEC 60689 fF Ed. 2.0

Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
MERGED
  • MERGED
  • Merged project
F2013-06
IEC 60758 Ed. 2.0

Synthetic quartz crystal - Specifications and guide to the use
DELPUB
  • DELPUB
  • Deleted Publication
B49(C.O.)218
IEC 60758 Ed. 3.0

Synthetic quartz crystal - Specifications and guide to the use
DELPUB
  • DELPUB
  • Deleted Publication
E2005-01yes
IEC 60758 Ed. 4.0

Synthetic quartz crystal - Specifications and guidelines for use
PPUB
  • PPUB
  • Publication issued
B2008-11yesWebstore
IEC 60758 Ed. 5.0

Synthetic quartz crystal - Specifications and guidelines for use
3CD
  • 3CD
  • 3rd Committee Draft
E2014-12yes
IEC 60758 fF Ed. 4.0

Synthetic quartz crystal - Specifications and guidelines for use
MERGED
  • MERGED
  • Merged project
F2012-01
IEC 60758 am1 Ed. 2.0

Amendment No. 1
DELPUB
  • DELPUB
  • Deleted Publication
B
DELPUB
  • DELPUB
  • Deleted Publication
B
DEL 60862-1 Ed. 2.0

Systematic review of IEC 862-1 (1989)
DEL
  • DEL
  • Deleted items
B
IEC 60862-1 Ed. 1.0

Surface acoustic wave (SAW) filters. Part 1: General information, standard values and test conditions - Chapter I: General information and standard values - Chapter II: Test conditions
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60862-1 Ed. 2.0

Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
PPUB
  • PPUB
  • Publication issued
ByesWebstore
IEC 60862-1 Ed. 3.0

Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
ADIS
  • ADIS
  • Approved for FDIS circulation
B2015-04yes
IEC 60862-2 Ed. 1.0

Surface acoustic wave (SAW) filters - Part 2: Guide to the use of surface acoustic wave filters (Chapter III)
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60862-2 Ed. 2.0

Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidance on use
DELPUB
  • DELPUB
  • Deleted Publication
B2002-06yes
IEC 60862-2 Ed. 3.0

Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
PPUB
  • PPUB
  • Publication issued
B2012-03yesWebstore
DEL 60862-3 Ed. 2.0

Systematic review of IEC 862-3 (1986)
DEL
  • DEL
  • Deleted items
B
IEC 60862-3 Ed. 1.0

Surface acoustic wave (SAW) filters. Part 3: Standard outlines (Chapter IV)
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 60862-3 Ed. 2.0

Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
PPUB
  • PPUB
  • Publication issued
B2002-12yesWebstore
IEC 60862-3 f1 Ed. 3.0

IEC 60862-3 Ed.3: Surface acoustic wave (SAW) resonators - Part 3: Standard outlines
MERGED
  • MERGED
  • Merged project
Eyes49/672
IEC 61019-1 Ed. 1.0

Surface acoustic wave (SAW) resonators - Part 1: Generic specification
PPUB
  • PPUB
  • Publication issued
ByesWebstore
IEC 61019-1 fF Ed. 1.0

Surface acoustic wave (SAW) resonators - Part 1: Generic specification
MERGED
  • MERGED
  • Merged project
F2011-05
DEL 61019-1-1 Ed. 2.0

Systematic review of IEC 1019-1-1 (1990)
DEL
  • DEL
  • Deleted items
B
IEC 61019-1-1 Ed. 1.0

Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 1: General information and standard values
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 61019-1-2 Ed. 1.0

Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 2: Test conditions
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 61019-2 Ed. 1.0

Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 61019-2 Ed. 2.0

Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
PPUB
  • PPUB
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ByesWebstore
IEC 61019-2 fF Ed. 2.0

Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
MERGED
  • MERGED
  • Merged project
F2013-08
IEC 61019-3 Ed. 1.0

Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC 61019-3 Ed. 2.0

Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections
DEL
  • DEL
  • Deleted items
E2008-01yes49/737
IEC 61019-3 f1 Ed. 2.0

IEC 61019-3 Ed.2: Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections
MERGED
  • MERGED
  • Merged project
Eyes49/673
IEC 61080 Ed. 1.0

Guide to the measurement of equivalent electrical parameters of quartz crystal units
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC 61178-1 Ed. 1.0

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 61178-2 Ed. 1.0

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC 61178-2-1 Ed. 1.0

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2-1: Sectional specification - Capability approval - Blank detail specification
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC 61178-3 Ed. 1.0

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval
PPUB
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  • Publication issued
BWebstore
IEC 61178-3-1 Ed. 1.0

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3-1: Sectional specification - Qualification approval - Blank detail specification
PPUB
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  • Publication issued
BWebstore
IEC 61240 Ed. 1.0

Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
DELPUB
  • DELPUB
  • Deleted Publication
B1994-0449(C.O.)276
IEC 61240 Ed. 2.0

Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
PPUB
  • PPUB
  • Publication issued
B2012-08yesWebstore
IEC 61240 am1 Ed. 1.0

