International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |

Convenor | National Committee | |
|---|---|---|
Mr Jim Lynch | GB | |
Member | National Committee |
|---|---|
| Mr Ilsub Chung | KR |
| Mr Robert H. Henry Edwards | GB |
| Mr François Giroux | FR |
| Mr Yoichi Iga | JP |
| Mr Namsu Kim | KR |
| Mr ChulHee Kim | KR |
| Mr KeeWon Kwon | KR |
| Mr Ivan G. Loukitsa | RU |
| Mr Nicholas E.F. Lycoudes | US |
| Mr Jim Lynch | GB |
| Mr Jack McCullen | US |
| Mr Arno Neidig | DE |
| Mr Santo Pugliese | IT |
| Mr Gabriele Sala | IT |
| Mr Masaki Tanaka | JP |
| Mr Antonio Carlos da Costa Telles | BR |
| Mr Konstantin S. Tkachuk | RU |
| Mr Nobuyuki Wakai | JP |
| Mr Yury A. Yamshchikov | RU |
Title & Task
WG 2
Climatic and mechanical tests
Activity within TC 47/WG 2 includes the generation, co-ordination and review of climatic, electrical (of which only ESD (liaison with TC 101), latch up and electrical conditions for life tests will be considered) and mechanical test methods needed to assess the quality and reliability of the design and manufacture of semiconductor products and processes.
Close liaison with TC 91, TC 104 and with more generally chartered TC 47 Working Groups, whose task involves the definitions of mechanical and/or electrical specifications, will be maintained.
Organizations | Liaison Member |
|---|---|
| Liaison D | |
| EIA | |



