International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 113 |
Nanotechnology standardization for electrical and electronic products and systems |

Convenor | National Committee | |
|---|---|---|
Mr Yukihiro Ushiku | JP | |
Member | National Committee |
|---|---|
| Mr Herbert Bennett | US |
| Mr Werner Bergholz | DE |
| Mr Harald Bosse | DE |
| Mr Vyacheslav A. Demin | RU |
| Mr Valeriy Gavrilenko | RU |
| Mr Kenneth E. Gettman | US |
| Mr Bruce Hamilton | GB |
| Hideki Hashimoto | JP |
| Mr Brian Haydon | CA |
| Mr Kenji Iijima | JP |
| Mr Andrey A. Kosterov | RU |
| Mr Kun-Hong Lee | KR |
| Mr Mike Leibowitz | US |
| Mr Scott Macleod | US |
| Mr Axel Peter Mustad | NO |
| Mr Lingyu Piao | CN |
| Mr Haridoss Sarma | CA |
| Mrs Nataly A. Shlamkova | RU |
| Mr Peter Statham | GB |
| Mr Evgeny A. Titov | RU |
| Mr Pavel A. Todua | RU |
| Mr Giuseppe Vittori | IT |
Title & Task
JWG 2
Measurement and characterization
The development of standards for measurement, characterization and test methods for nanotechnologies, taking into consideration needs for metrology and reference materials



