International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 
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WG 5 Convenor & Members

Convenor
National
Committee
Mr Nobuyuki Wakai
 JP
Member
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National
Committee
Mr Jaap BisschopNL
Ms bo CuiCN
Mr Ivan G. LoukitsaRU
Mr Nicholas E.F. LycoudesUS
Mr Jim LynchGB
Mr Andreas MartinDE
Mr Hideya MatsuyamaJP
Mr Joon-Shik ParkKR
Mr Konstantin S. TkachukRU
Mr Dr. Vali uddinPK

Title & Task

WG 5

Wafer Level Reliability for semiconductor devices

 

Generates terms and definitions and reviews or establishes specifications and standards relating to wafer-level reliability assessment of semiconductor devices in the points of failure mechanism for silicon process and test method with unit structured test vehicle. To accomplish these functions the working group maintains liaison with and utilizes information and help from other groups and technical experts.

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Liaisons

Organizations
Liaison Member
Liaison D
EIA