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The articles listed below are the commended papers from the IEC Centenary Challenge. The IEC Centenary Challenge was a competition for papers on the economic, business and social impact of International Standards on business. It was organized in association with The Economist magazine and in partnership with three leading professional engineering bodies: the IET (Institute of Engineering and Technology); IEEE (Institute of Electrical and Electronics Engineers); and VDE, the German association for electrical, electronic and information technologies. The IEC Challenge Award Ceremony was held at Savoy Place, London, on 14 December 2006.
All articles are published in the book "International Standardization as a Strategic Tool ", which can be purchased from the IEC Webstore |
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Commended papers (in alphabetical order)
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Architecture-based approaches to international standardization and evolution of business models
Junjiro Shintaku (lead author); Koichi Ogawa, Tetsuo Yoshimoto (co-authors)
The University of Tokyo - Manufacturing Management Research Center, Japan |
PDF 1'636 KB |
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Benefits of standardization in the microelectronics industries and their implications on nanotechnology and other innovative industries
Werner Bergholz (lead author); Bettina Weiss, Carlos Lee (co-authors)
International University Bremen, Germany |
PDF 1'125 KB |
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Do national standards hinder or promote trade in electrical products?
Johannes Moenius
University of Redlands, USA |
PDF 982 KB |
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Industrial legislatures: The American system of standardization
Andrew Russell
The Johns Hopkins University, USA |
PDF 938 KB |
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Measuring the performance of standard setting organizations
Timothy S. Simcoe (lead author); Marc Rysman (co-author)
The Joseph L. Rotman School of Management - University of Toronto, Canada |
PDF 1'027 KB |
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Standardization and business development: The global impact of the IOSA standards and the value of anticipation
David Hodgkinson,
The University of Western Australia, Australia |
PDF 911 KB |
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Standardization and patent pools: Using patent licensing to lead the market
Hajime Yamada,
Toyo University, Japan |
PDF 1'190 KB |
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Standardizing mesopic vision conditions and incidence on light sources science and technology
Georges Zissis (lead author); Stuart Mucklejohn (co-author)
Université Paul Sabatier – Toulouse III, France, Laboratoire des Plasmas et de Conversion de l'Energie - Team 'Sources Intenses des Photons' |
PDF 1'232 KB |
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Standards for business - How companies benefit from participation in international standards setting
Dr.ir. Henk J. de Vries
RSM Erasmus University, The Netherlands |
PDF 932 KB |
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The entrepreneur and standards
Ken Krechmer (lead author); Elaine Baskin (co-author)
University of Colorado at Boulder, USA |
PDF 1'221 KB |
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The impacts of ICT standards: Three views
Knut Blind
Fraunhofer ISI, Technische Universität Berlin, Germany |
PDF 980 KB |
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