International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 91

Electronics assembly technology

 
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WG 15 Convenor & Members

Convenor
National
Committee
Mr Osamu Karatsu
 JP
Member
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National
Committee
Mr Yoshiharu FuruiJP
Mr Takashi KambeJP
Mr Ryuichi KatohJP
Mr Jin ho LeeKR
Mr John MessinaUS
Mr Karl A SauterUS
Mr Alec StanculescuUS
Mr Mitsuru TakahashiJP
Mr Ron WaxmanUS
Mr Hiromi YamashitaJP

Title & Task

WG 15

Design Automation: Testing of Electrotechnical Products

 

To maintain the following series to continuously improve testing productivity and quality as a part of solutions :
- IEC 61445 series: DTIF
- IEC 61671 series: ATML
- IEC 61926 series: ATLAS
- IEC 62243 series: AI-ESTATE
- IEC 62525, 62526, 62527: STIL
- IEC 62528: Testability Embedded Core
- IEC 62529: STD
To newly develop testing protocols and technical reports to realize testing for energy saving, high to low level sophistication and interoperability among heterogeneous testing environments.