International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 49 |
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection |
TC 49 Project files
 Project Reference |  Current Stage | Language | Frcst Date | CLC | Document Reference | Downloads |
|---|---|---|---|---|---|---|
PNW 49-372 Ed. 1.0Surface acoustic wave (SAW) filters - Part 3: Standard outlines
| DEL
| E | 49/372 | |||
PNW 49-373 Ed. 1.0Surface acoustic wave (SAW) resonators - Part 3: Standard
outlines and lead connections
| DEL
| E | 49/373 | |||
PNW 49-428 Ed. 1.0Project of SAW materials standardization | DEL
| E | 49/428 | |||
PNW 49-430 Ed. 1.0Guide to the use of waveguide type dielectric resonators | DEL
| E | 49/430 | |||
PNW 49-433 Ed. 1.0Standard for the Test-fixture of Surface Mounting Quartz Crystal Units | DEL
| E | 49/433 | |||
PNW 49-434 Ed. 1.0Standard to the Test-fixture with load-capacitance of Surface Mounting Quartz Crystal Units | DEL
| E | 49/434 | |||
PNW 49-572 Ed. 1.0Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials - Materials for dielectric devices
| DEL
| E | 49/572 | |||
PNW 49-715 Ed. 1.0Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials for dielectric devices | DEL
| E | 49/715 | |||
PNW 49-775 Ed. 1.0SAW duplexers - Part 2: Guide to the use | DEL
| E | 2009-03 | 49/775 | ||
PNW 49-777 Ed. 1.0Waveguide type dielectric resonators, General information and test conditions - Measurement method of conductivity at interface between conductor and dielectric material at microwave frequency | DEL
| E | 49/777 | |||
PNW 49-833 Ed. 1.0Surface acoustic wave oscillators of assessed quality - Part 1: Generic specification | DEL
| E | 49/833 | |||
PNW 49-874 Ed. 1.0Waveguide type dielectric resonators, Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency | DEL
| E | 49/874 | |||
PNW 49-938 Ed. 1.0Guide to measurement method of nonilinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) | DEL
| E | 49/938 | |||
PNW 49-961 Ed. 1.0Surface Acoustic Wave (SAW) Controlled Oscillators Using SAW Resonators and SAW Delay Lines - Part 1: Generic specification | DEL
| E | 49/961 | |||
PNW 49-1022 Ed. 1.0Future IEC 61338-1-5: Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency | PNW
| E | 49/1022 | |||
IEC 60122-1 Ed. 2.0Quartz crystal units for frequency control and selection. Part 1: Standard values and test conditions | DELPUB
| E | ||||
IEC 60122-1 Ed. 3.0Quartz crystal units of assessed quality - Part 1: Generic specification | PPUB
| B | 2002-04 | yes | Webstore | |
IEC 60122-1 am1 Ed. 2.0Amendment No. 1 | DELPUB
| B | ||||
IEC 60122-1 am1 Ed. 3.0Quartz crystal units of assessed quality - Part 1: Generic specification | 1CD
| E | 2013-04 | yes | ||
IEC 60122-2 Ed. 2.0Quartz crystal units for frequency control and selection. Part 2: Guide to the use of quartz crystal units for frequency control and selection | PPUB
| B | Webstore | |||
IEC 60122-2-1 Ed. 1.0Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection - Section One: Quartz crystal units for microprocessor clock supply | PPUB
| B | Webstore | |||
IEC 60122-2-1 am1 Ed. 1.0Amendment No. 1 | PPUB
| B | Webstore | |||
IEC 60122-3 Ed. 2.0Quartz crystal units for frequency control and selection. Part 3: Standard outlines and pin connections | DELPUB
| B | ||||
IEC 60122-3 Ed. 3.0Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections | DELPUB
| B | 2001-06 | yes | ||
IEC 60122-3 Ed. 4.0Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
| PPUB
| B | 2010-10 | yes | Webstore | |
IEC 60122-3 am1 Ed. 3.0Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections | DEL
| E | 2010-12 | yes | 49/817 | |
IEC 60122-3 am2 Ed. 2.0Amendment No. 2 | DELPUB
| B | ||||
IEC 60122-3 am3 Ed. 2.0Amendment No. 3 | DELPUB
| B | 49(C.O.)209 | |||
IEC 60122-3 am4 Ed. 2.0Amendment No. 4 | DELPUB
| B | ||||
IEC 60283 Ed. 1.0Methods for the measurement of frequency and equivalent resistance of unwanted resonances of filter crystal units | WPUB
| B | ||||
