International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 49

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection

 
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TC 49 Project files (210)

Project

Reference

Current

Stage

Language

Frcst

Date

CLC

Document

Reference

Downloads
PNW 49-372 ED1

Surface acoustic wave (SAW) filters - Part 3: Standard outlines

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  • DEL
  • Deleted items
EN U 49/372/NP
PNW 49-373 ED1

Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections

DEL
  • DEL
  • Deleted items
EN U 49/373/NP
PNW 49-428 ED1

Project of SAW materials standardization

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  • DEL
  • Deleted items
EN U 49/428/NP Word file 125 kB
PNW 49-430 ED1

Guide to the use of waveguide type dielectric resonators

DEL
  • DEL
  • Deleted items
EN U 49/430/NP
PNW 49-433 ED1

Standard for the Test-fixture of Surface Mounting Quartz Crystal Units

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  • DEL
  • Deleted items
EN U 49/433/NP Word file 124 kB
PNW 49-434 ED1

Standard to the Test-fixture with load-capacitance of Surface Mounting Quartz Crystal Units

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  • DEL
  • Deleted items
EN U 49/434/NP Word file 125 kB
PNW 49-572 ED1

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials - Materials for dielectric devices

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  • DEL
  • Deleted items
EN U 49/572/NP PDF file 155 kB
PNW 49-715 ED1

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials for dielectric devices

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  • Deleted items
EN U 49/715/NP PDF file 49 kB
PNW 49-775 ED1

SAW duplexers - Part 2: Guide to the use

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  • DEL
  • Deleted items
EN 2009-03 U 49/775/NP PDF file 104 kB
PNW 49-777 ED1

Waveguide type dielectric resonators, General information and test conditions - Measurement method of conductivity at interface between conductor and dielectric material at microwave frequency

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  • DEL
  • Deleted items
EN U 49/777/NP PDF file 282 kB
PNW 49-833 ED1

Surface acoustic wave oscillators of assessed quality - Part 1: Generic specification

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  • DEL
  • Deleted items
EN U 49/833/NP PDF file 1099 kB
PNW 49-874 ED1

Waveguide type dielectric resonators, Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

DEL
  • DEL
  • Deleted items
EN U 49/874/NP PDF file 213 kB
PNW 49-938 ED1

Guide to measurement method of nonilinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)

DEL
  • DEL
  • Deleted items
EN U 49/938/NP PDF file 370 kB
PNW 49-961 ED1

Surface Acoustic Wave (SAW) Controlled Oscillators Using SAW Resonators and SAW Delay Lines - Part 1: Generic specification

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  • DEL
  • Deleted items
EN U 49/961/NP PDF file 287 kB
PNW 49-1145 ED1

Chemical sensor devices using piezoelectric acoustic wave and vibrations

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  • DEL
  • Deleted items
EN U 49/1145/NP PDF file 57 kB
PNW 49-1198 ED1

Crystal Unit with Temperature Sensor

PRVN
  • PRVN
  • Preparation of RVN
EN U 49/1198/NP PDF file 122 kB
IEC 60122-1:2002 ED3

Quartz crystal units of assessed quality - Part 1: Generic specification

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EN-FR 2002-04 Y Webstore
IEC 60122-1:2002/AMD1 ED3

Quartz crystal units of assessed quality - Part 1: Generic specification

ACDV
  • ACDV
  • Approved for CDV
EN 2018-01 Y 49/1180/CD PDF file 218 kB
IEC 60122-1:1976 ED2

Quartz crystal units for frequency control and selection - Part 1: Standard values and test conditions

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  • Publication Deleted
EN U
IEC 60122-1:1976/AMD1:1983 ED2

Amendment 1 - Quartz crystal units for frequency control and selection - Part 1: Standard values and test conditions

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  • Publication Deleted
EN-FR U
IEC 60122-2:1983 ED2

Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60122-2-1:1991 ED1

Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection - Section One: Quartz crystal units for microprocessor clock supply

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EN-FR U Webstore
IEC 60122-2-1:1991/AMD1:1993 ED1

Amendment 1 - Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection - Section One: Quartz crystal units for microprocessor clock supply

PPUB
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EN-FR U Webstore
IEC 60122-3:2010 ED4

Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections

PPUB
  • PPUB
  • Publication issued
EN-FR 2010-10 Y Webstore
IEC 60122-3:2001 ED3

Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections

DELPUB
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  • Publication Deleted
EN-FR 2001-06 Y 49/493/FDIS Word file 30 kB
PDF file 509 kB
PDF file 334 kB
IEC 60122-3:2001/AMD1 ED3

Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections

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  • DEL
  • Deleted items
EN 2010-12 Y
IEC 60122-3:1977 ED2

Quartz crystal units for frequency control and selection. Part 3: Standard outlines and pin connections

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR U
IEC 60122-3:1977/AMD2:1991 ED2

Amendment 2 - Quartz crystal units for frequency control and selection. Part 3: Standard outlines and pin connections

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  • DELPUB
  • Publication Deleted
EN-FR U
IEC 60122-3:1977/AMD3:1992 ED2

Amendment 3 - Quartz crystal units for frequency control and selection. Part 3: Standard outlines and pin connections

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  • DELPUB
  • Publication Deleted
EN-FR U
IEC 60122-3:1977/AMD4:1993 ED2

Amendment 4 - Quartz crystal units for frequency control and selection. Part 3: Standard outlines and pin connections

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR U
IEC 60302:1969 ED1

Standard definitions and methods of measurement for piezoelectric vibrators operating over the frequency range up to 30 MHz

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR U
IEC 60368-1:2000 ED4

Piezoelectric filters of assessed quality - Part 1: Generic specification

PPUB
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  • Publication issued
EN Y Webstore
IEC 60368-1:2000/AMD1:2004 ED4

Amendment 1 - Piezoelectric filters of assessed quality - Part 1: Generic specification

PPUB
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EN-FR Y Webstore
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FR 2013-02 U
IEC 60368-1:1992 ED3

Piezoelectric filters - Part 1: General information, standard values and test conditions

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EN-FR U
IEC 60368-2-1 ED3

Systematic review of IEC 368-2-1 (1988)

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EN-FR U
IEC 60368-2-1:1988 ED2

Piezoelectric filters - Part 2-1: Guide to the use of piezoelectric filters - Quartz crystal filters

PPUB
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  • Publication issued
EN-FR U Webstore
IEC 60368-2-2:1996 ED1

Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters

PPUB
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  • Publication issued
EN-FR U Webstore
IEC 60368-3:2010 ED4

Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections

PPUB
  • PPUB
  • Publication issued
EN-FR 2010-11 Y Webstore
IEC 60368-3:2001 ED3

Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections

DELPUB
  • DELPUB
  • Publication Deleted
EN-FR 2001-06 Y 49/494/FDIS Word file 32 kB
PDF file 341 kB
PDF file 344 kB
IEC 60368-3:2001/AMD1 ED3

Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections

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  • DEL
  • Deleted items
EN 2010-12 Y
IEC 60368-3:1991 ED2

Piezoelectric filters - Part 3: Standard outlines

DELPUB
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  • Publication Deleted
EN-FR U
IEC 60368-4:2000 ED1

Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval

PPUB
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  • Publication issued
EN-FR Y Webstore
IEC 60368-4-1:2000 ED1

Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval

PPUB
  • PPUB
  • Publication issued
EN-FR Y Webstore
IEC 60444-1:1986 ED2

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network

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  • Publication issued
EN-FR U Webstore
IEC 60444-1:1986/AMD1:1999 ED2

Amendment 1 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network

PPUB
  • PPUB
  • Publication issued
EN-FR Y Webstore
IEC 60444-2:1980 ED1

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

PPUB
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  • Publication issued
EN-FR U Webstore
IEC TR 60444-3:1986 ED1

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the parallel capacitance Co

WPUB
  • WPUB
  • Publication Withdrawn
EN-FR U
IEC TR 60444-4 ED2

Systematic review of IEC 444-4 (1988)

CAN
  • CAN
  • Draft Cancelled
EN-FR U
IEC TR 60444-4:1988 ED1

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz

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EN-FR U Webstore
IEC 60444-5:1995 ED1

Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction

PPUB
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  • Publication issued
EN-FR U Webstore
IEC 60444-5:1995/AMD1 ED1

Measurement of surface mounting quartz crystal units

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EN U 49/337/CD
IEC 60444-6:2013 ED2

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

PPUB
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  • Publication issued
EN-FR 2013-06 Y Webstore
IEC 60444-6:1995 ED1

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

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  • Publication Deleted
EN-FR 1994-02 U
IEC 60444-7:2004 ED1

Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units

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  • Publication issued
EN-FR Y Webstore
MERGED
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  • Publication merged with EN version
FR 2013-02 U
IEC 60444-8 ED2

Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units

BPUB
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  • Being published
EN 2017-01 Y 49/1126/CDV
PDF file 275 kB
PDF file 826 kB
IEC 60444-8:2003 ED1

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

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EN-FR Y Webstore
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FR U
IEC 60444-9:2007 ED1

Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units

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  • Publication issued
EN-FR 2007-01 Y Webstore
MERGED
  • MERGED
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FR 2013-06 U
IEC TS 60444-10 ED1

Piezoelectric and dielectric devices for frequency control and selection - Measurement of quartz crystal unit parameters - Method for the determination of equivalent electrical parameters for GHz band

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EN 2007-02 U 49/726/NP PDF file 260 kB
IEC 60444-10 ED1

Measurement of quartz crystal units parameters - Part 10: Test fixture for crystal devices in GHz band

DEL
  • DEL
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EN 2013-11 U 49/960/NP PDF file 248 kB
IEC 60444-11:2010 ED1

Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction

PPUB
  • PPUB
  • Publication issued
EN-FR 2010-10 Y Webstore
IEC 60483:1976 ED1

Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling

PPUB
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  • Publication issued
EN-FR U Webstore
IEC 60642 ED2

Systematic review of IEC 642 (1979)

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EN-FR U
IEC 60642:1979 ED1

Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions

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EN-FR U Webstore
IEC 60642:1979/AMD1:1992 ED1

Amendment 1 - Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60642-2:1994 ED1

Piezoelectric ceramic resonator units - Part 2: Guide to the use of piezoelectric ceramic resonator units

PPUB
  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60642-3:1992 ED1

Piezoelectric ceramic resonators - Part 3: Standard outlines

PPUB
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  • Publication issued
EN-FR U Webstore
IEC 60679-1 ED4

Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1 : Generic specification

PRVC
  • PRVC
  • Preparation of RVC
EN 2017-07 Y 49/1186A/CDV PDF file 565 kB
IEC 60679-1/FRAG1 ED4

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

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EN 2013-03 Y
IEC 60679-1:2007 ED3

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

PPUB
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EN-FR 2006-08 Y Webstore
MERGED
  • MERGED
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FR 2011-05 U
IEC 60679-1:2007/AMD1 ED3

Quartz crystal controlled oscillators of assessed quality-Part 1: Generic apecification

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  • MERGED
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EN 2016-07 Y 49/1013/CD PDF file 163 kB
IEC 60679-1:2007/AMD1/FRAG1 ED3

Quartz crystal controlled oscillators of assessed quality- Part 1: Generic specification

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EN 2013-04 Y
IEC 60679-1:1997 ED2

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

DELPUB
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EN-FR Y 49/385/FDIS
IEC 60679-1:1997/FRAG2 ED2

Amendment to IEC 679-1: Quartz crystal controlled oscillators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specifitacion

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EN-FR U 49/342/CDV
IEC 60679-1:1997/AMD1:2002 ED2

Amendment 1 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

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EN-FR Y 49/523/FDIS PDF file 172 kB
PDF file 328 kB
IEC 60679-1:1997/AMD2:2003 ED2

Amendment 2 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

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EN-FR Y 49/591/FDIS PDF file 395 kB
PDF file 404 kB
IEC 60679-1:1980 ED1

Quartz crystal controlled oscillators. Part 1: General information, test conditions and methods

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EN-FR U
IEC 60679-1:1980/AMD1:1985 ED1

Amendment 1 - Quartz crystal controlled oscillators. Part 1: General information, test conditions and methods

DELPUB
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EN-FR U
IEC 60679-2 ED2

Systematic review of IEC 672-2 (1981)

DEL
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  • Deleted items
EN-FR U
IEC 60679-2:1981 ED1

Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators

PPUB
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EN-FR U Webstore
IEC 60679-3:2012 ED3

Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections

PPUB
  • PPUB
  • Publication issued
EN-FR 2013-01 Y Webstore
IEC 60679-3:2001 ED2

Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections

DELPUB
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EN-FR 2001-06 Y 49/495/FDIS Word file 32 kB
PDF file 502 kB
PDF file 511 kB
IEC 60679-3:2001/AMD1 ED2

Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections

DEL
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EN 2010-12 Y
IEC 60679-3:1989 ED1

