International Standards and Conformity Assessment
for all electrical, electronic and related technologies
SC 47A |
Circuits intégrés |

Convenor | National Comité | |
|---|---|---|
Mr Christian Marot | FR | |
Membre | National Comité |
|---|---|
| Mr Guenther Auderer | US |
| Mr Johan Catrysse | BE |
| Mr Mart Coenen | NL |
| Mr Roger George | GB |
| Mr Kouji Ichikawa | JP |
| Mr Ki Hyeon Kim | KR |
| Ms So young Kim | KR |
| Mr Wonjong KIM | KR |
| Mr Jonghoon Kim | KR |
| Mr Frank Klotz | DE |
| Mr Jerzy F. Kolodziejski | PL |
| Mr Frédéric Lafon | FR |
| Mr Jungjoon Lee | KR |
| Mr Byoung Nam Lee | KR |
| Mr Nicholas E.F. Lycoudes | US |
| Mr Christian Marot | FR |
| Mr Richard Moseley | US |
| Mr Hirofumi Nakajima | JP |
| Mr Atsushi Nakamura | JP |
| Mr Terry M. North | US |
| Mr Manabu OZAWA | JP |
| Mr Jae Park | US |
| Mr Seongwook Park | KR |
| Mr Lionel Pauc | FR |
| Mr Yoshiyuki Saito | JP |
| Mr Gunnar Schulz-Mewes | DE |
| Mr IL SEONG | KR |
| Mr John Shepherd | FR |
| Mr Tae-Seung Song | KR |
| Mr Hans Van Leeuwe | NL |
| Mr Osami Wada | JP |
| Mr Soonil Yeo | KR |
Titre & Tâche
WG 9
Test procedures and measurement methods for EMC in integrated circuits