IEC 60302 Ed. 1.0Standard definitions and methods of measurement for piezoelectric vibrators operating over the frequency range up to 30 MHz | DELPUB
| B | ||||
IEC 60368-1 Ed. 3.0Piezoelectric filters - Part 1: General information, standard values and test conditions | DELPUB
| B | 49(C.O.)207 | |||
IEC 60368-1 Ed. 4.0Piezoelectric filters of assessed quality - Part 1: Generic specification
| PPUB
| E | yes | Webstore | ||
IEC 60368-1 am1 Ed. 4.0Amendment 1 - Piezoelectric filters of assessed quality - Part 1: Generic specification | PPUB
| E | yes | Webstore | ||
BPUB
| F | 2013-02 | ||||
IEC 60368-2-1 Ed. 2.0Piezoelectric filters. Part 2: Guide to the use of piezoelectric filters - Section One: Quartz crystal filters | PPUB
| B | Webstore | |||
IEC 60368-2-1 Ed. 3.0Systematic review of IEC 368-2-1 (1988) | DEL
| B | ||||
IEC 60368-2-2 Ed. 1.0Piezoelectric filters - Part 2: Guide to the use of
piezoelectric filters - Section 2: Piezoelectric ceramic filters
| PPUB
| B | Webstore | |||
IEC 60368-3 Ed. 2.0Piezoelectric filters - Part 3: Standard outlines | DELPUB
| B | 49(C.O.)208 | |||
IEC 60368-3 Ed. 3.0Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
| DELPUB
| B | 2001-06 | yes | ||
IEC 60368-3 Ed. 4.0Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections | PPUB
| B | 2010-11 | yes | Webstore | |
IEC 60368-3 am1 Ed. 3.0Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections | DEL
| E | 2010-12 | yes | 49/818 | |
IEC 60368-4 Ed. 1.0Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval | PPUB
| B | yes | Webstore | ||
IEC 60368-4-1 Ed. 1.0Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval | PPUB
| B | yes | Webstore | ||
IEC 60444-1 Ed. 2.0Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network | PPUB
| B | Webstore | |||
IEC 60444-1 am1 Ed. 2.0Amendment 1 | PPUB
| B | yes | Webstore | ||
IEC 60444-2 Ed. 1.0Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units | PPUB
| B | Webstore | |||
IEC/TR 60444-3 Ed. 1.0Measurement of quartz crystal unit parameters by zero phase
technique in a pi-network. Part 3: Basic method for the
measurement of two-terminal parameters of quartz crystal units
up to 200 MHz by phase technique in a pi-network with
compensation of the parallel capacitance Co
| WPUB
| B | ||||
IEC/TR 60444-4 Ed. 1.0Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz | PPUB
| B | Webstore | |||
IEC/TR 60444-4 Ed. 2.0Systematic review of IEC 444-4 (1988) | DEL
| B | ||||
IEC 60444-5 Ed. 1.0Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction | PPUB
| B | Webstore | |||
IEC 60444-5 am1 Ed. 1.0Measurement of surface mounting quartz crystal units | DEL
| E | ||||
IEC 60444-6 Ed. 1.0Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) | PPUB
| B | Webstore | |||
IEC 60444-6 Ed. 2.0Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) | CCDV
| B | 2013-09 | yes | ||
IEC 60444-7 Ed. 1.0Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units | PPUB
| E | yes | Webstore | ||
BPUB
| F | 2013-02 | ||||
IEC 60444-8 Ed. 1.0Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units | PPUB
| B | yes | Webstore | ||
IEC 60444-8 fF Ed. 1.0Measurement of quartz crystal unit parameters - Part 8: Test
fixture for surface mounted quartz crystal units | MERGED
| F | ||||
IEC 60444-9 Ed. 1.0Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units | PPUB
| E | 2007-01 | yes | Webstore | |
IEC 60444-10 Ed. 1.0Measurement of quartz crystal units parameters - Part 10: Test fixture for crystal devices in GHz band | ANW
| E | 2013-11 | 49/960 | ||
IEC/TS 60444-10 Ed. 1.0Piezoelectric and dielectric devices for frequency control and selection - Measurement of quartz crystal unit parameters - Method for the determination of equivalent electrical parameters for GHz band | MERGED
| E | 2007-02 | 49/726 | ||
IEC 60444-11 Ed. 1.0Measrurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency f<sub>L</sub> and the effective load capacitance C<sub>Leff>/sub> using automatic network analyzer techniques and error correction
| PPUB