Quartz crystal controlled oscillators. Part 3: Standard outlines and lead connections

DELPUB
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EN-FR U
IEC 60679-3:1989/AMD1:1994 ED1

Amendment 1 - Quartz crystal controlled oscillators. Part 3: Standard outlines and lead connections

DELPUB
  • DELPUB
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EN-FR U 49(SEC.)/226/CD
IEC 60679-4:1997 ED1

Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval

PPUB
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EN-FR Y Webstore
IEC 60679-4-1:1998 ED1

Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval

PPUB
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EN-FR Y Webstore
IEC 60679-5:1998 ED1

Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval

PPUB
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  • Publication issued
EN-FR Y Webstore
IEC 60679-5-1:1998 ED1

Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval

PPUB
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  • Publication issued
EN-FR Y Webstore
IEC 60679-6:2011 ED1

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

PPUB
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  • Publication issued
EN-FR 2011-03 Y Webstore
IEC PAS 60679-6:2008 ED1

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide

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EN 2008-02 U 49/784/NP PDF file 468 kB
IEC 60679-3A:1991 ED1

First supplement

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EN-FR U
IEC 60689:2008 ED2

Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values

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EN-FR 2008-12 Y Webstore
MERGED
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FR 2013-06 U
IEC 60689:1980 ED1

Measurements and test methods for 32 kHz quartz crystal units for wrist watches and standard values

DELPUB
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EN-FR U
IEC 60758:2016 ED5

Synthetic quartz crystal - Specifications and guidelines for use

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EN 2016-05 Y Webstore
IEC 60758:2008 ED4

Synthetic quartz crystal - Specifications and guidelines for use

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EN-FR 2008-11 Y 49/808/FDIS PDF file 486 kB
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FR 2012-01 U
IEC 60758:2004 ED3

Synthetic quartz crystal - Specifications and guide to the use

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EN 2005-01 Y 49/696/FDIS PDF file 973 kB
IEC 60758:1993 ED2

Synthetic quartz crystal - Specifications and guide to the use

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EN-FR U
IEC 60758:1993/AMD1:1997 ED2

Amendment 1 - Synthetic quartz crystal - Specifications and guide to the use

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EN-FR U 49/356/FDIS
IEC 60758:1993/AMD2:2001 ED2

Amendment 2 - Synthetic quartz crystal - Specifications and guide to the use

DELPUB
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EN-FR U 49/501/FDIS PDF file 295 kB
PDF file 309 kB
IEC 60862-1:2015 ED3

Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification

PPUB
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EN-FR 2015-09 Y Webstore
IEC 60862-1:2003 ED2

Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification

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EN-FR 2003-06 Y 49/587/FDIS PDF file 548 kB
IEC 60862-1:1989 ED1

Surface acoustic wave (SAW) filters. Part 1: General information, standard values and test conditions - Chapter I: General information and standard values - Chapter II: Test conditions

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EN-FR U
IEC 60862-2:2012 ED3

Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use

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EN-FR 2012-03 Y Webstore
IEC 60862-2:2002 ED2

Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidance on use

DELPUB
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EN-FR 2002-06 Y 49/542/FDIS PDF file 2586 kB
PDF file 2902 kB
IEC 60862-2:1991 ED1

Surface acoustic wave (SAW) filters - Part 2: Guide to the use of surface acoustic wave filters (Chapter III)

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EN-FR U
IEC 60862-3/FRAG1 ED3

IEC 60862-3 Ed.3: Surface acoustic wave (SAW) resonators - Part 3: Standard outlines

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EN Y
IEC 60862-3:2003 ED2

Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines

PPUB
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EN-FR 2002-12 Y Webstore
IEC 60862-3:1986 ED1

Surface acoustic wave (SAW) filters. Part 3: Standard outlines (Chapter IV)

DELPUB
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EN-FR U
IEC 61019-1:2004 ED1

Surface acoustic wave (SAW) resonators - Part 1: Generic specification

PPUB
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EN-FR Y Webstore
MERGED
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FR 2011-05 U
IEC 61019-1-1 ED2

Systematic review of IEC 1019-1-1 (1990)

DEL
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EN-FR U
IEC 61019-1-1:1990 ED1

Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 1: General information and standard values

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EN-FR U
IEC 61019-1-2:1993 ED1

Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 2: Test conditions

DELPUB
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EN-FR U 49(SEC.)/220/CD
IEC 61019-2:2005 ED2

