SC 47E |
Discrete semiconductor devices |

Convenor | National Committee | |
|---|---|---|
Mr Sekwang Park | KR | |
Member | National Committee |
|---|---|
| Mr Ki Seok bang | KR |
| Ms Ji Hye Jang | KR |
| Mr Yutaka Kakishima | JP |
| Mr Sung Lark Kwon | KR |
| Mr Sang-Geun Lee | KR |
| Mr JongMuk LEE | KR |
| Mr Sang-Jo Lee | KR |
| Mr Kuniki Ohwada | JP |
| Mr Joon-Shik Park | KR |
| Mr Josef-Paul Schaffer | DE |
| Mr Akira Umeda | JP |
| Mr Paul J. Van Der Wel | NL |
| Mr Yongjun Yang | CN |
| Mr Kyung-Hoon Yoon | KR |
Title & Task
WG 1
Semiconductor sensors
To prepare standards of terms and definitions, letter symbols,
essential ratings and characteristics, measuring methods and
sectional and blank detail specifications for solid-state
sensors which incorporate modulation of carrier flows within
the device induced by changes of surrounding conditions
including - but not restricted to - temperature, pressure,
composition of environmental atmosphere, irradiation of light
or particles, magnetic and electric fields.
The statements made in this standard are also applicable to sensors using materials other than semiconductor, for example dielectric and ferroelectric materials.
Excluded from the devices described in the scope are:
photodiodes and phototransistors, CCDs, thermocouples, optical
fibre sensors and pyroelectric sensors.