| B | 2010-10 | yes | Webstore | |
IEC 60483 Ed. 1.0Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling | PPUB
| B | Webstore | |||
IEC 60642 Ed. 1.0Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions | PPUB
| B | Webstore | |||
IEC 60642 Ed. 2.0Systematic review of IEC 642 (1979) | DEL
| B | ||||
IEC 60642 am1 Ed. 1.0Amendment No. 1 | PPUB
| B | Webstore | |||
IEC 60642-2 Ed. 1.0Piezoelectric ceramic resonator units - Part 2: Guide to the use of piezoelectric ceramic resonator units | PPUB
| B | Webstore | |||
IEC 60642-3 Ed. 1.0Piezoelectric ceramic resonators - Part 3: Standard outlines | PPUB
| B | Webstore | |||
IEC 60679-1 Ed. 1.0Quartz crystal controlled oscillators. Part 1: General information, test conditions and methods | DELPUB
| B | ||||
IEC 60679-1 Ed. 2.0Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
| DELPUB
| B | yes | |||
IEC 60679-1 Ed. 3.0Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification | PPUB
| B | 2006-08 | yes | Webstore | |
IEC 60679-1 Ed. 4.0Piezoelectric and associated material oscillators of assessed quality - Part 1: Generic specifications | AMW
| E | 2015-03 | 49/1034 | ||
IEC 60679-1 f1 Ed. 4.0Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification | MERGED
| E | 2013-03 | yes | 49/940A | |
IEC 60679-1 f2 Ed. 2.0Amendment to IEC 679-1: Quartz crystal controlled oscillators -
A specification in the IEC quality assessment system for
electronic components (IECQ) - Part 1: Generic specifitacion
| MERGED
| B | ||||
IEC 60679-1 fF Ed. 3.0Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification | MERGED
| F | 2011-05 | |||
IEC 60679-1 am1 Ed. 1.0Amendment No. 1 | DELPUB
| B | ||||
IEC 60679-1 am1 Ed. 2.0Amendment 1
| DELPUB
| B | yes | |||
IEC 60679-1 am1 Ed. 3.0Quartz crystal controlled oscillators of assessed quality-Part 1: Generic apecification | 1CD
| E | 2014-03 | yes | ||
IEC 60679-1 am1 f1 Ed. 3.0Quartz crystal controlled oscillators of assessed quality- Part 1: Generic specification | MERGED
| E | 2013-04 | yes | 49/965 | |
DEL 60679-1 am2 Ed. 2.0A standardized test procedure for the characterization of latch
up in crystal controlled oscillators CMOS integrated circuits
| MERGED
| E | ||||
IEC 60679-1 am2 Ed. 2.0Amendment 2 | DELPUB
| B | yes | |||
DEL 60679-2 Ed. 2.0Systematic review of IEC 672-2 (1981) | DEL
| B | ||||
IEC 60679-2 Ed. 1.0Quartz crystal controlled oscillators. Part 2: Guide to the use of quartz crystal controlled oscillators | PPUB
| B | Webstore | |||
IEC 60679-3 Ed. 1.0Quartz crystal controlled oscillators. Part 3: Standard outlines and lead connections | DELPUB
| B | ||||
IEC 60679-3 Ed. 2.0Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections | DELPUB
| B | 2001-06 | yes | ||
IEC 60679-3 Ed. 3.0Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections | PPUB
| B | 2013-01 | yes | Webstore | |
IEC 60679-3 am1 Ed. 1.0Amendment No. 1 | DELPUB
| B | ||||
IEC 60679-3 am1 Ed. 2.0Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections | DEL
| E | 2010-12 | yes | 49/819 | |
IEC 60679-4 Ed. 1.0Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval
| PPUB
| B | yes | Webstore | ||
IEC 60679-4-1 Ed. 1.0Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval
| PPUB
| B | yes | Webstore | ||
IEC 60679-5 Ed. 1.0Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval | PPUB
| B | yes | Webstore | ||
IEC 60679-5-1 Ed. 1.0Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval
| PPUB
| B | yes | Webstore | ||
IEC 60679-6 Ed. 1.0Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
| PPUB
| B | 2011-03 | yes | Webstore | |
IEC/PAS 60679-6 Ed. 1.0Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide | DELPUB
| E | 2008-02 | 49/784 | ||
IEC 60679-3A Ed. 1.0First supplement | DELPUB
| B | 49(C.O.)205 | |||
IEC 60689 Ed. 1.0Measurements and test methods for 32 kHz quartz crystal units for wrist watches and standard values | DELPUB
| B | ||||
IEC 60689 Ed. 2.0Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values | PPUB
