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IEC - Technical Committee > TC 113 List of TC/SCs  >  TC 113
Nanotechnology standardization for electrical and electronic products and systems

Secretariat : Germany

Last meeting :

Place : Tel Aviv, IL     Date : 2009-10-21

Agenda : 113/67A/DA (2009-10-02)
Minutes : 113/81/RM (2010-01-29)
 

Membership

Strategic Policy Statement

Chairman :     (Term of office : 2015-10)

Mr Greg Monty (US)  ( full contact details - restricted access)
E-mail :  Greg Monty

Secretary :

Mr Norbert Fabricius (DE)  ( full contact details - restricted access)
E-mail :  Norbert Fabricius

Assistant Secretary :

Mr Gerd Weking (DE)  ( full contact details - restricted access)
E-mail :  Gerd Weking

Technical Officer :

Mr Rémy Baillif
E-mail :  Rémy Baillif

Scope :

Standardization of the technologies relevant to electrical and electronic products and systems in the field of nanotechnology in close cooperation with other committees of IEC and ISO TC 229


Liaisons :
Internal IEC Liaison : TC 47, TC 86, TC 111
Liaison ISO : ISO/TC 229
Liaison D : 
ANF : WG 3
IEEE : WG 3
SEMI : WG 3


  Working Group :

WG 3 - Performance assessment

Project Team :

PT 113-69 - Nanoscale Electrical Contacts
PT 113-70 - IEC nano-electronics Standards Roadmap
PT 62565-2-1 - Guideline for carbon nanotubes specifications for electrotechnical applications

Joint Working Group :

JWG 1 - Terminology and nomenclature
JWG 2 - Measurement and characterization

Joint Project Team :

JPT 113-68 - Framework for Nomenclature Models for Nano-objects
JPT 10797 - Nanotubes -- Use of transmission electron microscopy (TEM) in walled carbon nanotubes (SWCNTs)
JPT 12802 - Nanotechnologies - Terminology - Initial framework model for core concepts
JPT 13278 - Nanotechnologies - Determination of metal impurities in carbon nanotubes (CNTs) using inductively coupled plasma - mass spectroscopy (ICP-MS)
JPT 62607 - Technical Specification for the Electrical Characterization of Carbon Nanotubes (CNTs) Using 4-Probe Measurement
JPT 62622 - Artificial gratings used in nanotechnology: Description and measurement of dimensional quality parameters
JPT 62659 - Large scale manufacturing of nanoelectronics
JPT 80004-4 - Nanotechnologies - Vocabulary - Part 4: Nanostructured materials
JPT 80004-7 - Nanotechnology - Vocabulary - Part 7: Medical, health and personal care applications
JPT 80004-8 - Nanotechnologies - Vocabulary - Part 8: Nanomanufacturing processes

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