Piezoelectric devices - Preparation of outline drawings of quartz crystal units, crystal filters, crystal oscillators, and surface acoustic wave (SAW) for frequency control and selection - General rules
DEL
  • DEL
  • Deleted items
E2010-12yes49/822
IEC 61253-1 Ed. 1.0

Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC 61253-2 Ed. 1.0

Piezoelectric ceramic resonators - A Specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC 61253-2-1 Ed. 1.0

Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E
PPUB
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  • Publication issued
BWebstore
IEC 61261-1 Ed. 1.0

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval
PPUB
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  • Publication issued
BWebstore
IEC 61261-2 Ed. 1.0

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC 61261-2-1 Ed. 1.0

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E
PPUB
  • PPUB
  • Publication issued
BWebstore
IEC 61337-1 Ed. 1.0

Filters using waveguide type dielectric resonators - Part 1: Generic specification
PPUB
  • PPUB
  • Publication issued
ByesWebstore
IEC 61337-1 fF Ed. 1.0

Filters using waveguide type dielectric resonators - Part 1: Generic specification
MERGED
  • MERGED
  • Merged project
F2013-07
IEC 61337-1-1 Ed. 1.0

Filters using waveguide type dielectric resonators - Part 1: General information, standard values and test conditions - Section 1: General information and standard values
DELPUB
  • DELPUB
  • Deleted Publication
B
IEC 61337-1-2 Ed. 1.0

Filters using waveguide type dielectric resonators - Part 1-2: Test conditions
DELPUB
  • DELPUB
  • Deleted Publication
Byes
IEC 61337-2 Ed. 1.0

Filters using waveguide type dielectric resonators - Part 2: Guidance for use
PPUB
  • PPUB
  • Publication issued
B2003-12yesWebstore
IEC 61337-2 fF Ed. 1.0

Filters using waveguide type dielectric resonators - Part 2: Guidance for use
MERGED
  • MERGED
  • Merged project
F2013-08
IEC 61338-1 Ed. 1.0

Waveguide type dielectric resonators - Part 1: Generic specification
PPUB
  • PPUB
  • Publication issued
ByesWebstore
IEC 61338-1 fF Ed. 1.0

Waveguide type dielectric resonators - Part 1: Generic specification
MERGED
  • MERGED
  • Merged project
F2013-07
IEC 61338-1-1 Ed. 1.0

Waveguide type dielectric resonators - Part 1: General information and test conditions - Section 1: General information
DELPUB
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  • Deleted Publication
B
IEC 61338-1-2 Ed. 1.0

Waveguide type dielectric resonators - Part 1-2: General information and test conditions - Test conditions
DELPUB
  • DELPUB
  • Deleted Publication
Byes
IEC 61338-1-3 Ed. 1.0

Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency
PPUB
  • PPUB
  • Publication issued
ByesWebstore
IEC 61338-1-4 Ed. 1.0

Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency
PPUB
  • PPUB
  • Publication issued
B2004-12yesWebstore
IEC 61338-1-4 fF Ed. 1.0

Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency
MERGED
  • MERGED
  • Merged project
F2013-08
IEC 61338-1-5 Ed. 1.0

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
APUB
  • APUB
  • Draft approved for publication
B2015-03yes
IEC/PAS 61338-1-5 Ed. 1.0

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
PPUB
  • PPUB
  • Publication issued
E2010-04Webstore
IEC 61338-2 Ed. 1.0

Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications
PPUB
  • PPUB
  • Publication issued
B2004-06yesWebstore
IEC 61338-2 fF Ed. 1.0

Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications
MERGED
  • MERGED
  • Merged project
F2013-08
IEC/PAS 61338-2 Ed. 1.0

Waveguide type dielectric resonators - Part 2: Guide to the use of waveguide type dielectric resonators
DELPUB
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  • Deleted Publication
E49/468
IEC 61338-4 Ed. 1.0

Waveguide type dielectric resonators - Part 4: Sectional specification
PPUB
  • PPUB
  • Publication issued
B2004-12yesWebstore
IEC 61338-4 fF Ed. 1.0

Waveguide type dielectric resonators - Part 4: Sectional specification
MERGED
  • MERGED
  • Merged project
F2013-08
IEC 61338-4-1 Ed. 1.0

Waveguide type dielectric resonators - Part 4-1: Blank detail specification
PPUB
  • PPUB
  • Publication issued
ByesWebstore
IEC 61338-4-1 fF Ed. 1.0

Waveguide type dielectric resonators - Part 4-1: Blank detail specification
MERGED
  • MERGED
  • Merged project
F2013-02
IEC 61837-1 Ed. 1.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
DELPUB
  • DELPUB
  • Deleted Publication
B1999-04yes
IEC 61837-1 Ed. 2.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
PPUB
  • PPUB
  • Publication issued
B2012-02yesWebstore
IEC 61837-1 f1 Ed. 2.0