| E | 2008-12 | yes | Webstore | |
IEC 60758 Ed. 2.0Synthetic quartz crystal - Specifications and guide to the use
| DELPUB
| B | 49(C.O.)218 | |||
IEC 60758 Ed. 3.0Synthetic quartz crystal - Specifications and guide to the use | DELPUB
| E | 2005-01 | yes | ||
IEC 60758 Ed. 4.0Synthetic quartz crystal - Specifications and guidelines for use | PPUB
| B | 2008-11 | yes | Webstore | |
IEC 60758 Ed. 5.0Synthetic quartz crystal - Specifications and guideline for use | AMW
| E | 2014-12 | 49/1036 | ||
IEC 60758 fF Ed. 4.0Synthetic quartz crystal - Specifications and guidelines for use | MERGED
| F | 2012-01 | |||
IEC 60758 am1 Ed. 2.0Amendment No. 1
| DELPUB
| B | ||||
IEC 60758 am2 Ed. 2.0Amendment 2
| DELPUB
| B | ||||
DEL 60862-1 Ed. 2.0Systematic review of IEC 862-1 (1989)
| DEL
| B | ||||
IEC 60862-1 Ed. 1.0Surface acoustic wave (SAW) filters. Part 1: General
information, standard values and test conditions - Chapter I:
General information and standard values - Chapter II: Test
conditions
| DELPUB
| B | ||||
IEC 60862-1 Ed. 2.0Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification | PPUB
| B | yes | Webstore | ||
IEC 60862-1 Ed. 3.0Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification | 4CD
| E | 2012-10 | yes | ||
IEC 60862-2 Ed. 1.0Surface acoustic wave (SAW) filters - Part 2: Guide to the use of surface acoustic wave filters (Chapter III) | DELPUB
| B | ||||
IEC 60862-2 Ed. 2.0Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidance on use | DELPUB
| B | 2002-06 | yes | ||
IEC 60862-2 Ed. 3.0Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use | PPUB
| B | 2012-03 | yes | Webstore | |
DEL 60862-3 Ed. 2.0Systematic review of IEC 862-3 (1986) | DEL
| B | ||||
IEC 60862-3 Ed. 1.0Surface acoustic wave (SAW) filters. Part 3: Standard outlines (Chapter IV) | DELPUB
| B | ||||
IEC 60862-3 Ed. 2.0Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
| PPUB
| B | 2002-12 | yes | Webstore | |
IEC 60862-3 f1 Ed. 3.0IEC 60862-3 Ed.3: Surface acoustic wave (SAW) resonators - Part 3: Standard outlines | MERGED
| E | yes | 49/672 | ||
IEC 61019-1 Ed. 1.0Surface acoustic wave (SAW) resonators - Part 1: Generic specification | PPUB
| B | yes | Webstore | ||
IEC 61019-1 fF Ed. 1.0Surface acoustic wave (SAW) resonators - Part 1: Generic specification | MERGED
| F | 2011-05 | |||
DEL 61019-1-1 Ed. 2.0Systematic review of IEC 1019-1-1 (1990)
| DEL
| B | ||||
IEC 61019-1-1 Ed. 1.0Surface acoustic wave (SAW) resonators - Part 1: General
information, standard values and test conditions - Section 1:
General information and standard values
| DELPUB
| B | ||||
IEC 61019-1-2 Ed. 1.0Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 2: Test conditions | DELPUB
| B | ||||
IEC 61019-2 Ed. 1.0Surface acoustic wave (SAW) resonators - Part 2: Guide to the use | DELPUB
| B | ||||
IEC 61019-2 Ed. 2.0Surface acoustic wave (SAW) resonators - Part 2: Guide to the use | PPUB
| E | yes | Webstore | ||
IEC 61019-3 Ed. 1.0Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections | PPUB
| B | Webstore | |||
IEC 61019-3 Ed. 2.0Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections | DEL
| E | 2008-01 | yes | 49/737 | |
IEC 61019-3 f1 Ed. 2.0IEC 61019-3 Ed.2: Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections | MERGED
| E | yes | 49/673 | ||
IEC 61080 Ed. 1.0Guide to the measurement of equivalent electrical parameters of quartz crystal units | PPUB
| B | Webstore | |||
IEC 61178-1 Ed. 1.0Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification | DELPUB
| B | ||||
IEC 61178-2 Ed. 1.0Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval | PPUB
| B | Webstore | |||
IEC 61178-2-1 Ed. 1.0Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2-1: Sectional specification - Capability approval - Blank detail specification | PPUB
| B | Webstore | |||
IEC 61178-3 Ed. 1.0Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval | PPUB
| B | Webstore | |||
