International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 113 |
Nanotechnology standardization for electrical and electronic products and systems |
WG 3 Convenor & Members
Convenor | National Committee | |
|---|---|---|
Mr Werner Bergholz | DE | |
Mr Jiro Yoshida | JP | |
Member  |  National Committee |
|---|---|
| Mr James Amano | SEMI |
| Mr Shinji ARAMAKI | JP |
| Mr Herbert Bennett | US |
| Mr Werner Bergholz | DE |
| Mr Harald Bosse | DE |
| Mr Paul Brazis | US |
| Mr Youngjin Cho | KR |
| Mr Choongi Choi | KR |
| Mr Ju Hwan Choi | KR |
| Mr Young Chul Choi | KR |
| Mr Seth CoeSullivan | US |
| Mr James Lynn Davis | US |
| Mr Emmanuel Dela Hostria | US |
| Mr Vyacheslav A. Demin | RU |
| Mr Paul DeRose | US |
| Mr Hiroyuki Endoh | JP |
| Mr Chris Evans | GB |
| Mr Norbert Fabricius | DE |
| Ms Nastya V. Fedotova | RU |
| Mr Valeriy Gavrilenko | RU |
| Mr Adam Matthew Gilmore | US |
| Ms Jodi Haasz | US |
| Mr Bruce Hamilton | GB |
| Mr Chang su Han | KR |
| Ms Sangme Han | KR |
| Mr JongHun Han | KR |
| Mr Jens Hauch | DE |
| Mr Brian Haydon | CA |
| Mr Yoshiro Ichino | JP |
| Mr Kenji Iijima | JP |
| Mr Soo Kim | IEEE |
| Mr JaeHyun Kim | KR |
| Mr Hyouk Kwon | KR |
| Mr YoungHee Lee | KR |
| Mr JoWon Lee | KR |
| Mr Haeseong Lee | KR |
| Mr Hajin Lee | KR |
| Mr Mike Leibowitz | US |
| Mr Scott Macleod | US |
| Mr Hassan Mohamed Mahmoud | EG |
| Mr K. Mallick | ZA |
| Mr Greg Monty | US |
| Mr Axel Peter Mustad | NO |
| Mr Kei Noda | JP |
| Mr Cesare Pagura | IT |
| Mr WonKyu Park | KR |
| Mr Davide Ricci | IT |
| Mr Haridoss Sarma | CA |
| Mr Mauro Schiavon | IT |
| Mr Brent Segal | US |
| Mr Dongwoo Seo | KR |
| Mrs Nataly A. Shlamkova | RU |
| Mr Leo Johann Stuehler | DE |
| Ms TsungTsan Su | ANF |
| Mr Kohsei Takahashi | JP |
| Mr Stephen Thomas | AU |
| Mr Evgeny A. Titov | RU |
| Mr Pavel A. Todua | RU |
| Mr Jonathan Tucker | IEEE |
| Mr Anton V. Tutugin | RU |
| Mr Yukihiro Ushiku | JP |
| Mr Sergey B. Venig | RU |
| Mr Giuseppe Vittori | IT |
| Mr Carl K. Wang | ANF |
| Mr Gerd Weking | DE |
| Mr MauKuen Wu | ANF |
| Mr BinCheng Yao | ANF |
| Mr Soonil Yeo | KR |
| Mr Woon jeong Yoo | KR |
| Mr Shinichi Yorozu | JP |
| Mr Yuji Yoshida | JP |
| Mr Iljae Yu | KR |
Title & Task
WG 3
Performance assessment
To develop standards for the assessment of performance, reliability and durability related to the nanotechnology-enabled aspects of components and systems in support of continuous improvement at all stages of the value adding chain. WG 3 considers market demand and technology pull with an emphasis on fabrication, processing and process control, disposal and recycling
Liaisons
Organizations | Liaison Member |
|---|---|
| Internal IEC Liaison | |
| TC 47 | Mr Hisao Kasuga |
| TC 86 | Moshe Oron |
| Liaison ISO | |
| ISO/TC 229 | |
| Liaison D | |
| ANF | Mr Ming-Hwei Hong Mr Bin-Cheng Yao |
| IEEE | |
| SEMI | |