International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 91 |
Electronics assembly technology |
WG 15 Convenor & Members
Convenor | National Committee | |
|---|---|---|
Mr Osamu Karatsu | JP | |
Mr Narayanan Ramachandran | US | |
Member  |  National Committee |
|---|---|
| Mr Yoshiharu Furui | JP |
| Mr Takashi Kambe | JP |
| Mr Ryuichi Katoh | JP |
| Mr Jin ho Lee | KR |
| Mr John Messina | US |
| Mr Alec Stanculescu | US |
| Mr Mitsuru Takahashi | JP |
| Mr Ron Waxman | US |
| Mr Hiromi Yamashita | JP |
Title & Task
WG 15
Design Automation: Testing of Electrotechnical Products
To maintain the following series to continuously improve testing productivity and quality as a part of solutions :
- IEC 61445 series: DTIF
- IEC 61671 series: ATML
- IEC 61926 series: ATLAS
- IEC 62243 series: AI-ESTATE
- IEC 62525, 62526, 62527: STIL
- IEC 62528: Testability Embedded Core
- IEC 62529: STD
To newly develop testing protocols and technical reports to realize testing for energy saving, high to low level sophistication and interoperability among heterogeneous testing environments.