IEC 61178-3-1 Ed. 1.0Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3-1: Sectional specification - Qualification approval - Blank detail specification | PPUB
| B | Webstore | |||
IEC 61240 Ed. 1.0Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules | DELPUB
| B | 1994-04 | 49(C.O.)276 | ||
IEC 61240 Ed. 2.0Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules | PPUB
| B | 2012-08 | yes | Webstore | |
IEC 61240 am1 Ed. 1.0Piezoelectric devices - Preparation of outline drawings of quartz crystal units, crystal filters, crystal oscillators, and surface acoustic wave (SAW) for frequency control and selection - General rules
| DEL
| E | 2010-12 | yes | 49/822 | |
IEC 61253-1 Ed. 1.0Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval | PPUB
| B | Webstore | |||
IEC 61253-2 Ed. 1.0Piezoelectric ceramic resonators - A Specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval | PPUB
| B | Webstore | |||
IEC 61253-2-1 Ed. 1.0Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E | PPUB
| B | Webstore | |||
IEC 61261-1 Ed. 1.0Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval | PPUB
| B | Webstore | |||
IEC 61261-2 Ed. 1.0Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval | PPUB
| B | Webstore | |||
IEC 61261-2-1 Ed. 1.0Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E | PPUB
| B | Webstore | |||
IEC 61337-1 Ed. 1.0Filters using waveguide type dielectric resonators - Part 1: Generic specification | PPUB
| E | yes | Webstore | ||
IEC 61337-1-1 Ed. 1.0Filters using waveguide type dielectric resonators - Part 1: General information, standard values and test conditions - Section 1: General information and standard values | DELPUB
| B | ||||
IEC 61337-1-2 Ed. 1.0Filters using waveguide type dielectric resonators - Part 1-2:
Test conditions | DELPUB
| B | yes | |||
IEC 61337-2 Ed. 1.0Filters using waveguide type dielectric resonators - Part 2: Guidance for use | PPUB
| E | yes | Webstore | ||
IEC 61338-1 Ed. 1.0Waveguide type dielectric resonators - Part 1: Generic specification | PPUB
| E | yes | Webstore | ||
IEC 61338-1-1 Ed. 1.0Waveguide type dielectric resonators - Part 1: General information and test conditions - Section 1: General information | DELPUB
| B | ||||
IEC 61338-1-2 Ed. 1.0Waveguide type dielectric resonators - Part 1-2: General information and test conditions - Test conditions
| DELPUB
| B | yes | |||
IEC 61338-1-3 Ed. 1.0Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency | PPUB
| B | yes | Webstore | ||
IEC 61338-1-4 Ed. 1.0Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency | PPUB
| E | yes | Webstore | ||
IEC/PAS 61338-1-5 Ed. 1.0Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency | PPUB
| E | 2010-04 | Webstore | ||
IEC 61338-2 Ed. 1.0Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications
| PPUB
| E | yes | Webstore | ||
IEC/PAS 61338-2 Ed. 1.0Waveguide type dielectric resonators - Part 2: Guide to the use of waveguide type dielectric resonators | DELPUB
| E | 49/468 | |||
IEC 61338-4 Ed. 1.0Waveguide type dielectric resonators - Part 4: Sectional specification | PPUB
| E | yes | Webstore | ||
IEC 61338-4-1 Ed. 1.0Waveguide type dielectric resonators - Part 4-1: Blank detail specification | PPUB
| E | yes | Webstore | ||
BPUB
| F | 2013-02 | ||||
IEC 61837-1 Ed. 1.0Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
| DELPUB
| B | 1999-04 | yes | ||
IEC 61837-1 Ed. 2.0Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines | PPUB
| B | 2012-02 | yes | Webstore | |
IEC 61837-1 f1 Ed. 2.0Maintenance cycle report on IEC 61837-1 Ed.1:Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
| MERGED
| E | yes | 49/677 | ||
IEC 61837-1 am1 Ed. 1.0Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
| DEL
| E | 2010-12 | yes | 49/823 | |
IEC 61837-2 Ed. 1.0Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
| DELPUB
| B | 2000-07 | yes | ||
IEC 61837-2 Ed. 2.0Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
| PPUB
| B | 2011-05 | yes | Webstore | |
IEC 61837-2 am1 Ed. 2.0Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures | 1CD
