International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 
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WG 2 Convenor & Members

Convenor
National
Committee
Mr Jim Lynch
 GB
Member
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National
Committee
Mr Paul ColsonBE
Mr Robert H. Henry EdwardsGB
Mr François GirouxFR
Mr Yoichi IgaJP
Mr Namsu KimKR
Mr Chul-Hee KimKR
Mr Kee-Won KwonKR
Mr Ivan G. LoukitsaRU
Mr Nicholas E.F. LycoudesUS
Mr Arno NeidigDE
Mr Simon Philip PlattGB
Mr Santo PuglieseIT
Mr Gabriele SalaIT
Mr Masaki TanakaJP
Mr Konstantin S. TkachukRU
Mr Nobuyuki WakaiJP
Mr Yury A. YamshchikovRU

Title & Task

WG 2

Climatic and mechanical tests

 

Activity within TC 47/WG 2 includes the generation, co-ordination and review of climatic, electrical (of which only ESD (liaison with TC 101), latch up and electrical conditions for life tests will be considered) and mechanical test methods needed to assess the quality and reliability of the design and manufacture of semiconductor products and processes. Close liaison with TC 91, TC 104 and with more generally chartered TC 47 Working Groups, whose task involves the definitions of mechanical and/or electrical specifications, will be maintained.

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Liaisons

Organizations
Liaison Member
Liaison D
EIA