Maintenance cycle report on IEC 61837-1 Ed.1:Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
MERGED
  • MERGED
  • Merged project
Eyes49/677
IEC 61837-1 am1 Ed. 1.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
DEL
  • DEL
  • Deleted items
E2010-12yes49/823
IEC 61837-2 Ed. 1.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
DELPUB
  • DELPUB
  • Deleted Publication
B2000-07yes
IEC 61837-2 Ed. 2.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
PPUB
  • PPUB
  • Publication issued
B2011-05yesWebstore
IEC 61837-2 am1 Ed. 2.0

Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
PPUB
  • PPUB
  • Publication issued
B2014-03yesWebstore
IEC 61837-3 Ed. 1.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
PPUB
  • PPUB
  • Publication issued
B1999-11yesWebstore
IEC 61837-3 Ed. 2.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosure
CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote
B2014-11yes
IEC 61837-3 am1 Ed. 1.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
MERGED
  • MERGED
  • Merged project
E2014-03yes49/1002
IEC 61837-4 Ed. 1.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
PPUB
  • PPUB
  • Publication issued
B2004-02yesWebstore
IEC 61837-4 Ed. 2.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outline and terminal lead connections - Part 4: Hybrid enclosure outline
CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote
B2014-11yes
IEC 61837-4 fF Ed. 1.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
MERGED
  • MERGED
  • Merged project
F2012-01
IEC 61837-4 am1 Ed. 1.0

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
MERGED
  • MERGED
  • Merged project
E2014-03yes49/1003
IEC/TS 61994-1 Ed. 1.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators
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  • DELPUB
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B2004-01no
IEC/TS 61994-1 Ed. 2.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators
PPUB
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  • Publication issued
E2007-06noWebstore
IEC/TS 61994-2 Ed. 1.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 2: Piezoelectric and dielectric filters
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  • Deleted Publication
B
IEC/TS 61994-2 Ed. 2.0

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters
PPUB
  • PPUB
  • Publication issued
B2011-06noWebstore
IEC/TS 61994-3 Ed. 1.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 3: Piezoelectric and dielectric oscillators
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  • DELPUB
  • Deleted Publication
E2004-03no
IEC/TS 61994-3 Ed. 2.0

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric and dielectric oscillators
PPUB
  • PPUB
  • Publication issued
E2011-07noWebstore
IEC/TS 61994-4-1 Ed. 1.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
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  • Deleted Publication
B2001-03
IEC/TS 61994-4-1 Ed. 2.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
PPUB
  • PPUB
  • Publication issued
E2007-06noWebstore
IEC/TS 61994-4-2 Ed. 1.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics
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B2004-03no
IEC/TS 61994-4-2 Ed. 2.0

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics
PPUB
  • PPUB
  • Publication issued
B2011-03noWebstore
IEC/TS 61994-4-3 Ed. 1.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials - Materials for dielectric devices
PPUB
  • PPUB
  • Publication issued
E2008-02noWebstore
IEC/TS 61994-4-4 Ed. 1.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for Surface Acoustic Wave (SAW) devices
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E2005-10no
IEC/TS 61994-4-4 Ed. 2.0

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for surface acoustic wave (SAW) devices
PPUB
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  • Publication issued
E2010-07noWebstore
IEC 62276 Ed. 1.0

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
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E2005-07yes
IEC 62276 Ed. 2.0

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
PPUB
  • PPUB
  • Publication issued
B2012-11yesWebstore
IEC/PAS 62276 Ed. 1.0

Single crystal wafers applied for surface acoustic wave device - Specification and measuring method
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  • Deleted Publication
E49/504
IEC/PAS 62277 Ed. 1.0

Test-fixture of surface mounting quartz crystal units
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  • Deleted Publication
E49/505
IEC 62575-1 Ed. 1.0

Radio frequncy (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Genric specification
CCDV
  • CCDV
  • Draft circulated as Committee Draft with Vote
B2015-05yes
IEC 62575-2 Ed. 1.0

Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use
PPUB
  • PPUB
  • Publication issued
B2012-08yesWebstore
IEC 62604-1 Ed. 1.0

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
ADIS
  • ADIS
  • Approved for FDIS circulation
B2015-04yes
IEC 62604-2 Ed. 1.0

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers - Part 2: Guidelines for the use
PPUB
  • PPUB
  • Publication issued
B2011-12yesWebstore
IEC 62643-1 Ed. 1.0

Electrostatic Micro Electro Mechanical Systems (MEMS) oscillators of assembled quality - Part 1 : Generic specification
DEL
  • DEL
  • Deleted items
E2012-10
IEC 62761 Ed. 1.0

Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
PPUB
  • PPUB
  • Publication issued
B2014-03yesWebstore
IEC 62884-4 Ed. 1.0

Measurement techniques for piezoelectric, dielectric and electrostatic oscillators : Part 4 - Short-term frequency stability.
ANW
  • ANW
  • Approved New Work
E2015-1249/1053
IEC 60368B Ed. 3.0

Piezoelectric filters. Second supplement
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B