| E | 2014-03 | yes | ||
IEC 61837-3 Ed. 1.0Surface mounted piezoelectric devices for frequency control and
selection - Standard outlines and terminal lead connections -
Part 3: Metal enclosures | PPUB
| B | 1999-11 | yes | Webstore | |
IEC 61837-3 Ed. 2.0Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures | 1CD
| E | 2014-05 | yes | ||
IEC 61837-3 am1 Ed. 1.0Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures | MERGED
| E | 2014-03 | yes | 49/1002 | |
IEC 61837-4 Ed. 1.0Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines | PPUB
| B | 2004-02 | yes | Webstore | |
IEC 61837-4 Ed. 2.0Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
| 1CD
| E | 2014-05 | yes | ||
BPUB
| F | 2012-01 | ||||
IEC 61837-4 am1 Ed. 1.0Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines | MERGED
| E | 2014-03 | yes | 49/1003 | |
IEC/TS 61994-1 Ed. 1.0Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators | DELPUB
| B | 2004-01 | no | ||
IEC/TS 61994-1 Ed. 2.0Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators | PPUB
| E | 2007-06 | no | Webstore | |
IEC/TS 61994-2 Ed. 1.0Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 2: Piezoelectric and dielectric
filters
| DELPUB
| B | ||||
IEC/TS 61994-2 Ed. 2.0Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters | PPUB
| B | 2011-06 | no | Webstore | |
IEC/TS 61994-3 Ed. 1.0Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 3: Piezoelectric and dielectric oscillators
| DELPUB
| E | 2004-03 | no | ||
IEC/TS 61994-3 Ed. 2.0Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric and dielectric oscillators | PPUB
| E | 2011-07 | no | Webstore | |
IEC/TS 61994-4-1 Ed. 1.0Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
| DELPUB
| B | 2001-03 | |||
IEC/TS 61994-4-1 Ed. 2.0Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal | PPUB
| E | 2007-06 | no | Webstore | |
IEC/TS 61994-4-2 Ed. 1.0Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics | DELPUB
| B | 2004-03 | no | ||
IEC/TS 61994-4-2 Ed. 2.0Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics
| PPUB
| B | 2011-03 | no | Webstore | |
IEC/TS 61994-4-3 Ed. 1.0Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials - Materials for dielectric devices
| PPUB
| E | 2008-02 | no | Webstore | |
IEC/TS 61994-4-4 Ed. 1.0Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for Surface Acoustic Wave (SAW) devices | DELPUB
| E | 2005-10 | no | ||
IEC/TS 61994-4-4 Ed. 2.0Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for surface acoustic wave (SAW) devices | PPUB
| E | 2010-07 | no | Webstore | |
IEC 62276 Ed. 1.0Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
| DELPUB
| E | 2005-07 | yes | ||
IEC 62276 Ed. 2.0Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods | PPUB
| B | 2012-11 | yes | Webstore | |
IEC/PAS 62276 Ed. 1.0Single crystal wafers applied for surface acoustic wave device - Specification and measuring method | DELPUB
| E | 49/504 | |||
IEC/PAS 62277 Ed. 1.0Test-fixture of surface mounting quartz crystal units | DELPUB
| E | 49/505 | |||
IEC 62575-1 Ed. 1.0Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1 Generic specification | 2CD
| E | 2014-06 | |||
IEC 62575-2 Ed. 1.0Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use | PPUB
| B | 2012-08 | yes | Webstore | |
IEC 62604-1 Ed. 1.0Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification | 3CD
| E | 2013-11 | |||
IEC 62604-2 Ed. 1.0Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers - Part 2: Guidelines for the use | PPUB
| B | 2011-12 | yes | Webstore | |
IEC 62643-1 Ed. 1.0Electrostatic Micro Electro Mechanical Systems (MEMS) oscillators of assembled quality - Part 1 : Generic specification
| DEL
| E | 2012-10 | |||
IEC 62761 Ed. 1.0Guidelines for the measurement method of nonilinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) | CCDV
| B | 2014-01 | yes | ||
IEC 60368B Ed. 3.0Piezoelectric filters. Second supplement | DELPUB
| B |
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