Surface acoustic wave (SAW) resonators - Part 2: Guide to the use

PPUB
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EN-FR Y Webstore
MERGED
  • MERGED
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FR 2013-08 U
IEC 61019-2:1995 ED1

Surface acoustic wave (SAW) resonators - Part 2: Guide to the use

DELPUB
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  • Publication Deleted
EN-FR U 49(SEC.)/257/CDV
IEC 61019-3 ED2

Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections

DEL
  • DEL
  • Deleted items
EN 2008-01 Y
IEC 61019-3/FRAG1 ED2

IEC 61019-3 Ed.2: Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections

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EN Y
IEC 61019-3:1991 ED1

Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections

PPUB
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  • Publication issued
EN-FR U Webstore
IEC 61080:1991 ED1

Guide to the measurement of equivalent electrical parameters of quartz crystal units

PPUB
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  • Publication issued
EN-FR U Webstore
IEC 61178-1:1993 ED1

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification

DELPUB
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  • Publication Deleted
EN-FR U
IEC 61178-2:1993 ED1

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval

PPUB
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  • Publication issued
EN-FR U Webstore
IEC 61178-2-1:1993 ED1

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval - Section 1: Blank detail specification

PPUB
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EN-FR U Webstore
IEC 61178-3:1993 ED1

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval

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EN-FR U Webstore
IEC 61178-3-1:1993 ED1

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval - Section 1: Blank detail specification

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IEC 61240:2016 ED3

Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules

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EN 2016-10 Y Webstore
IEC 61240:2012 ED2

Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules

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EN-FR 2012-07 Y 49/995/FDIS

IEC 61240:1994 ED1

Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules

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IEC 61240:1994/AMD1 ED1

Piezoelectric devices - Preparation of outline drawings of quartz crystal units, crystal filters, crystal oscillators, and surface acoustic wave (SAW) for frequency control and selection - General rules

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IEC 61253-1:1993 ED1

Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval

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IEC 61253-2:1993 ED1

Piezoelectric ceramic resonators - A Specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval

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IEC 61253-2-1:1993 ED1

Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E

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IEC 61261-1:1994 ED1

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval

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IEC 61261-2:1994 ED1

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval

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IEC 61261-2-1:1994 ED1

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E

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IEC 61337-1:2004 ED1

Filters using waveguide type dielectric resonators - Part 1: Generic specification

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IEC 61337-1-1:1995 ED1

Filters using waveguide type dielectric resonators - Part 1: General information, standard values and test conditions - Section 1: General information and standard values

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EN-FR U 49/300/FDIS
IEC 61337-1-2:1999 ED1

Filters using waveguide type dielectric resonators - Part 1-2: Test conditions

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EN-FR Y 49/437/FDIS Word file 32 kB
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IEC 61337-2:2004 ED1

Filters using waveguide type dielectric resonators - Part 2: Guidance for use

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IEC 61338-1:2004 ED1

Waveguide type dielectric resonators - Part 1: Generic specification

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IEC 61338-1-1:1996 ED1

Waveguide type dielectric resonators - Part 1: General information and test conditions - Section 1: General information

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IEC 61338-1-2:1998 ED1

Waveguide type dielectric resonators - Part 1-2: General information and test conditions - Test conditions

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EN-FR Y 49/409/FDIS Word file 124 kB
IEC 61338-1-3:1999 ED1

Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency

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IEC 61338-1-4:2005 ED1

Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency

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IEC 61338-1-5:2015 ED1

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

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IEC PAS 61338-1-5:2010 ED1

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

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IEC PAS 61338-2:2000 ED1

Waveguide type dielectric resonators - Part 2: Guide to the use of waveguide type dielectric resonators

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IEC 61338-2:2004 ED1

Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications

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IEC 61338-4:2005 ED1

Waveguide type dielectric resonators - Part 4: Sectional specification

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IEC 61338-4-1:2005 ED1

Waveguide type dielectric resonators - Part 4-1: Blank detail specification

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IEC 61837-1:2012 ED2

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines

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EN-FR 2012-02 Y Webstore
IEC 61837-1:2012/FRAG1 ED2

Maintenance cycle report on IEC 61837-1 Ed.1:Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines

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IEC 61837-1:1999 ED1

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines

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IEC 61837-1:1999/AMD1 ED1

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines

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IEC 61837-2:2011 ED2

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

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IEC 61837-2:2011/AMD1:2014 ED2

Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

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EN-FR 2014-03 Y Webstore
IEC 61837-2:2000 ED1

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

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IEC 61837-3:2015 ED2

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures

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IEC 61837-3:2000 ED1

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures

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IEC 61837-3:2000/AMD1 ED1

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures

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IEC 61837-4:2015 ED2

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines

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IEC 61837-4:2004 ED1

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines

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IEC 61837-4:2004/AMD1 ED1

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines

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IEC TS 61994-1:2007 ED2

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators

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EN 2007-06 N Webstore
IEC TS 61994-1:2003 ED1

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators

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IEC TS 61994-2:2011 ED2

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters

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EN-FR 2011-06 N Webstore
IEC TS 61994-2:2000 ED1

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 2: Piezoelectric and dielectric filters

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IEC TS 61994-3:2011 ED2

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric and dielectric oscillators

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EN 2011-07 N Webstore
IEC TS 61994-3:2004 ED1

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 3: Piezoelectric and dielectric oscillators

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IEC TS 61994-4-1:2007 ED2

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal

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EN 2007-06 N Webstore
IEC TS 61994-4-1:2001 ED1

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal

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IEC TS 61994-4-2:2011 ED2

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics

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IEC TS 61994-4-2:2003 ED1

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics

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IEC TS 61994-4-3:2008 ED1

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials - Materials for dielectric devices

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EN 2008-02 N Webstore
IEC TS 61994-4-4:2010 ED2

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for surface acoustic wave (SAW) devices

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EN 2010-07 N Webstore
IEC TS 61994-4-4:2005 ED1

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for Surface Acoustic Wave (SAW) devices

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EN 2005-10 N 49/691/DTS PDF file 209 kB
IEC 62276:2016 ED3

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

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EN 2016-10 Y Webstore
IEC 62276:2012 ED2

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

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EN-FR 2012-10 Y 49/1005/FDIS

IEC PAS 62276:2001 ED1

Single crystal wafers applied for surface acoustic wave device - Specification and measuring method

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EN U 49/504/PAS PDF file 731 kB
IEC 62276:2005 ED1

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

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EN 2005-07 Y 49/720/FDIS PDF file 801 kB
IEC PAS 62277:2001 ED1

Test-fixture of surface mounting quartz crystal units

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EN U 49/505/PAS PDF file 297 kB
IEC 62575-1:2015 ED1

Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification

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EN-FR 2015-10 Y Webstore
IEC 62575-2:2012 ED1

Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use

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EN-FR 2012-08 Y Webstore
IEC 62604-1:2015 ED1

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification

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EN-FR 2015-07 Y Webstore
IEC 62604-2 ED2

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use

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IEC 62604-2:2011 ED1

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guideline for the use

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EN-FR 2011-12 Y Webstore
IEC 62643-1 ED1

Electrostatic Micro Electro Mechanical Systems (MEMS) oscillators of assembled quality - Part 1 : Generic specification

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EN 2012-10 U 49/939/CD PDF file 1006 kB
IEC 62761:2014 ED1

Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)

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EN-FR 2014-03 Y Webstore
IEC 62884-1 ED1

Measurement techniques of piezoelectric, dieletric and electrostatic oscillators - Part 1: Basic methods for the measurement

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EN 2017-05 Y 49/1187A/CDV PDF file 813 kB
IEC 62884-2 ED1

Measurement technique of piezoelectric, dieletric and electrostatic oscillators - Part 2: Phase jitter measurement method

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EN 2018-08 Y 49/1197/CD PDF file 605 kB
IEC 62884-3 ED1

Measurement techniques of piezoelectric, dieletric and electrostatic oscillators - Part 3: Frequency aging test methods

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EN 2018-07 Y 49/1181/CD PDF file 270 kB
IEC 62884-4 ED1

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods

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EN 2017-04 U 49/1182/CD PDF file 494 kB
IEC 63041-1 ED1

Piezoelectric Sensors – Part 1: Generic Specifications

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EN 2017-12 U 49/1183A/CD PDF file 339 kB
IEC 63041-2 ED1

Piezoelectric Sensors – Part 2: Chemical and Biochemical Sensors

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EN 2017-12 U 49/1184/CD PDF file 551 kB
IEC 60368B ED3

Piezoelectric filters. Second supplement

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